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http://yadda.icm.edu.pl:443/baztech/element/bwmeta1.element.baztech-73eb3b35-35f7-4338-b0bd-75762577455e

Czasopismo

International Letters of Chemistry, Physics and Astronomy

Tytuł artykułu

The Beam Current Considerations in SEM Accordance to Mirror Effect Phenomenon

Autorzy Al-Obaidi, H. N.  Khaleel, I. H. 
Treść / Zawartość
Warianty tytułu
Języki publikacji EN
Abstrakty
EN A theoretical investigation have been presented to exploring the influence of electrons beam current on the electron mirror image deduced inside the scanning electron microscope (SEM). A rough mathematical expression for the electric potential that associated with electron beam is derived. The results clearly shows that the beam current could be used to enhance or conversely deteriorate the phenomena of mirror effect. So this work procedure may consider to be tool controllable of this phenomena for investigation purposes.
Słowa kluczowe
EN scanning electron microscope   Electron Beam Current   Electron Mirror Images  
Wydawca Przedsiębiorstwo Wydawnictw Naukowych "DARWIN"
Czasopismo International Letters of Chemistry, Physics and Astronomy
Rocznik 2013
Tom Vol. 10, iss. 1
Strony 70--75
Opis fizyczny Bibliogr. 14 poz., rys., tab., wykr.
Twórcy
autor Al-Obaidi, H. N.
autor Khaleel, I. H.
  • Physics Department, College of Education, Al-Mustansiriah University, Baghdad, Iraq
Bibliografia
[1] Robert L. E., Scanning electron microscopy and X-ray microanalysis, Prentice-Hall, 1993.
[2] Novikov Y. A., Rakov A. V., Russia, Microelectronics 25(6) (1996) 375-383.
[3] Egerton R.F., Malac P. M., Micron 35 (2004) 399-409.
[4] Chad P., Dale B., Curt P., Phillip R., Microscopy and Analysis 21(5) (2007) 11-13.
[5] Okai N. and Sohda Y., Jap. J. Appl. Phys. 52 (2012) 06FB11.
[6] Ghorbel N., Kallel A., Dammame G., Renoud R., Fakhakh Z., Electrets, ISE-12 12th International Symposium, (2005) 235-238.
[7] Al-Obaidi H. N., Al-Saymary F. A., Ali A. A., Proc. Summ. Scho., Sep. 8th Oct. 8th, Milano, Italy, 2008.
[8] Croccolo F., Riccardi C., J. Microscopy 229(1) (2008) 39-43.
[9] Abbood T. H., “Formal Investigation of the Mirror Effect in SEM.” Ph.D. thesis, University of Al-Mustansiriyah, College of Education, Baghdad, Iraq, 2011.
[10] Milani M., Abdul-Wahab H. N., Abbood T. H., Savoia C., Tatti F., Sci., Tech. and Edu. (2010) 1741-1754.
[11] Belhaj M., Jbara O., Odof S., Msellak K., Rau E., Andrianov M., Scanning 88 (2008) 352-374.
[12] Belhaj M., Odof S., Msellak K., Jbara O., J. Appl. Phys. 88(5) (2000b).
[13] Milani M., Savoia C., Bigoni D., Proceedings of ITP2009, Interdisciplinary Transport Phenomena VI: Fluid, Thermal, Biological, Materials and Space Sciences, Volterra, Italy 2009.
[14] Hassan N., Imad H. Khalele, Huda K. Husien, Influnce of Electron Beam Charactaristics on the Electron Mirror Images of SEM , under publication, 2013
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