Construction of an Expert System Based on Fuzzy Logic for Diagnosis of Analog Electronic Circuits

• Autorzy: Grzechca D. E.

Identyfikatory

DOI

10.1515/eletel-2015-0010

• Języki publikacji: EN

Abstrakty

EN

The paper presents construction of the fuzzy logic system to analog circuits parametric fault diagnosis. The classical dictionary construction is replaced by fuzzy rule system. The first part refers to analog fault diagnosis, its techniques, approaches and goals. It clarifies common strategy and define differences between detecting, locating and identifying a fault in analog electronic circuit. The second part is focused on a creation of fuzzy rule expert system with use of sensitivity functions and known circuit topology. To detect, locate and identify a faulty element in a circuit the sensitivity matrix is used. The advantage of the method is its utilization in all, AC, DC and time domain. The fuzzy system, like the classical fault dictionary, can detect and locate single catastrophic faults and, on the contrary to the classical one, it also detects and locates parametric faults. Moreover, it allows identification of these faults, such that sign of the faulty parameter deviation is designated. The method has deterministic character as well as it can be applied on the verification and production stage.

Słowa kluczowe

EN

analog circuits fault diagnosis; analog system testing; fuzzy set theory; expert system; sensitivity analysis

• Wydawca: Polish Academy of Sciences, Committee of Electronics and Telecommunication
• Czasopismo: International Journal of Electronics and Telecommunications
• Rocznik: 2015
• Tom: Vol. 61, No. 1
• Strony: 77--82
• Opis fizyczny: Bibliogr. 25 poz., rys., tab.

Twórcy

autor

Grzechca D. E.

• Institute of Electronics, Silesian University of Technology, Gliwice, Poland

Bibliografia

• [1] Michael L. Bushnell, Vishwani D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Kluwer Academic Publishers 2002, ISBN: 0-306-47040-3.
• [2] I. L. Huertas, Test and design for testability of analog and mixed - signal integrated circuits: theoretical basis and pragmatical approaches in 1993 Proc. ECCTD Conf., pp. 75-156.
• [3] L. S. Milor, A Tutorial Introduction to Research on Analog and Mixed - Signal Circuit Testing, IEEE Trans. on Circuits and Systems-II, vol.45, pp. 1389-1407, no.10,1998.
• [4] A. Richardson, A. Lechner, and T. Olbricht, Design for Testability for Mixed Signal & Analogue Designs - From Layout to System, in 1998 Proc. ICECS, pp.425-432.
• [5] Pen-Min Lin and Y. S. Elcherif, Computational Approaches to Fault Dictionary, Analog Methods for Computer - Aided Circuit Analysis and Diagnosis, M.Dekker, 1998.
• [6] V. C. Prasad and N. S. C. Babu, Selection of test nodes for analog fault diagnosis in dictionary approach, IEEE Trans. Instrum. Meas., vol.49, pp.1289-1297, no.6, 2000.
• [7] Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha, Fault Diagnosis of Analog Integrated Circuits, Frontiers in Electronic Testing, Vol. 30, Springer 2005.
• [8] J. A. Starzyk, Dong Liu, Zhi-Hong Liu, Dale E. Nelson, and J. Rutkowski, Entropy-Based Optimum Test Points Selection for Analog Fault Dictionary Techniques, IEEE Trans. on Instr. and Measur., vol.53, no.3, June 2004, pp. 754-761.
• [9] T. Golonek, J. Rutkowski, Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection, IEEE Trans. on Cir. and Syst. - II., Vol.54, No.2, pp. 117-121, 2007.
• [10] J. Rutkowski and T. Golonek, Application of Genetic Algorithms to Analog Fault Diagnosis, in 2001 Proc. ECCTD, pp. 253-256.
• [11] M. Aminian, F. Aminian, A Modular Fault-Diagnostic System for Analog Electronic Circuit Using Neural Networks With Wavelet Transform as a Preprocessor, IEEE Trans. on Inst. and Measur., vol. 56, no. 5, Oct. 2007.
• [12] T.R. Balen, J.V. Calvano, M.S. Lubaszewski, M. Renovell, Functional Test of Field Programmable Analog Arrays, Proc. of the 24th IEEE VLSI Test Symposium (VTS’06).
• [13] P. Bilski, M. Wojciechowski, Automated Diagnostics of Analog Systems Using Fuzzy Logic Approach, IEEE Trans. on Inst. and Measur., Vol. 56, No. 6, Dec. 2007.
• [14] Z. Czaja, R. Zielonko, On fault diagnosis of analogue electronic circuits based on transformations in multi-dimensional spaces, Measurement 2004, vol. 35, no. 3, pp.293-301.
• [15] S. R. Das, J. Zakizadeh, S. Biswas, M.H. Assaf, A. R. Nayak, E. M. Petriu, W.-B. Jone, M. Sahinoglu, Testing Analog and Mixed-Signal Circuits With Built-In Hardware - A New Approach, IEEE Trans. on Inst. and Measur., Vol. 56, No. 3, Jun. 2007.
• [16] Peng Wang, Shiyuan Yang, A New Diagnosis Approach for Handling Tolerance in Analog and Mixed - Signal Circuits by Using Fuzzy Math, IEEE TCSAS-I, Vol. 53, No 10, Oct. 2005.
• [17] Grzechca D. Golonek T., Rutkowski J., Simulated Annealing with Fuzzy Fitness Function for Test Frequencies Selection, IEEE Conference on Fuzzy Systems, FUZZ-IEEE 2007, London, UK.
• [18] Grasso F. et all, A Method for the Automatic Selection of Test Frequencies in Analog Fault Diagnosis, IEEE Trans. on Instr. and Measur., Vol. 56, No 6, Dec. 2007.
• [19] M. Tadeusiewicz, S. Hałgas, An algorithm for multiple fault diagnosis in analogue circuits, Int. Journal of Circuit Theory and Applications, J.Wiley & Sons. Ltd., 34, pp.607-615, 2006.
• [20] Zadeh L.A., Fuzzy Sets, Inf. Control, August 1965, pp.338-353.
• [21] Grzechca D., Rutkowski J., Analog Fault Dictionary - Fuzzy Set Approach, European Conference on Circuit Theory and Design, ECCTD 2001, Espoo, Finland, pp. 249-252.
• [22] Abdulghafour, M.; El-Gamal, M.A., A fuzzy logic system for analog fault diagnosis, International Conference on Circuits and Systems, 1996. ISCAS '96, pp. 97-100.
• [23] Kumar A, Singh AP., Fuzzy classifier for fault diagnosis in analog electronic circuits, ISA Trans., 52(6):816-24, 2013.
• [24] Pous, C.; Colomer Llinas, J.; Melendez, J.; de la Rosa, J.Ll. Fuzzy identification for fault isolation. Application to analog circuit diagnosis, Frontiers in Artificial Intelligence and Applications 409-420, 2003.
• [25] Grzechca, D.; Golonek, T.; Rutkowski, J., Analog fault AC dictionary creation - the fuzzy set approach, Circuits and Systems, 2006. ISCAS 2006.