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Tytuł artykułu

Department of Silicon Microsystem and Nanostructure Technology

Autorzy
Grabiec P.
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
Słowa kluczowe
EN
PL
Wydawca
Instytut Technologii Elektronowej
Czasopismo
Prace Instytutu Technologii Elektronowej
Rocznik
2014
Tom
z. 1/2
Strony
41--61
Opis fizyczny
Bibliogr. 120 poz., il.
Twórcy
autor
Grabiec P.
grabiec@ite.waw.pl
  • Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warsaw, Poland
Bibliografia
  • Publications'2013
  • [P1] BIENIEK T., JANCZYK G., DOBROWOLSKI R., SZMIGIEL D., EKWIŃSKA M., GRABIEC P., JANUS P., ZAJĄC J.,: Dedecated MEMS-Based Test Structure for 3D SiP Interconnects Reliability Investigation. Proc. of the 2013 IEEE Int. 3D Systems Integration Conf. San Francisco, USA, 2-4.10.2013, p.276-279.
  • [P2] BIENIEK T., JANCZYK G., JANUS P., EKWIŃSKA M., SZMIGIEL D., DOMAŃSKI K., GRABIEC P., DUMANIA P., Efficient Scenarios, Methodology and Tools for MEMS/NEMS Product Development. Proc. of the 10th Int. Conf. On Multi-Material Micro Manufacture. San Sebastian, Spain, 8-10.10.2013, p. 284-287.
  • [P3] BIENIEK T., JANCZYK G., JANUS P., GRABIEC P., NIEPRZECKI M., WIELGOSZEWSKI G., MOCZAŁA M., GOTSZALK T., BUITRAGO E., BADIA M.F., IONESCU A. M.: Silicon Nanowires Reliability and Robustness Investigation Using AFM-Based Techniques. Electron Technology Conf. 2013 [in] Proc. of SPIE 2013 vol. 8902 p. 8902L-1-2.
  • [P4] BIENIEK T., JANCZYK G., MARCHEWKA M., EKWIŃSKA M., WĄSOWSKI J., GRABIEC P.: Novel Methodology of MEMS-IC Co-Simulation in Smart Systems Development Process. Smart System Integration 2014 – Proc. Vienna, Austria, 26-27.03.2014 (submit. to print.).
  • [P5] BORYSIEWICZ M., WOJCIECHOWSKI T., DYNOWSKA E., WIELGUS M., BAR J., WOJTOWICZ T., KAMIŃSKA E., PIOTROWSKA A.: Nanocoral ZnO Films Fabricated on Flexible Poly(vinyl Chloride) Using a Carrier Substrate. Thin Solid Films (submit. to print.).
  • [P6] EKWIŃSKA M., KUNICKI P., PIASECKI T., JANUS P., DOMAŃSKI K., BIENIEK T., GRABIEC P., GOTSZALK T.: Manufacturing, Measurement and Control of MEMS/NEMS Electrostatically Driven Structures. Electron Technology Conf. 2013[in] Proc. of SPIE 2013 vol. 8902 p. 89021X-1-6.
  • [P7] GAJEWSKI K., GOTSZALK T., SIERAKOWSKI A., JANUS P., GRABIEC P.: Microfabricated Support Structures for Investigations of Mechanical and Electrical Graphene Properties. Electron Technology Conf. 2013 [in] Proc. of SPIE 2013 vol. 8902 p. 8920G-1-6.
  • [P8] GOŁASZEWSKA-MALEC K., KRUSZKA R., MYŚLIWIEC M., EKIELSKI M., JUNG W., PIOTROWSKI T., JUCHNIEWICZ M., BAR J., WZOREK M., KAMIŃSKA E., PIOTROWSKA A., SARZAŁA R. P., DEMS M., WOJTAS J., MĘDRZYCKI R., PRYSTAWKO P.: GaN-Based Light Emitting Diodes with Surface Photonic Crystals. Elektronika 2013 vol. LIV no. 9 p. 46-49 (in Polish).
  • [P9] GOŁASZEWSKA-MALEC K., KRUSZKA R., MYŚLIWIEC M., EKIELSKI M., JUNG W., PIOTROWSKI T., JUCHNIEWICZ M., BAR J., WZOREK M., KAMIŃSKA E., PIOTROWSKA A., SARZAŁA R. P., DEMS M., WOJTAS J., MĘDRZYCKI R., PRYSTAWKO P.: GaN-Based Light-Emitting Diodes with Surface Photonic Crystals. Proc. of the. XII Polish Conf. on Electronics. Darłówko Wschodnie, Poland, 10-13.06.2013, p. 662-668 (in Polish).
  • [P10] GŁUSZKO G., TOMASZEWSKI D., MALESIŃSKA J., KUCHARSKI K.: A Simple Method for Extraction of Threshold Voltage of FD SOI MOSFETs. Proc. of the 20th Int. Conf. Mixed Design of Integrated Circuits and Systems. Gdynia, Poland, 20-22.06.2013, p. 101-105.
  • [P11] GRZEŚKIEWICZ B., SIERAKOWSKI A., MARCZEWSKI J., PAŁKA N., WOLARZ E.: Planar Metamaterial Selectively Absorbing Terahertz Radiation. Opto-Electron. Rev. (submit. to print.).
  • [P12] GUZIEWICZ M., ŁASZCZ A., DOMAGAŁA J., GOŁASZEWSKA-MALEC K., RATAJCZAK J., KRUSZKA R., JUCHNIEWICZ M., CZERWIŃSKI A., SŁYSZ W.: Structural Analysis of Epitaxial NbTiN Films. Electron Technology Conf. 2013 [in] Proc. of SPIE 2013 vol. 8902 p. 89022S-1-6.
