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Konferencja
Polish Seminar on Positron Annihilation (42 nd ; 29.06-01.07.2016 ; Lublin, Poland)
Języki publikacji
Abstrakty
Some applications of controlled-energy positron beams in material studies are discussed. In porous organic polysilicates, measurements of 3γ annihilation by Doppler broadening (DB) method at the Trento University allowed to trace pore closing and filling by water vapor. In silicon coimplanted by He+ and H+, DB data combined with positron lifetime measurements at the München pulsed positron beam allowed to explain Si blistering. Presently measured samples of W for applications in thermonuclear reactors, irradiated by W+ and electrons, show vast changes of positron lifetimes, indicating complex dynamics of defects.
Słowa kluczowe
Czasopismo
Rocznik
Strony
733--739
Opis fizyczny
Bibliogr. 49 poz., rys.
Twórcy
autor
- Institute of Physics, Faculty of Physics, Astronomy and Applied Informatics, Nicolaus Copernicus University in Toruń, 5/7 Grudziądzka Str., 87-100 Toruń, Poland
autor
- Physics Department, University of Trento and TIFPA-INFN, 38123 Povo (TN), via Sommarive 14, Italy
autor
- Universität der Bundeswehr München, Werner-Heisenberg-Weg 39, 85577 Neubiberg, Germany
autor
- National Research Nuclear University “MEPHI”, Kashirskoe sh. 31, Moscow, Russia
Bibliografia
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- 3. Karwasz, G. P., Zecca, A., Brusa, R. S., & Pliszka, D. (2004). Application of positron annihilation techniques for semiconductor studies. J. Alloy. Compd., 382(1/2), 244–251. DOI: 10.1016/j.jallcom. 2004.05.037.
- 4. Dupasquier, A., Kögel, G., & Somoza, A. (2004). Studies of light alloys by positron annihilation techniques. Acta Mater., 52, 4707. DOI: 10.1016/j.actamat.2004.07.004.
- 5. Goworek, T., Zaleski, R., & Wawryszczuk, J. (2004). Observation of intramolecular defects in n-alkanes C25H52-C29H60 by the positron annihilation method. Chem. Phys. Lett., 394, 90–92. DOI: 10.1016/j.cplett.2004.06.116
- 6. Śniegocka, M., Jasińska, B., Goworek, T., & Zaleski, R. (2006). Temperature dependence of o-Ps lifetime in some porous media. Deviations from ETE model. Chem. Phys. Lett., 430, 351–354. DOI: 10.1016/j.cplett.2006.09.001.
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- 8. Brusa, R. S., Deng, W., Karwasz, G. P., & Zecca, A. (2002). Doppler-broadening measurements of positron annihilation with high-momentum electrons in pure metals. Nucl. Instrum. Methods Phys. Res. Sect. B-Beam Interact. Mater. Atoms, 194, 519–531. DOI:10.1016/S0168-583X(02)00953-9.
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- 11. Brusa, R., Deng, W., Karwasz, G. P., Zecca, A., & Pliszka, D. (2001). Positron annihilation study of vacancy-like defects related to oxygen precipitates in Czochralski-type Si. Appl. Phys. Lett., 79, 1492. DOI:10.1063/1.1401782.
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- 20. Brusa, R. S., Macchi, C., Mariazzi, S., Karwasz, G.P., Laidani, N., Bartali, R., & Anderle, M. (2005).Amorphous carbon film growth on Si: Correlation between stress and generation of defects into the substrate. Appl. Phys. Lett., 86, 221906. DOI:10.1063/1.1940738.
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- 25. Gorgol, M., Jasińska, B., & Reisfeld, R. (2015). PALS investigations of matrix Vycor glass and doped by molecules of luminescent dye and silver nanoparticles.Discrepancies from the ETE model. Nukleonika,60(4), 717–720.
- 26. Macchi, C., Mariotto, G., Karwasz, G. P., Zecca, A.,Bettonte, M., & Brusa, R. S. (2004). Depth profiled porosity and micro-structure evolution studied by Positron Annihilation and Raman spectroscopy in SiOCH low-κ films. Mater. Sci. Semicond. Proc., 7,289–294. DOI: 10.1016/j.mssp.2004.09.093.
- 27. Brusa, R. S., Spagolla, M., Karwasz, G. P., Zecca, A., Ottaviani, G., Corni, F., & Carollo, E. (2004). Porosity in low dielectric constant SiOCH films depth profiled by positron annihilation spectroscopy. J. Appl. Phys.,95, 2348–2354. DOI: 10.1063/1.1644925.
- 28. Brusa, R. S., Karwasz, G. P., Tiengo, N., Zecca, A., Corni, F., Tonini, R., & Ottaviani, G. (2000). Formation of vacancy clusters and cavities in He-implanted silicon studied by slow-positron annihilation spectroscopy.Phys. Rev. B, 61, 10154–10166. DOI: 10.1103/PhysRevB.61.10154.
- 29. Brusa, R. S., Macchi, C., Mariazzi, S., Karwasz, G. P., Egger, W., Sperr, P., & Kögel, G. (2006). Decoration of buried surfaces in Si detected by positron annihilation spectroscopy. Appl. Phys. Lett., 88, 011920. DOI:10.1063/1.2162691.
- 30. Song, M. -Y., Yoon, J. -S., Cho, H., Itikawa, Y., Karwasz, G. P., Kokoouline, V., Nakamura, Y., & Tennyson,J. (2015). Cross sections for electron collisions with methane. J. Phys. Chem. Ref. Data, 44, 023101.DOI: 10.1063/1.4918630.
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- 33. Tyburska-Püschel, B., Alimov, V. Kh, ’t Hoen, M. H.J., Zgardzinska, B., Dorner, J., & Hatano, Y. (2013).Deuterium retention in tungsten damaged with MeV--range W ions at various temperatures and then exposed to D2 gas. In 14th International Conference on Plasma-Facing Materials and Components for Fusion Applications, May 13–17, 2013. Forschungszentrum Juelich, Germany. http://www.fz-juelich.de/conferences/PFMC-14/EN/_SharedDocs/Downloads/EN/pfmc14_book_of_abstracts.html?nn=1264182.
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- 35. Ogorodnikova, O. V., & Gann, V. (2015). Simulation of neutron-induced damage in tungsten by irradiation with energetic self-ions. J. Nucl. Mater., 460, 60–71.DOI: 10.1016/j.jnucmat.2015.02.004.
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Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-754814d6-8016-4cf3-8fa3-0216ca076b43