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Abstrakty
Photofield emission from SiGe nanoislands formed by molecular beam epitaxy (MBE) have been investigated. Two types of nanoislands, namely the domes and pyramids with different heights, have been addressed. It was found that the arrays of SiGe nanoislands exhibited a low onset voltage for field emission. The increase of emission current and the decrease of the curve slope in Fowler-Nordheim coordinates under green light illumination have been revealed. Electron field emission and photoemission from SiGe nanoislands have been explained based on the energy band diagram of Si-Ge heterostructure and some energy barriers have been determined.
Wydawca
Czasopismo
Rocznik
Tom
Strony
19--23
Opis fizyczny
Bibliogr. 33 poz., rys., wykr.
Twórcy
autor
- Taras Shevchenko Kyiv National University, Institute of High Technology, 2 Glushkova avenue, Kiev, 03022, Ukraine
autor
- Taras Shevchenko Kyiv National University, Institute of High Technology, 2 Glushkova avenue, Kiev, 03022, Ukraine
- V. Lashkaryov Institute of Semiconductor Physics, 41 prospekt Nauky, 03028 Kyiv, Ukraine
autor
- Departemnt of High Frequency Electronics, Technische Universität Darmstadt, 64283, Darmstadt, Germany
autor
- V. Lashkaryov Institute of Semiconductor Physics, 41 prospekt Nauky, 03028 Kyiv, Ukraine
autor
- Departemnt of High Frequency Electronics, Technische Universität Darmstadt, 64283, Darmstadt, Germany
autor
- Research Institute of Electronics, Shizuoka University, 3-5-1 Johoku, Naka-Ku, Hamamatsu, Japan
Bibliografia
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- [2] A.A. Dadykin, A.G. Naumovets, Yu.N. Kozyrev, M.Yu. Rubezhanska, P.M. Lytvyn, Yu.M. Litvin, Field and photo-field electron emission from self-assembled Ge-Si nanostructures with quantum dots, Prog. Surf. Sci. 74 (2003) 305–318.
- [3] A. Evtukh, O. Yilmazoglu, V. Litovchenko, M. Semenenko, O. Kyriienko, H.L. Hartnagel, D. Pavlidis, Peculiarities of the photon-assisted field emissions from GaN nanorods, J. Vac. Sci. Technol. B 28 (2) (2010) C2A72–76.
- [4] A. Evtukh, H. Hartnagel, O. Yilmazoglu, H. Mimura, D. Pavlidis, Vacuum Nanoelectronic Devices – Novel Electron Sources and Applications, John Wiley & Sons, Inc, UK, 2015.
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- [11] S.V. Kondratenko, A.S. Nikolenko, O.V. Vakulenko, M. Ya Valakh, V.O. Yukhymchuk, A.V. Dvurechenskii, A.I. Nikiforov, Band offsets and photocurrent spectroscopy of Si/Ge heterostructures with quantum dots, Nanotechnology 19 (14) (2008) 145703.
- [12] A.L. Barabasi, Self-assembled island formation in heteroepitaxial growth, Appl. Phys. Lett. 70 (1997) 2565–2567.
- [13] Z.F. Krasilnik, P.M. Lytvyn, D.N. Lobanov, N. Mestres, A.V. Novikov, J. Pascual, M.Ya. Valakh, V.A. Yukhymchuk, Microscopic and optical investigation of Ge nanoislands on silicon substrates, Nanotechnology 13 (2002) 81–85.
- [14] S.S. Ponomaryov, V.O. Yukhymchuk, P.M. Lytvyn, M.Ya. Valakh, Direct determination of 3D distribution of elemental composition in single semiconductor nanoislands by scanning auger microscopy, Nanoscale Res. Lett. 11 (2016) 1–13.
- [15] G. Medeiros-Ribeiro, A.M. Bratkovski, T.I. Kamins, D.A.A. Ohlberg, R.S. Williams, Shape transition of germanium nanocrystals on a silicon (001) surface from pyramids to domes, Science 279 (1998) 353–355.