  • [P13] GUZIEWICZ M., ŁASZCZ A., DOMAGAŁA J., GOŁASZEWSKA-MALEC K., RATAJCZAK J., CZERWIŃSKI A., SŁYSZ W.: Structural Analysis of Epitaxial NbTiN Films. Proc. of the. XI Sci. Conf. "Electron Technology”. Ryn, Poland, 16-20.04.2013, p. 411-412 (in Polish).
  • [P14] JANCZYK G., BIENIEK T., DUMANIA P., WYMYSŁOWSKI A.: Development of Multiscale, Multicriteria Optimization of SiP Design Methods. Proc. of the 10th Int. Conf. on Multi-Material Micro Manufacture. San Sebastian, Spain, 8-10.10.2013, p. 1-6.
  • [P15] JANCZYK G., BIENIEK T., WĄSOWSKI J., GRABIEC P.: Investigation on Reliability of Interconnects in 3D Heterogeneous System by Ageing Beam Resonance Method. Microelectron. J. (submit. to print.).
  • [P16] JANCZYK G., BIENIEK T., WĄSOWSKI J., GRABIEC P.: Investigation on Reliability of Interconnects in 3D Heterogeneous System by Ageing Beam Resonance Method. TechConnect World 2013 Proc.: Nanotech, Microtech, Biotech, Cleantech. Washington, USA, 12-16.06.2013, p. 216-217.
  • [P17] JUKNA A., STEPONAVICIENE L., PLAUSINAITIENE V., ABRUTIS A., MANEIKIS A., SLIUZIENE K., LISAUSKAS V., SOBOLEWSKI R.: Coherent Magnetic Vortex Motion in Optically-Formed Channels for Easy Flow in YBa2Cu3O7-x Superconducting Thin Films. Appl. Phys. B 2013 p. 327-332.
  • [P18] KHUYAGBAATAR J., YAKUSHEV A., DULLMANN CH. E., NITSCHE H., ROBERTO J., ACKERMANN D., ANDERSSON L., ASAI M., BRAND H., BLOCK M., COX D. M., DASGUPTA M., DERKX X., DI NITTO A., DVORAK J., EBERHARDT K., ELLISON P., ESKER N. E., EVEN J., EVERS M., FAHLANDER C., FORSBERG U., GATES J. M., GHARYBIAN A. N., GREGORICH K. E., GOLUBEV P., GOTHE O., HAMILTON J., HINDE D., HARTMANN W., HERZBERG R. D., HESSBERGER F. P., HOFFMANN J., HOLLINGER R., HUBNER A., JAGER E., JEPPSSON J., KINDLER B., KLEIN K., KOJOUHAROV I., KRATZ J. V., KRIER J., KURZ N., LAHIRI S., LOMMEL B., MAITI M., MIERNIK K., MINAMI S., MISTRY A., MOKRY C., OMTVEDT J. P., PANG G.K., PAPADAKIS P, PYSMENETSKA I., RENISCH D., RUDOLPH D., RUNKE J., RYKACZEWSKI K., SARMIENTO L. G., SCHADEL M., SCHAUSTEN B., SHAUGHNESSY D.A., SEMCHENKOV A., STEINER J., STEINEGGER P., THORLE-POSPIECH P., TERESHATOV E. E., TORRES DE HEIDENREICH T., TRAUTMANN N., TURLER A., UUSITALO J., WARD D., WIEHL N., WĘGRZECKI M., YAKUSHEVA V.: The Superheavy Element Search Campaigns at TASCA. GSI Sci. Rep. 2012, 2013, s. 131.
  • [P19] KLATA P., GUZIEWICZ M., RZODKIEWICZ W., KRUSZKA R., DOMAGAŁA J., JUCHNIEWICZ M., SŁYSZ W.: Characterization of Ultrathin Layers of NbN and Nb(Ti)N. Proc. of the. XII Polish Conf. on Electronics. Darłówko Wschodnie, Poland, 10-13.06.2013, p. 407-408 (in Polish).
  • [P20] KŁOS H., SYNKIEWICZ B., BAR J.: Development of the Technology Related to the Selective Covering of Detectors Surface with Dielectric Light-Proof Layer. Electron Technology Conf. 2013 [in] Proc. of SPIE 2013 vol. 8902 s. 89021L-1-5.
  • [P21] KOCIUBIŃSKI A., BIENIEK T., JANCZYK G.: Design, Modeling and Simulation of MEMS Devices on Si, SiC and Diamond for Harsh Environment Applications. Acta Phys. Pol. A (submit. To print.).
  • [P22] MARCZEWSKI J., KUCHARSKI K., TOMASZEWSKI D., GRABIEC P., ŁUSAKOWSKI J., KARPIERZ K., BIAŁEK M., KOPYT P., GWAREK W., ZAGRAJEK P., KNAP W.: Si Metal-Oxide-Semiconductor Field-Effect Transistor for THz Detection. Proc. of the the Int. Joint Sinano/Nanofunction/New Member States-Eastern Europe/ENI2 Workshop on Advanced Process a. Device Integration a. Innovative Nanofunctions in Nanoelectronics. Kiev, Ukraine, 8-11.04.2013, www.sinano.eu, p. 1-3.
  • [P23] MOCZAŁA M., KOPIEC D., SIERAKOWSKI A., DOBROWOLSKI R., GRABIEC P., GOTSZALK T.: Investigations of Mechanical Properties of Microfabricated Resonators Using Atomic Force Microscopy Related Techniques. Microelectron. Eng. (submit. to print).
  • [P24] MOCZAŁA M., SIERAKOWSKI A., DOBROWOLSKI R., GRABIEC P., GOTSZALK T.: Fabrication and Measurement of Micromechanical Bridge Structures for Mass Change Detection. Electron Technology Conf. 2013 [in] Proc. of SPIE 2013 vol. 8902 p. 89021W-1-6.
