The In-Depth Stress Distribution for 1H13 Specimen after Cutting

• Autorzy: Gadalińska E. , Wronicz W. , Malicki M.

Identyfikatory

DOI

10.1515/fas-2016-0005

• Języki publikacji: EN

Abstrakty

EN

Measuring the in-depth stress state is of vital importance for materials scientists. Strain gauges methods are capable of yielding information only about the surface stress state. Diffraction methods using synchrotron or neutron radiation, which allow totally non-destructive stress measurements inside the material, are not widely available. In this context, the best widely available method combines the X-ray diffraction stress measurements and gradual removal of the outer layer by means of electropolishing. Here, this method was applied to the specimen made of 1H13 stainless steel cut with under water on a corundum cut-off wheel. The idea was to investigate how deeply an additional stress state resulting from cutting was introduced and whether the technique of combining of X-ray diffractometry and electropolishing can be used widely for determining the stress state inside the specimen.

Słowa kluczowe

EN

in-depth stress distribution; electropolishing; diffraction methods; 1H13 stainless steel

• Wydawca: Wydawnictwa Naukowe Sieci Badawczej Łukasiewicz - Instytutu Lotnictwa
• Czasopismo: Fatigue of Aircraft Structures
• Rocznik: 2016
• Tom: Iss. 8
• Strony: 73--79
• Opis fizyczny: Bibliogr. 7 poz., rys., wykr.

Twórcy

autor

Gadalińska E.

• Institute of Aviation, Materials and Structures Research Center, Al. Krakowska 110/114, 02-256 Warszawa, Poland

autor

Wronicz W.

• Institute of Aviation, Materials and Structures Research Center, Al. Krakowska 110/114, 02-256 Warszawa, Poland

autor

Malicki M.

• Institute of Aviation, Materials and Structures Research Center, Al. Krakowska 110/114, 02-256 Warszawa, Poland

Bibliografia

• [1] Fry, A.T. (2002). Residual stress measurement: XRD depth profiling using successive material removal, NPL Report MATC(MN)34, September 2002.
• [2] Fitzpatrick, M.E., Fry, A.T., Holdway, P., Kandil, F.A., Shackleton, J. & Suominen, L. (2005). Determination of Residual Stresses by X-ray Diffraction – Issue 2, Measurement Good Practice Guide No. 52, National Physical Laboratory, Teddington, Middlesex, United Kingdom.
• [3] Sikarskie, D.L. (1967). On a series form of correction to stresses measured using X-ray diffraction, AIME Transactions, Vol. 239, pp. 577-580.
• [4] Moore, M.G. & Evans, W.P. (1958). Mathematical correction for stress in removed layers in X-ray diffraction residual stress analysis, SAE Transactions, Vol. 66.
• [5] SAE Information Report (1971). Residual stress measurement by X-ray diffraction - SAE J784a. Second edition published August 1971.
• [6] Klimanek, P. (1989), I. C. Noyan, J. B. Cohen. Residual stress - measurement by diffraction and interpretation. Springer Series on Materials Research and Engineering, edited by B. Ilschner and N. J. Grant. Springer-Verlag, New York-Berlin-Heidelberg-London-Paris-Tokyo 1987, 276 Seiten, 160 Bilder, 31 Tabellen, DM 138. -, ISBN 3-540-96378-2. Cryst. Res. Technol., 24: K37. doi:10.1002/crat.2170240228
• [7] http://www.bibusmetals.pl/fileadmin/editors/countries/bmpl/Data_sheets/Inconel_718_karta_katalogowa.pdf

Uwagi

PL

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).