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Investigations of optical and surface properties of Ag single thin film coating as semitransparent heat reflective mirror

Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The paper presents results of optical and surface morphology investigations of semitransparent silver single thin films deposited on glass substrate in relation to their heat radiation treatment. The thickness of 15 nm for the silver thin films was selected using computer designing of optical spectra and the films were deposited using electron beam evaporation process. Optical transmission and reflection were investigated for as deposited samples and after exposition to heat radiation from quartz-halogen lamp. The changes in the optical spectra were observed which suggested degradation of deposited heat mirrors. Structure and surface morphology studies performed using scanning electron microscopy, X-ray photoelectron spectroscopy and atomic force microscopy allowed us to conclude about formation of nanometric silver islands, regularly distributed over the surface of the glass substrate after exposure to heat treatment.
Wydawca
Rocznik
Strony
747--753
Opis fizyczny
Bibliogr. 8 poz., rys.
Twórcy
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Wyspianskiego 27, 50-370 Wroclaw, Poland
autor
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Wyspianskiego 27, 50-370 Wroclaw, Poland
autor
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Wyspianskiego 27, 50-370 Wroclaw, Poland
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Wyspianskiego 27, 50-370 Wroclaw, Poland
  • BOHAMET S.A., Torunska 2, 86-005 Ciele, Poland
autor
  • BOHAMET S.A., Torunska 2, 86-005 Ciele, Poland
  • Faculty of Mechanical Engineering, University of Technology and Life Sciences in Bydgoszcz, Kaliskiego 7, 85-796 Bydgoszcz, Poland
Bibliografia
  • [1] GROSE P., HERTLING R., MUGGENBURG T., J. NonCryst. Solid, 218 (1997) 38.
  • [2] MACLEOD A. H., Thin-film optical filters, IOP London, 2001.
  • [3] FilmStar Design Software, FTG Software Inc.
  • [4] WOJCIESZAK D., PONIEDZIAŁEK A., MAZUR M., DOMARADZKI J., KACZMAREK D., DORA J., to be published in Mater. Sci.-Poland, 4 (2016).
  • [5] HORCAS I., FERNANDEZ R., GÓMEZ-RODRIGUEZ J.M., COLCHERO J., GOMEZ-HERRERO J., BARO A.M., Rev. Sci. Instrum., 78 (2007) 013705.
  • [6] CRIST B.V., Handbook of The Elements and Native Oxides, XPS International Inc. Iowa, USA, 1999.
  • [7] MOULDER J., STICKLE W., SOBOL P., BOMBEN K., Handbook of X-ray Photoelectron Spectroscopy, Physical Electronics Inc., USA, 1995.
  • [8] WOJCIESZAK D., MAZUR M., KACZMAREK D., MAZUR P., SZPONAR B., DOMARADZKI J., KĘPINSKI ´ L., to be published in Mat. Sci. Eng. C, (2016)
Uwagi
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-892e9e7f-0d0b-4f11-b894-23caa1bfd69b
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