Depth-resolved measurement of the compression displacement fields on the front and rear surfaces of an epoxy sample

• Autorzy: Zhang W. , Dong B. , Zhang W. , He Z. , Xie S. , Zhou Y.

Identyfikatory

DOI

10.5277/oa180213

• Języki publikacji: EN

Abstrakty

EN

Compression is one of the typical parameters measured in material mechanics. In this research, the compression displacement fields on the front and rear surfaces of an epoxy sample are measured by using a tilt depth-resolved wavenumber-scanning Michelson interferometer. The light source is a distributed feedback laser diode, the wavenumber of which can be modulated to about 1.017 × 10⁴ m^–1 by the temperature without mode hopping. A random-sampling Fourier transform is designed to evaluate the phase differences before and after the applied loads. Experimental results show that the depth-resolved measurement of the compression displacement field is of high accuracy. It can be used to analyze force propagation inside resin-based composites.

Słowa kluczowe

EN

depth-resolved measurement; compression displacement field; wavenumber-scanning interferometry; epoxy

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2018
• Tom: Vol. 48, nr 2
• Strony: 311--323
• Opis fizyczny: Bibliogr. 9 poz., rys.

Twórcy

autor

Zhang W.

• School of Automation, Guangdong University of Technology, Guangzhou, P.R. China, 510006

autor

Dong B.

• School of Automation, Guangdong University of Technology, Guangzhou, P.R. China, 510006

autor

Zhang W.

• Guangzhou Intellicash Equipment Co., Ltd., Guangzhou, P.R. China, 510663

autor

He Z.

• School of Automation, Guangdong University of Technology, Guangzhou, P.R. China, 510006

autor

Xie S.

• School of Automation, Guangdong University of Technology, Guangzhou, P.R. China, 510006

autor

Zhou Y.

• School of Automation, Guangdong University of Technology, Guangzhou, P.R. China, 510006

Bibliografia

• [1] RASTOGI P.K., Digital Speckle Pattern Interferometry and Related Techniques, 1st Ed., Wiley, 2001.
• [2] YANZHOU ZHOU, WILDMAN R.D., HUNTLEY J.M., Measurement of the mechanical properties of granular packs by wavelength-scanning interferometry, Proceedings of the Royal Society of A: Mathematical, Physical and Engineering Sciences 466(2115), 2010, pp. 789–808.
• [3] RUIZ P.D., YANZHOU ZHOU, HUNTLEY J.M., WILDMAN R.D., Depth-resolved whole-field displacement measurement using wavelength scanning interferometry, Journal of Optics A: Pure and Applied Optics 6(7), 2004, pp. 679–683.
• [4] RUIZ P.D., HUNTLEY J.M., WILDMAN R.D., Depth-resolved whole-field displacement measurement by wavelength-scanning electronic speckle pattern interferometry, Applied Optics 44(19), 2005, pp. 3945–3953.
• [5] YUN ZHANG, BO DONG, YULEI BAI, SHUANGLI YE, ZHENKUN LEI, YANZHOU ZHOU, Measurement of depth-resolved thermal deformation distribution using phase-contrast spectral optical coherence tomography, Optics Express 23(21), 2015, pp. 28067–28075.
• [6] DE LA TORRE IBARRA M.H., RUIZ P.D., HUNTLEY J.M., Simultaneous measurement of in-plane and out-of-plane displacement fields in scattering media using phase-contrast spectral optical coherence tomography, Optics Letters 34(6), 2009, pp. 806–808.
• [7] CHAKRABORTY S., RUIZ P.D., Measurement of all orthogonal components of displacement in the volume of scattering materials using wavelength scanning interferometry, Journal of the Optical Society of America A 29(9), 2012, pp. 1776–1785.
• [8] JINXIONG XU, YUFEI LIU, BO DONG, YULEI BAI, LINLIN HU, CONG SHI, ZHUOMING XU, YANZHOU ZHOU, Improvement of the depth resolution in depth-resolved wavenumber-scanning interferometry using multiple uncorrelated wavenumber bands, Applied Optics 52(20), 2013, pp. 4890–4897.
• [9] HUNTLEY J.M., Noise-immune phase unwrapping algorithm, Applied Optics 28(16), 1989, pp. 3268–3270.

Uwagi

Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2018).