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Electroluminescence of InGaN/GaN heterostructures at the reverse bias and nitrogen temperature

Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The electroluminescence spectra at reverse biases in LED InGaN/GaN heterostructures at liquid nitrogen temperatures were studied. At the reverse bias and T = 77 K, avalanche microplasmas breakdowns were observed. Electroluminescence spectra demonstrate two peaks caused by the recombination of carriers in different parts of the structure (quantum well and p-GaN layer). The temperature narrowing the half-width and the shift of electroluminescence spectra peaks inherent to microplasmas were observed.
Czasopismo
Rocznik
Strony
535--543
Opis fizyczny
Bibliogr. 21 poz., rys.
Twórcy
autor
  • V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 41 Nauki Ave, 03680 Kyiv, Ukraine
autor
  • V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 41 Nauki Ave, 03680 Kyiv, Ukraine
autor
  • V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 41 Nauki Ave, 03680 Kyiv, Ukraine
autor
  • V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 41 Nauki Ave, 03680 Kyiv, Ukraine
autor
  • V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, 41 Nauki Ave, 03680 Kyiv, Ukraine
autor
  • Poltava National Technical Yuri Kondratyuk University, 24 Pershotravnevyi Ave, 36011 Poltava, Ukraine
Bibliografia
  • [1] RESHCHIKOV M.A., MORKOÇ H., Luminescence properties of defects in GaN, Journal of Applied Physics 97(6), 2005, article 061301.
  • [2] HSIANG CHEN, YIH-MIN YEH, CHUAN HAO LIAO, CHUN WEI LIN, CHUAN-HAUR KAO, TIEN-CHANG LU, Optical characterizations and reverse-bias electroluminescence observation for reliability investigations of the InGaN light emitting diode, Microelectronic Engineering 101, 2013, pp. 42–46.
  • [3] MENEGHINI M., VACCARI S., TRIVELLIN N., DANDAN ZHU, HUMPHREYS C., BUTENDHEICH R., LEIRER C., HAHN B., MENEGHESSO G., ZANONI E., Analysis of defect-related localized emission processes in InGaN/GaN-based LEDs, IEEE Transactions on Electron Devices 59(5), 2012, pp. 1416–1422.
  • [4] MENEGHINI M., TRIVELLIN N., PAVESI M., MANFREDI M., ZEHNDER U., HAHN B., MENEGHESSO G., ZANONI E., Leakage current and reverse-bias luminescence in InGaN-based light-emitting diodes, Applied Physics Letters 95(17), 2009, article 173507.
  • [5] CAO X.A., LEBOEUF S.F., KIM K.H., SANDVIK P.M., STOKES E.B., EBONG A., WALKER D., KRETCHMER J., LIN J.Y., Jiang H.X., Investigation of radiative tunneling in GaN/InGaN single quantum well light-emitting diodes, Solid-State Electronics 46(12), 2002, pp. 2291–2294.
  • [6] KOVALEV A.N., MANYAKHIN F.I., KUDRYASHOV V.E., TURKIN A.N., YUNOVICH A.É., Impact ionization luminescence of InGaN/AlGaN/GaN p-n-heterostructures, Semiconductors 32(1), 1998, pp. 54–57.
  • [7] VELESCHUK V.P., VLASENKO A.I., VLASENKO Z.K., KISSELYUK M.P., BORSHCH V.V., Non-destructive control of critical defects and diagnostics of InGaN/GaN heterostructures in power LEDs by using their microplasma characteristics, Materials Research Express 2(5), 2015, article 055902.
  • [8] ZHANG S.K., WANG W.B., DABIRAN A.M., OSINSKY A., WOWCHAK A.M., HERTOG B., PLAUT C., CHOW P.P., GUNDRY S., TROUDT E.O., ALFANO R.R., Avalanche breakdown and breakdown luminescence of AlGaN multiquantum wells, Applied Physics Letters 87(26), 2005, article 262113.
  • [9] KIKAWA J., YOSHIDA S., ITOH Y., Electroluminescence studies under forward and reverse bias conditions of a nitride-rich GaN1–xPx SQW structure LED grown by laser-assisted metal-organic chemical vapor deposition, Solid-State Electronics 47(3), 2003, pp. 523–527.
  • [10] TI WANG, HAO WU, ZHENG WANG, CHAO CHEN, CHANG LIU, Blue light emission from the heterostructured ZnO/InGaN/GaN, Nanoscale Research Letters 8(1), 2013, article 99.
  • [11] SADAF J.R., ISRAR M.Q., KISHWAR S., NUR O., WILLANDER M., Forward- and reverse-biased electroluminescence behavior of chemically fabricated ZnO nanotubes/GaN interface, Semiconductor Science and Technology 26(7), 2011, article 075003.
  • [12] LAHBABI M., AHAITOUF A., FLIYOU M., ABARKAN E., CHARLES J.-P., BATH A., HOFFMANN A., KERNS S.E., KERNS D.V., Analysis of electroluminescence spectra of silicon and gallium arsenide p-n junctions in avalanche breakdown, Journal of Applied Physics 95(4), 2004, pp. 1822–1828.
  • [13] BOTHE K., RAMSPECK K., HINKEN D., SCHINKE C., SCHMIDT J., HERLUFSEN S., BRENDEL R., BAUER J., WAGNER J.-M., ZAKHAROV N., BREITENSTEIN O., Luminescence emission from forward- and reverse -biased multicrystalline silicon solar cells, Journal of Applied Physics 106(10), 2009, article 104510.
  • [14] TITKOV I.E., ZUBRILOV A.S., DELIMOVA L.A., MASHOVETS D.V., LINIĬCHUK I.A., GREKHOV I.V., White electroluminescence from ZnO/GaN structures, Semiconductors 41(5), 2007, pp. 564–569.
  • [15] GEORGOBIANI A.N., GRUZINTSEV A.N., VOROB’EV M.O., KAISER U., RICHTER W., KHODOS I.I., Fine structure of the edge ultraviolet luminescence of GaN:Mg films activated in a nitrogen plasma and the electroluminescence of a ZnO-GaN:Mg heterostructure based on these films, Semiconductors 35(6), 2001, pp. 695–699.
  • [16] VERGELES P.S., YAKIMOV E.B., Effect of low-energy electron irradiation on the optical properties of structures containing multiple InGaN/GaN quantum well, Semiconductors 49(2), 2015, pp. 143–148.
  • [17] HYUN JEONG, HYEON JUN JEONG, HYE MIN OH, CHANG-HEE HONG, EUN-KYUNG SUH, LERONDEL G., MUN SEOK JEONG, Carrier localization in In-rich InGaN/GaN multiple quantum wells for green light-emitting diodes, Scientific Reports 5, 2015, article 9373.
  • [18] FERDOUS M.S., WANG X., FAIRCHILD M.N., HERSEE S.D., Effect of threading defects on InGaN/GaN multiple quantum well light emitting diodes, Applied Physics Letters 91(23), 2007, article 231107.
  • [19] QIFENG SHAN, MEYAARD D.S., QI DAI, JAEHEE CHO, SCHUBERT E.F., JOONG KON SON, CHEOLSOO SONE, Transport-mechanism analysis of the reverse leakage current in GaInN light-emitting diodes, Applied Physics Letters 99(25), 2011, article 253506.
  • [20] LEVINSHTEĬN M.E., KOSTAMOVAARA J., VAINSHTEIN S., Breakdown Phenomena in Semiconductors and Semiconductor Devices, World Scientific, 2005, p. 208.
  • [21] NIKIFOROV S., SUSHKOV V., Method for testing the potential degree of degradation of light emitting diode characteristics, Solid-State Lightning, No. 3, 2011, pp. 10–13.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-6f7d2b03-1784-4abd-bb50-80a236b12b3a
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