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Abstrakty
The temporal decay of the persistent photoenhancement of the conductivity current flowing through the active channel of two samples of a typical nanodevice comprising a low resistivity n-type InP:Fe epitaxial layer and a semi-insulating InP:Fe substrate is experimentally investigated at room temperature and interpreted via consideration of the functionality of the diodic interface potential barrier. A mean decay mechanism and its distinct regimes are singled out.
Słowa kluczowe
Wydawca
Rocznik
Tom
Strony
139--143
Opis fizyczny
Bibliogr. 4 poz., rys.
Twórcy
autor
- Department of Physics, University of Athens, 157 84 Zographos, Greece
autor
- Hellenic Physical Society, 174 55 Alimos, Greece
Bibliografia
- [1] Zardas G E, Yannakopoulos P H, Symeonides Ch I, Csabay O and Euthymiou P C 2005 Materials Science – Poland 23 985
- [2] Theodorou D E and Queisser H J 1980 Applied Physics 23 121
- [3] Zardas G E, Aidinis C J, Anagnostakis E A and Symeoinides Ch I 2011 Open Journal of Microphysics 1 32
- [4] Singh J 1995 Semiconductor Optoelectronics, Mc Graw-Hill, Series in Electrical and Computer Engineering, Singapore, Chapter 6
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-74a93b22-c754-4e75-9242-3cb0c04362ad