  • [P25] NIERADKA K., JÓŹWIAK G., KOPIEC D., GRABIEC P., JANUS P., SIERAKOWSKI A., GOTSZALK T.: A Method for Linearization of Split Photodiode Position Detectors Response. Procedia Eng. 2013 vol. 25 p. 358-361.
  • [P26] OBRĘBSKI D., SZYMAŃSKI A., TOMASZEWSKI D., GRODNER M., MARCZEWSKI J., PIECZYŃSKI J.: Development of Ionizing Radiation Detectors Integrated with Readout Electronics. Proc. of the 20th Int. Conf. Mixed Design of Integrated Circuits and Systems. Gdynia, Poland, 20-22.06.2013, p. 229-234.
  • [P27] ORTLOF D., SCHMIDT T., HAHN K., BIENIEK T., JANCZYK G., BRUCK R.: MEMS Product Engineering. Handling the Diversity of an Emerging Technology. Best Practices for Cooperative Development. Springer (submit. to print).
  • [P28] PEPE G., PARLATO L., BONAVOLONTA C., MYOREN H., CRISTIANO R., EJRNAES M., ESMEILI A., SOBOLEWSKI R.: Phase-Slip Phenomena in Proximitized NbN/NiCu Superconducting Nanowires. Europ. Phys. J. - Appl. Phys. (submit. to print.).
  • [P29] PIOTROWSKI T., WĘGRZECKI M., CZERWIŃSKI A., TESLENKO G. I., MALYUTENKO O. YU., MALYUTENKO V. K.: Recombination Properties of Diode Structures by Study of Thermal Emission Beyond the Fundamental Absorption Band. Proc. of the Conf. Microtherm 2013. Microtechnol. a. Thermal Problems in Electron. (submit to print.).
  • [P30] RZODKIEWICZ W., KULIK M., PANAS A., KOBZEV A. P.: Nuclear and Optical Analyses of MOS Devices. Acta Phys. Pol. A 2013 vol. 123 nr 5 p. 851-853.
  • [P31] SIERAKOWSKI A., KOPIEC D., EKWIŃSKA M., PIASECKI T., DOBROWOLSKI R., PŁUSKA M., DOMAŃSKI K., GRABIEC P., GOTSZALK T.: Dynamic Method of Calibration and Examination Piezoresistive Cantilevers. Electron Technology Conf. 2013 [in] Proc. of SPIE 2013 vol. 8902 p. 890220-1-8.
  • [P32] SIERAKOWSKI A., KOPIEC D., JANUS P., EKWIŃSKA M., PŁUSKA M., GRABIEC P., GOTSZALK T.: Piezoresistive Cantilever Working in a Shear Force Mode for in situ Characterization of Exposed Micro- and Nanostructures. Measur. Sci. a. Technol. (submit. to print).
  • [P33] STOLARSKI M., WĘGRZECKI M., KULAWIK J., SYNKIEWICZ B.: Study the Influence of Construction and Technology on the Time Stability of the Neutron Sensors Developed by ITE. Electron Technology Conf. 2013 [in] Proc. of SPIE 2013 vol. 8902 p. 89021C-1-5.
  • [P34] SZMIGIEL D., GRABIEC P.: Impact of the Structural Funds (POIG) Initiative on Microsystem Technology Development in Poland (MINTE and MNS-DIAG Projects). Proc. of the “Nano a. Advanced Materials Workshop a. Fair NAMF 2013, Satellite Event of MRS Fall Meet.” Warsaw, Poland, 16-19.09.2013, p. 68-69.
  • [P35] TOMASZEWSKI D., ZABOROWSKI M., KUCHARSKI K., MARCZEWSKI J., DOMAŃSKI K., EKWIŃSKA M., JANUS P., BIENIEK T., GŁUSZKO G., JAROSZEWICZ B., GRABIEC P.: SOI-Based Microsensors. Functional Nanomaterials and Devices, Springer (submit. to print.).
  • [P36] WĘGRZECKA I., PANAS A., BAR J., BUDZYŃSKI T., GRABIEC P., KOZŁOWSKI R., SARNECKI J., SŁYSZ W., SZMIGIEL D., WĘGRZECKI M., ZABOROWSKI M.: Technology of Silicon Charged-Particle Detectors Developed at the Institute of Electron Technology. Electron Technology Conf. 2013 [in] Proc. of SPIE 2013 vol. 8902 p. 89021I-1-11.
  • [P37] WĘGRZECKI M., BAR J., BUDZYŃSKI T., CIEŻ M., GRABIEC P., KOZŁOWSKI R., KULAWIK J., PANAS A., SARNECKI J., SŁYSZ W., SZMIGIEL D., WĘGRZECKA I., WIELUNSKI M., WITEK K., YAKUSHEV A., ZABOROWSKI M.: Design and Properties of Silicon Charged-Particle Detectors Developed at the Institute of Electron Technology (ITE). Electron Technology Conf. 2013 [in] Proc. of SPIE 2013 vol. 8902 p. 89021I-1-1.
  • [P38] YAKUSHEV A., GATES J. M., GORSHKOV A., GRAEGER R., TURLER A., ACKERMANN D., BLOCK M., BRUCHLE W., DULLMANN CH. E., ESSEL H.-G., HESSBERGER F.P., HUBNER A., JAGER E., KHUYAGBAATAR J., KINDLER B., KRIER J., KURZ N., LOMMEL B., SCHADEL M., SCHAUSTEN B., SCHIMPF E., EBERHARDT K., EIBACH M., EVEN J., HILD D., KRATZ J. V., NIEWISCH L.J., RUNKE J., THORLE-POSPIECH P., WIEHL N., DVORAK J., NITSCHE H., OMTVEDT J. P., SEMCHENKOV A., FORSBERG U., RUDOLPH D., UUSITALO J., ANDERSSON L., HERZBERG R. D., PARR E., QIN Z., WĘGRZECKI M.: Superheavy Element Flerovium is the Heaviest Volatile Metal. GSI Sc. Rep. 2012, 2013, p. 132.
