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Practical Talbot wavemeter

Treść / Zawartość
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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
A wavemeter using the near-field Talbot diffraction is simplified. High accuracy wavelength measurement can be obtained from each spacing between two adjacent maximum intensities of the periodicity along multiples of the Talbot distance. Our experimental results are confirmed by our calculations. In contrast to the previous works, we use a diffraction grating with sufficiently large grating period. Therefore, the setup is practical and the pixel size of camera used to measure the interference pattern can be large. Moreover, the obtained Talbot patterns are sharp without using a post-image processing. According to our recent setup, we use the grating with a period of 12.5 μm. With visible light lasers, the Talbot distances are in the range of a few hundred of micrometers. These distances are much larger than a pixel size of normal camera. An external cavity diode laser with rubidium saturated absorption spectroscopy is used to calibrate our setup. High accuracy at 1 pm can be achieved.
Słowa kluczowe
Czasopismo
Rocznik
Strony
539--545
Opis fizyczny
Bibliogr. 26 poz., rys.
Twórcy
  • Department of Physics, Faculty of Science, Burapha University, ChonBuri Province, 20131, Thailand
  • Quantum and Nano Optics Research Unit, Burapha University, ChonBuri Province, 20131, Thailand
  • Department of Physics, Faculty of Science, Burapha University, ChonBuri Province, 20131, Thailand
  • Quantum and Nano Optics Research Unit, Burapha University, ChonBuri Province, 20131, Thailand
  • Department of Physics, Faculty of Science, Burapha University, ChonBuri Province, 20131, Thailand
  • Quantum and Nano Optics Research Unit, Burapha University, ChonBuri Province, 20131, Thailand
  • Thailand Center of Excellence in Physics, Ministry of Higher Education, Science, Research and Innovation, 328 Si Ayutthaya Road, Bangkok 10400, Thailand
Bibliografia
  • [1] TALBOT H.F., Facts relating to optical science, Philosophical Magazine 9, 1836: 401-407.
  • [2] BERRY M.V., KLEIN I.S., Fractional and fractal Talbot effects, Journal of Modern Optics 43, 1996: 2139-2164.
  • [3] CASE W.B., TOMAND M., DEACHAPUNYA S., ARNDT M., Realization of optical carpets in the Talbot and Talbot-Lau configurations, Optics Express 17, 2009: 20966-20974.
  • [4] SALAMA N.H., PATRIGNANI D., DE PASQUALE L., SICRE E.E., Wavefront sensor using the Talbot effect, Optics & Laser Technology 31, 1999: 269-272.
  • [5] PRAKASH S., UPADHYAY S., SHAKHER C., Real time out-of-plane vibration measurement/monitoring using Talbot interferometry, Optics and Lasers in Engineering 33, 2000: 251-259.
  • [6] LIU G., YANG C., WU J., Characterization of Talbot pattern illumination for scanning optical microscopy, Optical Engineering 52, 2013: 091714.
  • [7] DEACHAPUNYA S., SRISUPHAPHON S., PANTHONG P., PHOTIA T., BOONKHAM K., CHIANGGA S., Realization of the single photon Talbot effect with a spatial light modulator, Optics Express 24, 2016: 20029-20035.
  • [8] PANTHONG P., SRISUPHAPHON S., PATTANAPORKRATANA A., CHIANGGA S., DEACHAPUNYA S., A study of optical vortices with the Talbot effect, Journal of Optics 18, 2016: 035602.
  • [9] PANTHONG P., SRISUPHAPHON S., CHIANGGA S., DEACHAPUNYA S., High-contrast optical vortex detection using the Talbot effect, Applied Optics 57, 2018: 1657-1661.
  • [10] PHOTIA T., TEMNUCH W., SRISUPHAPHON S., TANASANCHAI N., ANUKOOL W., WONGRACH K., MANIT P., CHIANGGA S., DEACHAPUNYA S., High-precision grating period measurement, Applied Optics 58, 2019: 270-273.
