Identyfikatory
Warianty tytułu
Języki publikacji
Abstrakty
An optical study of satinated Pittsburgh glass wafers was conducted and special attention was paid to their applications in greenhouse industry. They included: specular reflectance spectra in the range 300–1100 nm, using a reflection probe, resolve angle scattering, diffuse reflectance by means of an integrating sphere, X–Y optical profile measurements and ellipsometric investigation by means of a spectroscopic ellipsometer. Additionally, a surface topography study of investigated samples was carried out by means of atomic force microscopy (AFM) measurements. The obtained results allowed us to describe surface topography of chemically and mechanically modified surfaces.
Czasopismo
Rocznik
Tom
Strony
453--461
Opis fizyczny
Bibliogr. 14 poz., rys., wykr.
Twórcy
autor
- Institute of Physics, Cracow University of Technology, ul. Podchorążych 1, 30-084 Kraków, Poland;
Bibliografia
- [1] NEUROTH N., [In] The Optical Properties of Glass, [Eds.] Bach H., Neuroth N., Vol. 2, Springer-Verlag, Berlin, Heidelberg, 1998, p. 73.
- [2] BACH H., [In] Thin Film Optical Coatings, [Eds.] Bach H., Krause D., Vol. 2, Springer-Verlag, Berlin, Heidelberg, 1997, p. 24.
- [3] KURATA K., Role of reflection in light transmissivity of greenhouses, Agricultural and Forest Meteorology 52(3–4), 1990, pp 319–331.
- [4] BECKMAN P., SPIZINOCHINO B., [In] The Scattering of Electromagnetics Waves from Rough Surfaces, Vol. 1, Pergamon Press, Oxford, London, New York, Paris 1963, p. 70.
- [5] ASTM E 284, [In] ASTM Standards on Color and Appearance Measurements, 4th Ed., ASTM Philadelphia, 1994.
- [6] JAGLARZ J., Topography descriptions of thin film by optical Fourier transform, Thin Solid Films 516(22), 2008, pp. 8077–8081.
- [7] AZZAM R.M.A., BASHARA N.M., Ellipsometry and Polarized Light, Nord Holland, 1987.
- [8] WHITEHOUSE D.J., Handbook of Surface and Nanometrology, 1st Ed., IOP Publishing, Bristol and Philadelphia, 2003.
- [9] JAGLARZ J., SANETRA J., CISOWSKI J., Studies of polymer surface topography by means of optical profilometry, Optica Applicata 40(4), 2010, pp. 767–772.
- [10] JAGLARZ J., Topography description of surfaces and thin films by Fourier transform, obtained from non-standard optical measurements, [In] Fourier Transforms Theory and Applications, Intech Open Access Publisher, 2011, Rijeka.
- [11] MAINSAH E., DONG W.P., STOUT K.J., Problems associated with the calibration of optical probe based topography instruments, Measurement 17(3), 1996, pp. 173–181.
- [12] ELSON J.M., BENNETT J.M., Calculation of the power spectral density from surface profile data, Applied Optics 34(1), 1995, pp. 201–208.
- [13] SPRINGSTEEN A., [In] Applied Spectroscopy, [Ed.] Workmann J., Vol. 1, Academic Press, 1998, p. 205.
- [14] STOVER J.C., Optical Scattering Measurements and Analysis, SPIE, Belligham, 1995, p. 19.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-81b042e0-c82e-4cf5-9e2b-6b72d7f9498a