  • [P39] ZABOROWSKI M., TOMASZEWSKI D., GRABIEC P.: Adjustment of Sensitivity of ISFET-Type Micro- and Nanosensors. Electron Technology Conf. 2013 [in] Proc. of SPIE 2013 vol. 8902 p. 89021U-1-7.
  • [P40] ZIÓŁKOWSKI R., GÓRSKI Ł., PROKARYN P., ZABOROWSKI M., KUTYŁA-OLESIUK A., CIOSEK P., WRÓBLEWSKI W., MALINOWSKA E.: Development of Silicon-Based Electrochemical Tranducers. Analytic. Meth. 2013 no. 5 p. 5464-5470.
  • Conferences’2013
  • [C1] BIENIEK T.: Design, Fabrication and Application of MEMS/MOEMS DEVICEs in the Institute of Electron Technology in Warsaw, Microelectronics and Optoelectronics Student Research Group, Warsaw University of Technology, Faculty of Electronics and Information Technology. Warsaw, Poland, 21.03.2013 (inv. lect., in Polish).
  • [C2] BIENIEK T.: e-BRAINS Project - European Activities in Heterogeneous Sensor Integration and MEMS Product Engineering - Best Practices. Lecture "MEMS Microsystems". Lublin, Poland, 26.11.2013 (inv. lect.).
  • [C3] BIENIEK T., JANCZYK G.: WP1 Task 1.4.x. Techn. Meet. - eBrains. Munich, Germany, 22-23.01.2013 (commun.).
  • [C4] BIENIEK T., JANCZYK G.: WP1 Task 1.4.x. Techn. Meet. - eBrains. Clamart, France, 24-27.04.2013 (commun.).
  • [C5] BIENIEK T., JANCZYK G.: WP1 Task 1.4.x. Techn. Meet. - eBrains. Turin, Italy, 13-14.08.2013 (commun.).
  • [C6] BIENIEK T., JANCZYK G., DOBROWOLSKI R., SZMIGIEL D., EKWIŃSKA M., GRABIEC P., JANUS P., ZAJĄC J.: Dedicated MEMS-Based Test Structure for 3D SiP Interconnects Reliability Investigation. IEEE Int. 3D Systems Integration Conf. San Francisco, USA, 2-4.10.2013 (poster).
  • [C7] BIENIEK T., JANCZYK G., GRABIEC P.: e-BRAINS Project - European Activities in Heterogeneous Sensor Integration. 7th Int. Forum on Innovative Technologies for Medicine. Białystok, Poland, 5-7.12.2013 (paper, poster).
  • [C8] BIENIEK T., JANCZYK G., JANUS P., EKWIŃSKA M., SZMIGIEL D., DOMAŃSKI K., GRABIEC P., DUMANIA P.: Efficient Scenarios, Methodology and Tools for MEMS/NEMS Product Development. 10th Int. Conf. on Multi-Material Micro Manufacture. San Sebastian, Spain, 8-10.10.2013 (paper).
  • [C9] BIENIEK T., JANCZYK G., JANUS P., GRABIEC P., NIEPRZECKI M., WIELGOSZEWSKI G., MOCZAŁA M., GOTSZALK T., BUITRAGO E., BUIU O., IONESCU A. M.: Silicon Nanowires Reliability and Robustness Investigation Using AFM-Based Techniques. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster).
  • [C10] BIENIEK T., JANCZYK G., JANUS P., GRABIEC P., BUITRAGO E., BADIA M.F., IONESCU A.M., WIELGOSZEWSKI G., MOCZAŁA M., GOTSZALK T.: Reliability and Robustness Investigation of 3D Vertically Stacked Silicon Nanowire Structures Using AFM Based Techniques. TechConnect World 2013 Nanotech, Microtech, Biotech, Cleantech. Washington, USA, 12-16.05.2013 (poster).
  • [C11] BIENIEK T., JANCZYK G., JANUS P., GRABIEC P., NIEPRZECKI M., WIELGOSZEWSKI G., MOCZAŁA M., GOTSZALK T., BUITRAGO E., BADIA M. F., IONESCU A. M., KRAEH CH., POPESCU A.: Reliability and Robustness Investigation of Novel Nanosensor Structures Using AFM-Based Techniques. 7th Int. Forum on Innovative Technologies for Medicine. Białystok, Poland, 5-7.12.2013 (paper).
  • [C12] BIENIEK T., JANCZYK G., JANUS P., GRABIEC P., NIEPRZECKI M., WIELGOSZEWSKI G., MOCZAŁA M., GOTSZALK T., BUITRAGO E., BADIA M. F., IONESCU A. M., KRAEH CH., POPESCU A.: Reliability and Robustness Investigation of Novel Nanosensor Structures Using AFM-Based Techniques (e-BRAINS Project). 7th Int. Forum on Innovative Technologies for Medicine. Białystok, Poland, 5-7.12.2013 (paper).
  • [C13] BORYSIEWICZ M., WOJCIECHOWSKI T., DYNOWSKA E., WIELGUS M., BAR J., WOJTOWICZ T., KAMIŃSKA E., PIOTROWSKA A.: Nanoporous ZnO Films Fabricated on a Flexible Substrate Using a Transfer Process. Mat. Res. Soc. Fall Meet. 2013. Boston, USA, 1-6.12.2013 (paper).
  • [C14] BORYSIEWICZ M., BARANOWSKA-KORCZYC A., STRUK P., WZOREK M., KOLKOVSKY V., WOJCIECHOWSKI T., WIELGUS M., DYNOWSKA E., GOŁASZEWSKA-MALEC K., KAMIŃSKA E., BAR J., PUSTELNY T., FRONC K., ELBAUM D., WOJTOWICZ T., PIOTROWSKA A.: Nanocoral ZnO Growth and Physicochemical Properties. 42nd Int. School & Conf. on the Physics of Semiconductors "Jaszowiec 2013". Wisła, Poland, 22-27.06.2013 (paper).
  • [C15] EKWIŃSKA M., BIENIEK T., JANCZYK G., KOWALSKI P., GRABIEC P., DOBROWOLSKI R.: Design, Modeling and Simulation of Specialized MEMS Microphone for Industrial Application. 8th Int. Conf. "New Electrical and Electronic Technologies and Their Industrial Implementation". Zakopane, Poland, 18-21.06.2013 (poster).
  • [C16] EKWIŃSKA M., KUNICKI P., PIASECKI T., JANUS P., DOMAŃSKI K., BIENIEK T., GRABIEC P., GOTSZALK T.: Manufacturing, Measurement and Control of MEMS/NEMS Electrostatically Driven Structures. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster).
  • [C17] EKWIŃSKI G., EKWIŃSKA M., RYMUZA Z.: New Method of Calibration of AFM Cantilevers. Third Scientific Symp. for Nanomeasurement Research NANOMEASURE 2013. Warsaw, Poland, 25-26.06.2013 (inv. lect.).
  • [C18] GAJEWSKI K., GOTSZALK T., SIERAKOWSKI A., JANUS P., GRABIEC P.: Microfabricated Support Structures for Investigations of Mechanical and Electrical Graphene Properties. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster).
  • [C19] GŁUSZKO G., TOMASZEWSKI D., MALESIŃSKA J., KUCHARSKI K.: A Simple Method for Extraction of Threshold Voltage of FD SOI MOSFET. Int. Conf. Mixed Design of Integrated Circuits and Systems. Gdynia, Poland, 20-22.06.2013 (poster).
  • [C20] GOŁASZEWSKA-MALEC K., KRUSZKA R., MYŚLIWIEC M., EKIELSKI M., JUNG W., PIOTROWSKI T., JUCHNIEWICZ M., BAR J., WZOREK M., KAMIŃSKA E., PIOTROWSKA A., SARZAŁA R.P., DEMS M., WOJTAS J., MĘDRZYCKI R., PRYSTAWKO P.: GaN-Based Light-Emitting Diodes with Surface Photonic Crystals. XII Polish Conf. on Electronics. Darłówko Wschodnie, Poland, 10-13.06.2013 (paper, in Polish).
  • [C21] GUZIEWICZ M., ŁASZCZ A., DOMAGAŁA J., GOŁASZEWSKA-MALEC K., CZERWIŃSKI A., SŁYSZ W.: Advantage of NbTiN over NbN in Superconducting Properties of Ultra-Thin Films. AVS 60th Int. Symp. a. Exh. Los Angeles/Long Beach (USA), 27.10.2013 (poster).
  • [C22] GUZIEWICZ M., ŁASZCZ A., DOMAGAŁA J., GOŁASZEWSKA-MALEC K., RATAJCZAK J., CZERWIŃSKI A., SŁYSZ W.: Structural Analysis of Epitaxial NbTiN Films. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster, in Polish).
  • [C23] JANCZYK G., BIENIEK T.: WP1 Task 1.3.1, 1.3.3 FhG-IIS-EAS, ITE, IFX, IFAG. Techn. Meet. – eBrains. Munich, Germany, 22-23.01.2013 (commun.)
  • [C24] JANCZYK G., BIENIEK T.: WP1 Task 1.3.1 & 1.3.3. Techn. Meet. – eBrains. Clamart, France, 24-27.04.2013 (commun.).
  • [C25] JANCZYK G., BIENIEK T.: WP1 Task 1.3.1 & 1.3.3. Techn. Meet. – eBrains. Turin, Italy, 13-14.08.2013 (commun.).
  • [C26] JANCZYK G., BIENIEK T.: WP-2-3-4-5-6 Bullet Point WP by ITE&WRUT (Common Contribution). Techn. Meet. – Parsimo. Noisy le Grand, France, 27-28.03.2013 (commun.).
  • [C27] JANCZYK G., BIENIEK T.: WP2 - Outline of M18-M24 Progress. Parsimo Rev. Meet. M24. Bruksela, Belgia, 24-25.06.2013 (commun.).
  • [C28] JANCZYK G., BIENIEK T.: Dedicated System Including MEMS-Based and ASIC Test Structures for 3D SiP Interconnects Reliability and Robustness Investigation. 7th Int. Forum on Innovative Technologies for Medicine. Białystok, Poland, 5-7.12.2013 (paper).
  • [C29] JANCZYK G., BIENIEK T.: Work Progress for Period M27-M31 by ITE. Techn. Meet. PARSIMO. Cambridge Shire, Great Britain, 4-7.11.2013 (commun.).
  • [C30] JANCZYK G., BIENIEK T., DOBROWOLSKI R., SZMIGIEL D., EKWIŃSKA M., GRABIEC P., JANUS P., ZAJĄC J.: Dedicated System Including MEMS-Based and ASIC Test Structures for 3D SiP Interconnects Reliability and Robustness Investigation (e-BRAINS Project). 7th Int. Forum on Innovative Technologies for Medicine. Białystok, Poland, 5-7.12.2013 (poster).