- [16] T.I. Kamins, E.C. Carr, R.S. Williams, S.J. Rosner, Deposition of three-dimensional Ge islands on Si(001) by chemical vapor deposition at atmospheric and reduced pressures, J. Appl. Phys. 81 (1997) 211–219.
- [17] F.M. Ross, J. Tersoff, R.M. Tromp, Coarsening of self-assembled Ge quantum dots on Si(001), Phys. Rev. Lett. 80 (1998) 984–987.
- [18] M.I. Alonso, K. Winner, Raman spectra of c-Si1-xGexalloys, Phys. Rev. B 39 (1989) 10056–10062.
- [19] J. Weber, M.I. Alonso, Near-band-gap photoluminescence of Si-Ge alloys, Phys. Rev. B 40 (1989) 5683–5693.
- [20] L. Yang, J.R. Watling, R.C.W. Wilkins, M. Borici, J.R. Barker, A. Asenov, S. Roy, Si/SiGe heterostructure parameters for device simulations, Semicond. Sci. Technol. 19 (2004) 1174–1182.
- [21] S.M. Sze, Semiconductor Devices: Physics and Technology, Wiley, New York, 1985.
- [22] G.P. Schwartz, M.S. Hybertsen, J. Bevk, R.G. Nuzzo, J.P. Mannaerts, G.J. Gualtieri, Core-level photoemission measurements of valence-band offsets in highly strained heterojunctions: Si-Ge system, Phys. Rev. B 39 (1989) 1235–1241.
- [23] R. People, Physics and applications of GexSi1-x/Si strained-layer heterostructures, IEEE J. Q. Electron. 22 (1986) 1696–1710.
- [24] C.G. Van de Walle, R.M. Martin, Theoretical calculations of heterojunction discontinuities in the Si/Ge system, Phys. Rev. B 34 (1986) 5621–5634.
- [25] L. Colombo, R. Resta, S. Baroni, Valence-band offsets at strained Si/Ge interfaces, Phys. Rev. B 44 (1991) 5572–5579.
- [26] W.-X. Ni, G.V. Hansson, Band offsets in pseudomorphically grown Si/Si1-xGexheterostructures studied with core-level x-ray photoelectron spectroscopy, Phys. Rev. B 42 (1990) 3030–3037.
- [27] E.G. Barbagiovanni, D.J. Lockwood, P.J. Simpson, L.V. Goncharova, Quantum Confinement in Si and Ge Nanostructures, Appl. Phys. Rev. 1 (2014) 011302.
- [28] M. El Kurdi, S. Sauvage, G. Fishman, P. Boucaud, Band-edge alignment of SiGe quantum wells and SiGe/Si self-assembled islands, Phys. Rev. B 73 (2006)195327.
- [29] R.H. Fowler, L. Nordheim, Electron emission in intense electric fields, Proc. R. Soc. Lond. Ser. A 119 (1928) 173–181.
- [30] I. Brodie, C.A. Spindt, Vacuum microelectronics, Adv. Electron. Electron Phys. 83 (1992) 1–106.
- [31] V. Litovchenko, A. Evtukh, Vacuum Nanoelectronics, in: A.A. Balandin, K.L. Wang (Eds.), Handbook of Semiconductor Nanostructures and Nanodevices, V.3. Spintronics and Nanoelectronics, American Scientific Publishers, Los Angeles, 2006, pp. 153–234.
- [32] A. Evtukh, O. Yilmazoglu, V. Litovchenko, M. Semenenko, T. Gorbanyuk, A. Grygoriev, H. Hartnagel, D. Pavlidis, Electron field emission from nanostructured surfaces of GaN and AlGaN, Phys. Stat. Sol. (c) 5 (2008) 425–430.
- [33] S.M. Sze, Physics of Semiconductor Devices, 2nd ed., John Wiley & Sons, Inc, New York, 1981.
Uwagi
Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2018).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-919c3ae3-69e1-435e-aab8-039847baa4a5