PL EN


Preferencje help
Widoczny [Schowaj] Abstrakt
Liczba wyników
Tytuł artykułu

Fabrication of temperature sensor based on copper oxide nanowires grown on titanium coated glass substrate

Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Single phase, adherent films of copper oxide nanowires (CuO NWs) were successfully grown on a glass substrate. Titanium nanofilm was pre-coated on the glass substrate to assist the growth of a layer adherent to the substrate. The copper film of 1.5 μm thickness was deposited via physical vapor deposition technique followed by thermal oxidation in air at various temperatures for 4 h. The product was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), ultraviolet-visible (UV-Vis) and Fourier transformation infrared (FT-IR) spectroscopy to find the crystal structure, morphology, phases, and optical properties of the deposited films. The CuO NWs film with 60 % transmittance at wavelengths greater than 800 nm was obtained. It can be used as an infrared thermal imaging filter and in optoelectronic devices. The fabricated temperature sensor exhibited high sensitivity in the temperature range of 20 °C to 180 °C.
Wydawca
Rocznik
Strony
460--468
Opis fizyczny
Bibliogr. 49 poz., rys., tab.
Twórcy
  • University of Technology, Applied Science Department, Baghdad, Iraq
autor
  • University of Technology, Applied Science Department, Baghdad, Iraq
autor
  • University of Technology, Applied Science Department, Baghdad, Iraq
Bibliografia
  • [1] JAYATISSA A.H., GUO K., JAYASURIYA A.C., Appl. Surf. Sci., 255 (2009), 9474.
  • [2] OOI P.K., NG S.S., ABDULLAH M.J., HASSAN H.A., HASSAN Z., Mater. Chem. Phys., 140 (2013), 243.
  • [3] PHAM T.V., RAO M., ANDREASSON P., PENG Y., WANG J., JINESH K.B., Appl. Phys Lett., 102 (2013), 032101.
  • [4] NECMI S., TULAY S., SEYDA H., YASEMIN C., Semicond. Sci. Tech., 20 (2005), 398.
  • [5] DING T., YANG X., BAI L., ZHAO Y., FONG K.E., WANG N., DEMIR H.V., SUN X.W., Org. Electron., 26 (2015), 245.
  • [6] CHANG T.H., HSU C.Y., LIN H.C., CHANG K.H., LI Y.Y., J. Alloy. Compd., 644 (2015), 324.
  • [7] SEONGWAN J., YOUNG J.S., SANG H.J., KANG H.P., Catal. Commun., 81 (2016), 24.
  • [8] LI A., SONG H., WAN W., ZHOU J., CHEN X., Electrochim. Acta., 132 (2014), 42.
  • [9] KHALIDA A., IKRAM U.H., KHAN M., Powder Technol., 283 (2015), 505.
  • [10] DAHRUL M., ALATAS H., IRZAMAN, Procedia Environ. Sci., 33 (2016), 661.
  • [11] VIDYADHARAN B., MISNON I.I., ISMAIL J., YUSOFF M.M., R. JOSE., J. Alloy. Compd., 633 (2015), 22.
  • [12] JANG J., CHUNG S., KANG H., SUBRAMANIAN V., Thin Solid Films, 600 (2016), 157.
  • [13] ZHANG Q., ZHANG K., XU D., YANG G., HUANG H., NIE F., LIU C., YANG S., Prog. Mater. Sci., 60 (2014), 208.
  • [14] ZHAO X., WANG P., GAO Y., XU X., XAN Z., REN N., Mater. Lett., 132 (2014), 409.
  • [15] MUHAMMAD T.S.C., KHASAN S.K., SHER B.K., ABDULLAH M.A., Sensor. Actuat. A-Phys., 246 (2016), 58.
  • [16] HSUEH H.T., HSUEH T.J., CHANG S.J., HUNG F.Y., TSAI T.Y., WENG W.J., HSU C.L., DAI B.T., Sensor. Actuat. B-Chem., 156 (2011), 906.