  • [C31] JANCZYK G., BIENIEK T., DUMANIA P., WYMYSŁOWSKI A.: Development of Multiscale, Multicriteria Optimization of SiP Design Methods 10th Int. Conf. on Multi-Material Micro Manufacture. San Sebastian, Spain, 8-10.10.2013 (paper).
  • [C32] JANCZYK G., BIENIEK T., WĄSOWSKI J., GRABIEC P.: Investigation on Reliability of Interconnects in 3D Heterogeneous System by Ageing Beam Resonance Method. TechConnect World 2013 Nanotech, Microtech, Biotech, Cleantech. Washington, USA, 12-16.05.2013 (poster).
  • [C33] JANCZYK G., BIENIEK T., WYMYSŁOWSKI A., ŚWIECZYŃSKI R.: PARSIMO Project – European Activities in System in Package Development. 7th Int. Forum on Innovative Technologies for Medicine. Białystok, Poland, 5-7.12.2013 (poster).
  • [C34] JANCZYK G., EKWIŃSKA M., BIENIEK T.: SMAC Project - SMArt Systems Co-Design. 7th Int. Forum on Innovative Technologies for Medicine. Białystok, Poland, 5-7.12.2013 (poster).
  • [C35] JANCZYK G., EKWIŃSKA M., BIENIEK T., JANUS P.: ITE Contribution for WP123467. 12M SMAC Rev. Meet. Catania, Italy, 15-16.01.2013 (commun.).
  • [C36] KLATA P., GUZIEWICZ M., RZODKIEWICZ W., KRUSZKA R., DOMAGAŁA J., JUCHNIEWICZ M., SŁYSZ W.: Characterization of Ultrathin Layers of NbN and Nb(Ti)N. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster, in Polish).
  • [C37] KLIMOV A., PUZNIAK P., DZIAWA P., SŁYSZ W., GUZIEWICZ M., JUCHNIEWICZ M., BORYSIEWICZ M., KRUSZKA R., WĘGRZECKI M., ŁASZCZ A., CZERWIŃSKI A., SOBOLEWSKI R.: Superconductor/Ferromagnet NbN/NiCu and NbTiN/NiCu Bilayers for Nanostructured Single Photon Detectors. 8th Solid State Surfaces a. Interfaces. Smolenice, Czech Republic, 25-28.11.2013 (poster).
  • [C38] KŁOS H., SYNKIEWICZ B., BAR J.: Development of the Technique for Selective Coating of Detector Surface with a Light-Proof Dielectric Layer. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster, in Polish).
  • [C39] KOCIUBIŃSKI A., BIENIEK T., JANCZYK G.: Design, Modeling and Simulation of MEMS Devices on Si, SiC and Diamond for Harsh Environment Applications. 8th Int. Conf. "New Electrical and Electronic Technologies and Their Industrial Implementation". Zakopane, Poland, 18-21.06.2013 (poster).
  • [C40] KOPIEC D., NIERADKA K., RUDEK M., GAJEWSKI K., JÓŹWIAK G., SIERAKOWSKI A., GRABIEC P., RANGELOW I. W., GOTSZALK T.: Measurement of Noise in Piezoresistive Micromechanical Converters. XII Polish Conf. on Electronics. Darłówko Wschodnie, Poland, 10-13.06.2013 (poster, in Polish).
  • [C41] KOPIEC D., NIERADKA K., RUDEK M., WIELGOSZEWSKI G., SIERAKOWSKI A., GOTSZALK T.: Single-Pass Multi-Resonance Kelvin Probe Force Microscopy in Ambient Air. Int. Scanning Probe Microscopy. Dijon, France, 30.06-3.07.2013 (poster).
  • [C42] ŁASZCZ A., GUZIEWICZ M., SŁYSZ W., CZERWIŃSKI A., RATAJCZAK J., KĄTCKI J.: HRTEM Studies of Ultrathin NbN and NbTiN Films for Superconducting Photodetectors. Microscopy Conf. Regensburg, Germany, 25-30.09.2013 (poster).
  • [C43] ŁYSKO J., GRABIEC P., JANUS P., ZAJĄC J., GOTSZALK T., BARANIECKI T.: LAB FAB for Smart Sensors and Actuators MEMS. Characterization, Inspection and Metrology. 7th Int. Forum on Innovative Technologies for Medicine. Białystok, Poland, 5-7.12.2013 (poster).
  • [C44] ŁYSKO J., GRABIEC P., JANUS P., ZAJĄC J., STOERRING M., ZAFALON R.: Characterization, Inspection and Metrology of the PZT Layers for Energy Harvesting Applications in L4M Project. PiezoNEMS 2013 Workshop. Grenoble, France, 14.11.2013 (poster).
  • [C45] MARCZEWSKI J., KUCHARSKI K., TOMASZEWSKI D., GRABIEC P., ŁUSAKOWSKI J., KARPIERZ K., BIAŁEK M., KOPYT P., GWAREK W., ZAGRAJEK P., KNAP W.: Si MOS Transistors for THz Detection. The Int. Joint Sinano/Nanofunction/New Member States-Eastern Europe/ENI2 Workshop on Advanced Process and Device Integration a. Innovative Nanofunctions in Nanoelectronics. Kiev, Ukraine, 8-11.04.2013 (inv. lect.).
  • [C46] MOCZAŁA M., PALCZYŃSKA A., SIERAKOWSKI A., DOBROWOLSKI R., GRABIEC P., GOTSZALK T.: Mechanical Characterization of MEMS and NEMS Devices Using Atomic Force Microscopy. 39Th Int. Conf. on Micro and Nano Eng. London, Great Britain, 16-19.09.2013 (poster).
  • [C47] MOCZAŁA M., SIERAKOWSKI A., DOBROWOLSKI R., GRABIEC P., GOTSZALK T.: Fabrication and Measurement of Micromechanical Bridge Structures for Mass Change Detection. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster).
