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The Design Concept of the Laboratory Heater for Studying the Effect of Surface Topography to Emissivity

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Języki publikacji
EN
Abstrakty
EN
Remote temperature sensing and thermal imaging systems [1, 2] are invaluable tools in various fields of science and technology. The fact that radiation is a function of object surface temperature makes it possible for remote temperature measurement systems to calculate this temperature. However, to measure temperature accurately with IR system, it is necessary to know emissivity. Emissivity is one of the major sources of error in radiometric measurements. Generally, emissivity is not constant as it depends on several parameters: temperature, viewing angle, wavelength, contamination or roughness. The article presents a laboratory heater which can be used to measure the thermal emissivity ε depending on the sample surface topography.
Wydawca
Rocznik
Strony
176--179
Opis fizyczny
Bibliogr. 15 poz., rys., schem., tab., wykr., wzory
Twórcy
  • Division of Metrology and Measurement Systems, Institute of Mechanical Technology, Poznan University of Technology, Plac Marii Skłodowskiej-Curie 5, 60-965 Poznan, Poland
  • Division of Metrology and Measurement Systems, Institute of Mechanical Technology, Poznan University of Technology, Plac Marii Skłodowskiej-Curie 5, 60-965 Poznan, Poland
autor
  • Division of Metrology and Measurement Systems, Institute of Mechanical Technology, Poznan University of Technology, Plac Marii Skłodowskiej-Curie 5, 60-965 Poznan, Poland
Bibliografia
  • [1] Więcek B., De Mey G., Termowizja w podczerwieni. Podstawy i zastosowania, 2011, Wydawnictwo PAK, (in polish).
  • [2] Minkina W., Dudzik S., Infrared Thermography. Error and Uncertainties. 2009 John Wiley & Sons. Ltd.
  • [3] Maldague X.: Theory and Practice of Infrared Technology for Nondestructive Testing. John Willey & Sons, Inc., ISBN 0-471-18190-0, 2001.
  • [4] Chrzanowski K.: Non-contact thermometry-Measurement errors. SPIE PL, Research and Development Treaties, Warsaw, 2000.
  • [5] Chrzanowski K.: Problem of Determination of Effective Emissivity of some Materials in MIR Region. Infrared Phys. Technol., vol. 30, pp. 679-684, 1995.
  • [6] Mathia T., Zahouani H., Stout K.J., Sullivan P. J., Dong W. P., Mainsah E., Lou N.: The development of methods for characterization of roughness in three dimensions. ECSC-EEC-EAEC, Brussels-Luxembourg and Authors, 1993.
  • [7] Thomas T.R.: Rough Surfaces, Imperial College Press., Second Edition,1999.
  • [8] http://www.atmel.com/devices/atmega16.aspx (available on 20/04/2015).
  • [9] Horowitz's P., Hill's W.: The Art 2nd(Second) edition, The Art of Electronics (1989).
  • [10] http://www.mathworks.com/products/simulink/ (available on 20/04/2015).
  • [11] http://www.flir.com/instruments/display/?id=62960 (available on 20/04/2015).
  • [12] ISO 18434 - 1: 2008. Condition monitoring and diagnostics of machine - Thermography - Part 1. General procedures.
  • [13] Orlove G. L.: Practical thermal measurement techniques. 1982 Proceedings of the SPIE, Vol 371, pp. 72-81.
  • [14] Wałach T.: Emissivity measurements on electronic microcircuits, Measurement 41 (2008), pp. 503–515.
  • [15] Błąd G., Wałach T.: Zakres spektralny kamery termowizyjnej do badan w mikroelektronice, PAK vol. 55, nr 11/2009, (in polish).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-88f4b5f9-1a35-4259-bd89-a14de8497a2d
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