  • [17] SHER B.K., MUHAMMAD T.S.C., KARIMOV K.S., ABDULLHA M.A., MEHRAN B., RANA T., Talanta, 120 (2014), 443.
  • [18] ROBERT B., LOUIS N., Electronic Devices and Circuit Theory, Prentice-Hall, New Jersey, 2006.
  • [19] MA C., ZHU L., CHEN S., ZHAO Y., Mater. Lett., 108 (2013), 114
  • [20] SAHOOLI M., SABBAGHI S., SABOORI R., J. Mater. Sci. Lett., 81 (2012), 169.
  • [21] JIA W., REITZ E., SHIMPI P., RODRIGUEZ E.G., GAO P.X., LEI Y., Mater. Res. Bull., 44 (2009), 1681.
  • [22] MOHAMED R.M., HARRAZ F.A., SHAWKY A., Ceram. Int., 40 (2014), 2127.
  • [23] DAR M.A., KIM Y.S., KIM W.B., SOHN J.M., SHIN H.S.J., Appl. Surf. Sci., 254 (2008), 7477.
  • [24] IBUPOTO Z.H., KHUN K., LU J., WILLANDER M., Appl. Phys. Lett., 102 (2013), 103701.
  • [25] MUKHERJEE N., SHOW B., MAJI S.K., MADHU U., BHAR S.K., MITRA B.C., KHAN G.G., MONDAL A., Mater. Lett., 65 (2011), 3248.
  • [26] ZHAO J., LIU R., HUA Z., Superlattice. Microst., 81 (2015), 243.
  • [27] YU Q., HUANG H., CHEN R., WANG P., YANG H., GAO M., PENG X., YE Z., Nanoscale, 4 (2012), 2613.
  • [28] ANANDAN S., LEE G., WU J.J., Ultrason. Sonochem., 19 (2012), 682.
  • [29] TOBOONSUNG B., SINGJAI P., J. Alloy. Compd., 509 (2011), 4132.
  • [30] MALLICK P., SAHU S., Nanosci. Nanotechnol., 2 (2012), 71.
  • [31] LAMRIZEGGARA M., GHABANE L., AIDA M.S., ATTAF N., ZEBBAR N., Mater. Sci. Semicon. Proc., 30 (2015), 645.
  • [32] FENG J.K., XIA H., LAI M.O., LU L., Mater. Res. Bull., 46 (2011), 424.
  • [33] JUNG A., CHO S., CHO W., LEE K.-H., Korean J. Chem. Eng., 29 (2012), 243.
  • [34] SIDDIQUI H., QURESHI M.S., HAQUE F.Z., Int. J. Sci. Eng. Res., 5 (2014), 173.
  • [35] ZHU Y.F., ZHOU G.H., LIN Y.B., LIU L., Cryst. Res. Technol., 47 (2012), 658.
  • [36] CHEN A., LONG H., LI X., LI Y., YANG G., LU P., Vacuum, 83 (2009), 927.
  • [37] VISALAKSHI S., KANNAN R., VALANARASU S., KATHALINGAM A., RAJASHABALA S., J. Mater. Sci.- Mater. El., 27 (2016), 9179.
  • [38] GOLI M., HARATIZADEH H., ABRISHAMI M.E., Ceram. Int., 40 (2014), 16071.
  • [39] MEMA R., YUAN L., DU Q., WANG Y., ZHOU G., Chem. Phys. Lett., 512 (2011), 87.
  • [40] YUAN L., WANG Y., MEMA R., ZHOU G., Acta Mater., 59 (2011), 2491.
  • [41] KIM Y.S., HWANG I.S., KIM S.J., LEE C.Y., LEE J.H., Sensor. Actuat. B-Chem., 135 (2008), 298.
  • [42] WILLIAM D.C., Materials Science and Engineering: An Introduction, John Wiley and Sons Inc., New York, 1997.
  • [43] AKALTUN Y., ÇAYIR, T., J. Alloy. Compd., 625 (2015), 144.
  • [44] JOHAN M.R., SUAN M.S.M., HAWARI N.L., CHING H.A., Int. J. Electrochem. Sc., 6 (2011), 6094.
  • [45] DODOO-ARHIN D., LEONI M., SCARDI P., Mol. Cryst. Liq. Cryst., 555 (2012), 17.
  • [46] SRIVASTAVA R., Int. J. Pure Appl. Sci. Technol., 14 (2013), 9.
  • [47] CHENG S.L., CHEN M.F., Nanoscale Res. Lett., 7 (2012), 119.
  • [48] ORTON J.W., POWELL M.J., Rep. Prog. Phys., 43 (1980), 1263.
  • [49] SISMAN O., KILINC N., OZTURK Z.Z., Sensor. Actuat. B-Chem., 236 (2016), 1118.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-8dcb9018-8c9b-44d1-bc2c-171989cef8e5
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.