  • [C48] MOCZAŁA M., SIERAKOWSKI A., DOBROWOLSKI R., GRABIEC P., GOTSZALK T.: Measurements of Mechanical Properties of NEMS Double Clamped Bridges Using Atomic Force Microscopy. 4Th Int. Conf. on Quantum Metrology. Poznań, Poland, 15-17.05.2013 (poster).
  • [C49] MROCZYŃSKI R., SIERAKOWSKI A., MOSSAKOWSKA-WYSZYŃSKA A., TYSZKA-ZAWADZKA A., PIRAMIDOWICZ R., MALINOWSKI M., SZCZEPAŃSKI P., BECK R. B.: A New SOI Laser Test Structure with a Silicon Waveguide and Built-In P+-i-N+ Diode Pumped Optically. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster).
  • [C50] NIERADKA K., JÓŹWIAK G., KOPIEC D., GRABIEC P., JANUS P., SIERAKOWSKI A., GOTSZALK T.: A Method for Linearization of Split Photodiode Position Detectors Response. Eurosensors XXV. Ateny, Grecja, 4-7.09.2013 (poster).
  • [C51] OBRĘBSKI D., SZYMAŃSKI A., TOMASZEWSKI D., GRODNER M., MARCZEWSKI J., PIECZYŃSKI J.: Development of Ionizing Radiation Detectors Integrated with Readout Electronics. Int. Conf. Mixed Design of Integrated Circuits and Systems. Gdynia, Poland, 20-22.06.2013 (paper).
  • [C52] PARLATO L., PEPE G., DE LISIO C., PAGLIARULO V., BONAVOLONTA C., ARPAIA R., MILETTO GRANOZIO F., SCOTTI DI UCCIO U., CRISTIANO R., EJRNAES M., SŁYSZ W., WANG Y., SOBOLEWSKI R.: Femtosecond Photoresponse of Proximitized All-Oxide Superconductor/Ferromagnet Nanostructures for Photon Detection. 15th Int. Symp. on Ultrafast Phenomena in Semiconductors. Vilnius, Lithuania, 25-28.08.2013 (paper).
  • [C53] PIOTROWSKI T., WĘGRZECKI M., CZERWIŃSKI A., TESLENKO G. I., MALYUTENKO O. YU., MALYUTENKO V. K.: Recombination Properties of Diode Structures by Study of Thermal Emission Beyond the Fundamental Absorption Band. Microtherm 2013 Microtechnology and Thermal Problems in Electronics. Lodz, Poland, 25-28.06.2013 (paper).
  • [C54] PROKARYN, POLAND P., DOMAŃSKI K., SIERAKOWSKI A., SZMIGIEL D., RYDOSZ A., MAZIARZ W., PISARKIEWICZ T., GRABIEC P.: Fabrication of Hybrid Analytical Circuits – Micromechanical Gas Preconcentrator. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster).
  • [C55] PROKARYN, POLAND P., MARCHEWKA M., DOMAŃSKI K., GRABIEC P., PUSCASU O., MONFRAY S., SKOTNICKI T.: Energy Harvesting. Idea and Construction of Device to Recover Thermal Energy from Environment. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster).
  • [C56] SIERAKOWSKI A., JANUS P., KOPIEC D., EKWIŃSKA M., PŁUSKA M., GRABIEC P., GOTSZALK T.: Piezoresistive Cantilever Working in a Shear Force Mode for in situ Characterization of Exposed Micro- and Nano-Structures. NanoScale 2013. Paris, France, 25-26.04.2013 (poster).
  • [C57] SIERAKOWSKI A., KOPIEC D., EKWIŃSKA M., PIASECKI T., DOBROWOLSKI R., PŁUSKA M., DOMAŃSKI K., GRABIEC P., GOTSZALK T.: Dynamic Method of Calibration and Examination Piezoresistive Cantilevers. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster).
  • [C58] SŁYSZ W., GUZIEWICZ M., GOŁASZEWSKA-MALEC K., DOMAGAŁA J., JUCHNIEWICZ M., BORYSIEWICZ M., KRUSZKA R., RATAJCZAK J., KOLKOVSKY V., BAR J., WĘGRZECKI M., PANAS A., WĘGRZECKA I., ŁASZCZ A., CZERWIŃSKI A., SOBOLEWSKI R.: NbTiN Superconducting Nanostructures with Ultrahigh Critical Current Densities for Single-Photon Detectors. SPIE Europe Optics a. Optoelectronics 2013. Praga, Czech Republic, 15-18.04.2013 (poster).
  • [C59] SŁYSZ W., GUZIEWICZ M., KLIMOV A., PEPE G., PARLATO L., JUCHNIEWICZ M., BORYSIEWICZ M., KRUSZKA R., WĘGRZECKI M., ŁASZCZ A., CZERWIŃSKI A., SOBOLEWSKI R.: Proximitized NbN/NiCu and NbTiN/NiCu Superconductor/Ferromagnet Nano-Bilayers for Single Photon Detection. XVI Nation. Conf. of Superconductivity. Zakopane, Poland, 7-11.11.2013 (poster).
  • [C60] SOBOLEWSKI R.: Terahertz Photonics: Generation and Detection of THz Transients and Their Applications. 15th Int. Symp. on Ultrafast Phenomena in Semiconductors. Vilnius, Lithuania, 25-28.08.2013 (inv. lect.).
  • [C61] STOLARSKI M., WĘGRZECKI M., KULAWIK J., SYNKIEWICZ B.: Studies of the Influence of the Design and Fabrication on the Temporal Stability of Neutron Sensors Developed in ITE. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster, in Polish).
