The Beam Current Considerations in SEM Accordance to Mirror Effect Phenomenon

• Autorzy: Al-Obaidi H. N. , Khaleel I. H.
• Języki publikacji: EN

Abstrakty

EN

A theoretical investigation have been presented to exploring the influence of electrons beam current on the electron mirror image deduced inside the scanning electron microscope (SEM). A rough mathematical expression for the electric potential that associated with electron beam is derived. The results clearly shows that the beam current could be used to enhance or conversely deteriorate the phenomena of mirror effect. So this work procedure may consider to be tool controllable of this phenomena for investigation purposes.

Słowa kluczowe

EN

scanning electron microscope; Electron Beam Current; Electron Mirror Images

• Wydawca: Przedsiębiorstwo Wydawnictw Naukowych "DARWIN"
• Czasopismo: International Letters of Chemistry, Physics and Astronomy
• Rocznik: 2013
• Tom: Vol. 10, iss. 1
• Strony: 70--75
• Opis fizyczny: Bibliogr. 14 poz., rys., tab., wykr.

Twórcy

autor

Al-Obaidi H. N.

• Physics Department, College of Education, Al-Mustansiriah University, Baghdad, Iraq

autor

Khaleel I. H.

• Physics Department, College of Education, Al-Mustansiriah University, Baghdad, Iraq

Bibliografia

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