  • [11] LIU Y., ZHANG X., HUANG Y., ZHANG J., HOFMANN W., NING Y., WANG L., Polarization stabilized VCSELs by displacement Talbot lithography-defined surface gratings, Optik 183, 2019: 579-585.
  • [12] SRISUPHAPHON S., BUATHONG S., DEACHAPUNYA S., Simple technique for producing a 1D periodic intensity profile with a desired open fraction for optical sensor applications, Journal of the Optical Society of America B 37, 2020: 2021-2025.
  • [13] BERNINGER M., STEFANOV A., DEACHAPUNYA S., ARNDT M., Polarizability measurements of a molecule via a near-field matter-wave interferometer, Physical Review A 76, 2007: 013607.
  • [14] DEACHAPUNYA S., STEFANOV A., BERNINGER M., ULBRICHT H., REIGER E., DOLTSINIS N.L., ARNDT M., Thermal and electrical properties of porphyrin derivatives and their relevance for molecule interferometry, Journal of Chemical Physics 126, 2007: 164304.
  • [15] JUFFMANN T., TRUPPE S., GEYER P., MAJOR A.G., DEACHAPUNYA S., ULBRICHT H., ARNDT M., Wave and particle in molecular interference lithography, Physical Review Letters 103, 2009: 263601.
  • [16] CRONIN A.D., SCHMIEDMAYER J., PRITCHARD D.E., Optics and interferometry with atoms and molecules, Reviews of Modern Physics 81, 2009: 1051-1129.
  • [17] KUNG H.L., BHATNAGAR A., MILLER D.A.B., Transform spectrometer based on measuring the periodicity of Talbot self-images, Optics Letters 26, 2001: 1645-1647.
  • [18] NICOLA S.D., FERRARO P., COPPOLA G., FINIZIO A., PIERATTINI G., GRILLI S., Talbot self-image effect in digital holography and its application to spectrometry, Optics Letters 29, 2004: 104-106.
  • [19] LOKSHIN G.R., UCHENOV A.V., ÉNTIN M.A., BELONUCHKIN V.E., ESKIN N.I., On the spectra selectivity of Talbot and Lau effects, Optics and Spectroscopy 89, 2000: 312-317.
  • [20] GUÉRINEAU N., MAMBRO E.D., PRIMOT J., ALVES F., Talbot experiment re-examined: study of the chromatic regime and application to spectrometry, Optics Express 11, 2003: 3310-3319.
  • [21] YE E., ATABAKI A.H., HAN N., RAM R.J., Miniature, sub-nanometer resolution Talbot spectrometer, Optics Letters 41, 2016: 2434-2437.
  • [22] HAN N., WEST G.N., ATABAKI A.H., BURGHOFF D., RAM R.J., Compact and high-precision wavemeters using the Talbot effect and signal processing, Optics Letters 44, 2019: 4187-4190.
  • [23] THOMPSON D.J., SCHOLTENA R.E., Narrow linewidth tunable external cavity diode laser using wide bandwidth filter, Review of Scientific Instruments 83, 2012: 023107.
  • [24] RASOULI S., TAVASSOLY M.T., Application of the moiré deflectometry on divergent laser beam to the measurement of the angle of arrival fluctuations and the refractive index structure constant in the turbulent atmosphere, Optics Letters 33, 2008: 980-982.
  • [25] AZAÑA J., DE CHATELLUS H.G., Angular Talbot effect, Physical Review Letters 112, 2014: 213902.
  • [26] ISO, IEC, OIML, BIPM. Guide to the Expression of Uncertainty in Measurement, ISO, Geneva, 1995.
Uwagi
Opracowanie rekordu ze środków MNiSW, umowa nr SONP/SP/546092/2022 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2024).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-88ec56c6-bd50-476b-b584-ac1b013648b9
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