  • [C62] SZMIGIEL D., GRABIEC P.: Impact of the Structural Funds (POIG) Initiative on Microsystem Technology Development in Poland (MINTE and MNS-DIAG Projects). Nano a. Advanced Materials Workshop a. Fair NAMF 2013, Satellite Event of MRS Fall Meet. Warsaw, Poland, 16-19.09.2013 (paper).
  • [C63] TOMASZEWSKI D., GŁUSZKO G.: A Simple GNU Octave-Based Tool for Extraction of MOSFET Parameters. 11th MOS-AK/GSA ESSDERC ESSCIRC Workshop. Bucharest, Romania, 20.09.2013 (poster).
  • [C64] TOMASZEWSKI D., YAKUPOV M.: Compact Modeling of MOS Transistors for the Analysis of Parametric Yield. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (inv. lect., in Polish).
  • [C65] TOMASZEWSKI D., ZABOROWSKI M., KUCHARSKI K., MARCZEWSKI J., DOMAŃSKI K., EKWIŃSKA M., JANUS P., BIENIEK T., GŁUSZKO G., JAROSZEWICZ B., GRABIEC P.: SOI-Based Microsensors. 7th Int. Workshop. Kiev, Ukraine, 8-11.04.2013 (inv. lect.).
  • [C66] WĘGRZECKA I., PANAS A., BAR J., BUDZYŃSKI T., GRABIEC P., KOZŁOWSKI R., SARNECKI J., SŁYSZ W., SZMIGIEL D., WĘGRZECKI M., ZABOROWSKI M.: Fabrication of the Structures of Silicon Detectors of Charge Particles Developed in ITE. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster).
  • [C67] WĘGRZECKI M., BAR J., CIEŻ M., GRABIEC P., KOZŁOWSKI R., KULAWIK J., PANAS A., SARNECKI J., SŁYSZ W., SZMIGIEL D., WĘGRZECKA I., WIELUNSKI M., WITEK K., YAKUSHEV A., ZABOROWSKI M.: Design and Properties of the Structures of Silicon Detectors of Charge Particles Developed in ITE. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (commun. , in Polish).
  • [C68] WIELGOSZEWSKI G., MOCZAŁA M., KOPIEC D., GOTSZALK T., BIENIEK T., JANCZYK G., JANUS P., GRABIEC P., KRAEH CH., POPESCU A.: Estimation of the Elastic Modulus of Polycrystalline-Silicon Microrods Using AFM-Based Techniques 39th Int. Conf. on Micro and Nano Eng. Londyn, Wielka Brytania, 19.09.2013 (poster).
  • [C69] WIELGOSZEWSKI G., PAŁETKO P., MOCZAŁA M., JÓŹWIAK G., ZABOROWSKI M., TOMASZEWSKI D., GRABIEC P., GOTSZALK T.: Scanning Thermal Microscopy and Kelvin Probe Force Microscopy Investigation of a Silicon Nanowire with Relation to the Carrier Density Distribution. Int. Scanning Probe Microscopy. Dijon, France, 30.06-3.07.2013 (poster).
  • [C70] ZABOROWSKI M., TOMASZEWSKI D., GRABIEC P.: Adjustment of ISFET-Type Micro- and Nanosensors. XI Sci. Conf. "Electron Technology". Ryn, Poland, 16-20.04.2013 (poster).
  • [C71] ZAGRAJEK P., PAŁKA N., MARCZEWSKI J., KUCHARSKI K., KOPYT P., GWAREK W., ŁUSAKOWSKI J., SUSZEK J., MAKOWSKI M., SYPEK M.: THz Optical Element for the Field Effect Transistor Detectors. THZ Days and GDR-I Network Meet. Cargese, Italy, 25-27.03.2013 (inv. lect.).
  • Patents’2013
  • [PA1] GRODECKI R., JUNG W., PIOTROWSKI W., PUŁTORAK J., SIKORSKI S., WĘGRZECKI W: Source of Moulated Infrared Radiation and Matrix of Infrared-Radiation. Pat. no. P.385456 (in Polish).
  • [PA2] GRODECKI R., PIOTROWSKI T., PUŁTORAK J., WĘGRZECKI M.: Matrix of Sources of Modulated Infrared. Pat. no. P.385428 (in Polish).
  • [PA3] PIOTROWSKI, WĘGRZECKI M.: Infrared Image Emitter. Pat. no. P.386063 (in Polish).
  • [PA4] PIOTROWSKI, WĘGRZECKI M.: Source of Modulated Thermal Radiation. Pat. no. P.385216 (in Polish).
  • [PA5] ZABOROWSKI M., GRABIEC P., PANAS A., SKWARA K., SZMIGIEL D.: A Method to Fabricate Narrow Silicon Paths. Pat. no. 215875 (in Polish).
  • [PA6] YAKUSHEV A., WĘGRZECKI M., GRABIEC P., BAR J., PANAS A., SZMIGIEL D., MILCZAREK W., PROKARYN, POLAND P., KŁOS H., ZABOROWSKI M., BUDZYŃSKI T., GÓRSKA M., WĘGRZECKI M.: A Flow Detector Matrix. Pat. Appl. no.P.405333 (in Polish).
  • [PA7] YAKUSHEV A., WĘGRZECKI M., WĘGRZECKA I.: A Flow Detector. Pat. Appl. no. P.405334 (in Polish).
  • [PA8] KŁOS H., PROKARYN P., MILCZAREK W., GÓRSKA M., WĘGRZECKI M., BAR J., GRABIEC P.: A Method for Selective Bonding of Flat Semiconductor and/or Dielectric Components. Pat. Appl. no. P.406473 (in Polish).
  • [PA9] LATECKI B., KOWALSKI P.: Package for a Silicon Non-Return Micro-Valve. Utility model Ru. 66704.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-87fdbc3a-0949-43a2-9a03-33758dd0cb6a
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