Appointing of surface topography parameters to describe the diffuse reflective properties of selected dielectrics

• Autorzy: Majchrowski R. , Rozanski L. , Grochalski K.
• Języki publikacji: EN

Abstrakty

EN

The investigations have been performed in order to choose the specific roughness parameters, which would inform the customer about the diffuse emissive and reflective characteristics of the adhesive tapes used in the thermographic measurements. To achieve that, a series of the surface topography parameters of various adhesive tapes (i.e. objects with diffusive reflective characteristics) and various glass plates (i.e. objects with directional reflective characteristics) has been examined. For the analysis of surface topography the following parameters were selected: Sdr (the Developed Interfacial Area Ratio) and Sdq (the Root Mean Square Surface Slope). These selected parameters seem to be most suitable to describe the properties of the surface in the discussed aspect.

Słowa kluczowe

EN

thermographic measurements; surface topography; emissivity; reflection

• Wydawca: Wydawnictwo PAK
• Czasopismo: Measurement Automation Monitoring
• Rocznik: 2017
• Tom: Vol. 63, No. 3
• Strony: 78--81
• Opis fizyczny: Bibliogr. 12 poz., rys., tab., wzory

Twórcy

autor

Majchrowski R.

• Division of Metrology and Measurement Systems, Institute of Mechanical Technology, Poznan University of Technology, 5 Marii Skłodowskiej-Curie Ave., 60-965 Poznan, Poland

autor

Rozanski L.

• Division of Metrology and Measurement Systems, Institute of Mechanical Technology, Poznan University of Technology, 5 Marii Skłodowskiej-Curie Ave., 60-965 Poznan, Poland

autor

Grochalski K.

• Division of Metrology and Measurement Systems, Institute of Mechanical Technology, Poznan University of Technology, 5 Marii Skłodowskiej-Curie Ave., 60-965 Poznan, Poland

Bibliografia

• [1] Orlove G. L.: Practical thermal measurement techniques. 1982 Proceedings of the SPIE, Vol. 371, pp. 72-81.
• [2] Wałach T.: Emissivity measurements on electronic microcircuits, Measurement 41 (2008), pp. 503–515.
• [3] Maldague X.: Theory and Practice of Infrared Technology for Nondestructive Testing. John Willey & Sons, Inc., ISBN 0-471-18190-0, 2001.
• [4] Chrzanowski K.: Non-contact thermometry-Measurement errors. SPIE PL, Research and Development Treaties, Warsaw, 2000.
• [5] Chrzanowski K.: Problem of Determination of Effective Emissivity of some Materials in MIR Region. Infrared Phys. Technol., vol. 30, pp. 679-684, 1995.
• [6] Więcek B., Mey G. De.: Termowizja w podczerwieni. Podstawy i zastosowania, PAK, 2011 (in Polish).
• [7] Burakowski T.: Areologia. Podstawy teoretyczne, Instytut Technologii Eksploatacji – PIB, 2013 (in Polish).
• [8] Sala A.: Radiant Properties of Materials: Tables of Radiant Values for Black Body and Real Materials, PWN, Elsevier, 1986
• [9] ISO 25178, 2008: Geometrical product specifications - Surface texture: Areal - Part 2: Terms, definitions and surface texture parameters.
• [10] Mathia T., Zahouani H., Stout K. J., Sullivan P. J., Dong W. P., Mainsah E., