Correlation between surface morphology and potential profile in OFETs with zone-cast TIPS-Pentacene as seen by scanning Kelvin probe microscopy

• Autorzy: Kucinska M. , Szymanski M. Z. , Frac I. , Chandezon F. , Ulanski J.

Identyfikatory

DOI

10.2478/msp-2019-0026

• Języki publikacji: EN

Abstrakty

EN

Charge-carrier transport in the channel of bottom gate, top contact organic field effect transistors with anisotropic layers of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-Pentacene) obtained by zone casting was investigated using scanning Kelvin probe microscopy combined with atomic force microscopy. The TIPS-Pentacene continuous layers consisted of thin crystals unidirectionally oriented in the channel. Devices with perpendicular and parallel charge flow in the transistor channel were prepared. It was found that irregularities in the surface morphology at the semiconductor layer in the transistor channel are correlated with the local potential profile, and that the channel resistance strongly depends on the orientation of the TIPS-Pentacene crystals.

Słowa kluczowe

EN

organic field effect transistors; scanning Kelvin probe microscopy; zone casting

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2019
• Tom: Vol. 37, No. 2
• Strony: 249--256
• Opis fizyczny: Bibliogr. 22 poz., rys.

Twórcy

autor

Kucinska M.

• Department of Molecular Physics, Lodz University of Technology, Lodz, 90-924, Poland

autor

Szymanski M. Z.

• CEA, INAC-SPRAM, Grenoble, F-38000, France

autor

Frac I.

• Department of Molecular Physics, Lodz University of Technology, Lodz, 90-924, Poland

autor

Chandezon F.

• University Grenoble Alpes, CEA, CNRS, INAC, SyMMES, F-38000 Grenoble

autor

Ulanski J.

• Department of Molecular Physics, Lodz University of Technology, Lodz, 90-924, Poland

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Uwagi

PL

Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2019).