Measurement of Silver Nanolayer Absorption by the Body in an in Vivo Model of Inflammatory Gastrointestinal Diseases

• Autorzy: Siczek K. , Pawlak W. , Zatorski H. , Fichna J.

Identyfikatory

DOI

10.1515/mms-2016-0008

• Języki publikacji: EN

Abstrakty

EN

Layers of silver particles are used in the studies on pathophysiology and treatment of diseases, both in pre-clinical and clinical conditions. Silver layers can be formed using different techniques and on different substrates. Deposition by magnetron sputtering on glass beads was used in this study. Silver absorption by the body was estimated by calculating the difference in thickness of the silver nanolayer deposited on a bead and measured before and after application of the bead in an animal model of gastrointestinal inflammation. Recommendations for the minimal thickness of silver nanolayer deposited on glass beads were worked out for further studies.

Słowa kluczowe

EN

silver nanolayer; measurement of layer thickness; in vivo animal model

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2016
• Tom: Vol. 23, nr 1
• Strony: 133--142
• Opis fizyczny: Bibliogr. 27 poz., rys., tab., wykr., wzory

Twórcy

autor

Siczek K.

• Lodz University of Technology, Department of Vehicles and Fundamentals of Machine Design, S. Żeromskiego 116, 90-924, Lódź, Poland

autor

Pawlak W.

• Lodz University of Technology, Institute of Materials Science and Engineering, Stefanowskiego 1/15, 90-924, Lódź, Poland

autor

Zatorski H.

• Medical University of Lodz, Department of Biochemistry, Mazowiecka 6/8, 92-215, Lódź, Poland

autor

Fichna J.

• Medical University of Lodz, Department of Biochemistry, Mazowiecka 6/8, 92-215, Lódź, Poland

Bibliografia

• [1] Ge, L., Li, Q., Wang, M., Ouyang, J., Li, X., Xing, M.M.Q. (2014). Nanosilver particles in medical applications: synthesis, performance, and toxicity. Int. J. Nanomedicine, 9, 2399-2407.
• [2] Chen, X., Schluesener, H.J. (2008). Nanosilver: a nanoproduct in medical application. Toxicol Lett., 176(1), 1-12.
• [3] Hunt, P.R., Keltner, Z., Gao, X., Oldenburg, S.J., Bushana, P., Olejnik, N., Sprando, R.L. (2014). Bioactivity of nanosilver in Caenorhabditis elegans: Effects of size, coat, and shape. Toxicology Reports, 1, 923-944.
• [4] Walczyńska-Gładysz, M. (2015). Characterization of biomaterials and nanotechnology products using a model multicellular organism Caenorhabditis elegans. PhD Thesis, Lodz University of Technology.
• [5] Boosalis, M.G., McCall, J.T., Ahrenhalz, D.H., Solem, L.H., McClain, C.J. (1987). Serum and urinary silver levels in thermal injury patients. Surgery, 101, 40-43.
• [6] Gibaud, A., Hazra, S. (2000). X-ray relectivity and diffuse scaterring. Current Science, 78(12), 1467-1477.
• [7] Lu, Z.H., McCaffrey, J.P., Brar, B., Wilk, G.D., Wallace, R.M., Feldman, L.C., Tay, S.P. (1997). SiO2 film thickness metrology by x-ray photoelectron spectroscopy. Appl. Phys. Lett., 71, 2764.
• [8] Danzebrink, H.U., Koenders, L., Wilkening, G., Yacoot, A., Kunzmannl, H. (2006). Advances in Scanning Force Microscopy for Dimensional Metrology. CIRP Annals-Manufacturing Technology, 55, 841‒878.
• [9] Schaub, A., Slepicka, P., Kasparkova, I., Malinsky, P., Mackova, A., Svorcik, A. (2013). Gold nanolayer and nanocluster coatings induced by heat treatment and evaporation technique. Nanoscale Research Letters, 8, 249.
• [10] Losurdo, M., Bergmair, M., Bruno, G., Cattelan, D., Cobet, C., de Martino, A., Fleischer, K., Dohcevic- Mitrovic, Z., Esser, N., Galliet, M., Gajic, R., Hemzal, D., Hingerl, K., Humlicek, J., Ossikovski, R., Popovic, Z.V., Saxl, O. (2009). Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives. J. Nanopart. Res., 11, 1521‒1554.
• [11] Halimaoui, A., Henrisey, E., Hernandez, C., Martins, J., Paoli, M., Regache, M., Vallier, L., Bensahel, D., Blanchard, B., Rouchon D., Martin, F. (1998). Tailoring of the Nitrogen Profile in Thin Gate Oxides Using Substrate Nitridation by Nitric Oxide. MRS Proceedings, 532, 159.
• [12] Kimura, K., Nakajima, K., Conard, T., Vandervorst, W., Bergmaier, A., Dollinger, G. (2010). Analysis of ultra-Thin HfO2/SiON/Si(001): Comparison of three different techniques. Analytical Sciences, 26.2, 223-226.
• [13] Reading, M.A., van den Berg, J.A., Zalm, P.C., Armour, D.G., Bailey, P., Noakes, T.C.Q., Parisini, A., Conard, T., de Gendt, S. (2010). High resolution medium energy ion scattering analysis for the quantitative depth profiling of ultrathin high-k layers. Journal of vacuum science & technology B. Microelectronics and nanometer structures: processing, measurement, and phenomena: an official journal of the American Vacuum Society, 28(1), C1C65-C1C70.
• [14] Dollinger, G., Frey, C.M., Bergmaier, A., Faestermann, T. (1998). Depth profile analysis with monolayer resolution using elastic recoil detection. Europhys. Lett., 42, 25.
• [15] Brijs, B., et al. (2000). Characterization of ultra thin oxynitrides: A general approach. Nucl. Instrum. Methods Phys. Res. B, 161, 429.
• [16] Brundle, C.R., Conti, G., Mack, P. (2010). XPS and angle resolved XPS, in the semiconductor industry, Characterization and metrology control of ultra-thin films. J. Electron Spectrosc. Relat. Phenom., 178, 433.
• [17] Herrera-Gomez, A., et al. (2009). Report on the 47th IUVSTA Workshop ‘Angle-Resolved XPS: The Current Status and Future Prospects for Angle-resolved XPS of Nano and Subnano Films. Surf. Interface Anal. 41, 840.
• [18] Conard, T., Vandervorst, W., Bergmaier, A., Kimura, K. (2012). Thin layer composition profiling with angular resolved x-ray photoemission spectroscopy: Factors affecting quantitative results. Journal of Vacuum Science & Technology A, 30(3).
• [19] Douglas, M.A., Hattangady, S., Eason, K. (2000). Depth Profile Analysis of Ultrathin Silicon Oxynitride Films by TOFSIMS. J. Electrochem. Soc. 147, 1893.
• [20] van Berkum, J.G.M., Hopstaken, M.J.P., Snijders, J.H.M., Tamminga, Y., Cubaynes, F. (2003). Quantitative depth profiling of SiOxNy layers on Si. Appl. Surf. Sci., 203, 414.
• [21] de Witte, H., Conard, T., Vandervorst, W., Gijbels, R. (2003). Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks. Appl. Surf. Sci., 203, 523.
• [22] Conard, T., Vandervorst, W., de Witte, H., van Elshocht, S. (2004). Nitrogen analysis in high-k stack layers: a challenge. Appl. Surf. Sci., 231, 581.
• [23] Vandervorst, W., Bennett, J., Huyghebaert, C., Conard, T., Gondran, C., de Witte, H. (2004). On the reliability of SIMS depth profiles through HfO 2-stacks. Appl. Surf. Sci., 231, 569.
• [24] Bennett, J., Beebe, M., Sparks, C., Gondran, C., Vandervorst, W. (2004). Sputter rate variations in silicon under high- k dielectric films. Appl. Surf. Sci., 231, 565.
• [25] Powell, C.J., Werner, W.S.M., Smekal, W. (2006). Distinguishability of N composition profiles in SiON films on Si by angle-resolved x-ray photoelectron spectroscopy. Appl. Phys. Lett., 89, 172101.
• [26] http://www.imim.pl/labs/205 (Nov. 2015)
• [27] Sobczak, M., Mokrowiecka, A., Cygankiewicz, A.I., Zakrzewski, P.K., Salaga, M., Storr, M., Kordek, R., Malecka-Panas, E., Krajewska, W.M., Fichna, J. (2014). Anti-inflammatory and antinociceptive action of an orally available nociceptin receptor agonist SCH 221510 in a mouse model of inflammatory bowel diseases. J. Pharmacol. Exp. Ther., 348, 401‒409.

Uwagi

EN

The research was supported by the National Science Centre (#UMO-2013/11/B/NZ7/01301 and UMO-2014/13/B/NZ4/01179 to JF) and Medical University of Lodz (503/1-156-04/503-01). Hubert Zatorski is a recipient of Diamentowy Grant from the Ministry of Science and Higher Education in Poland.

PL

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę.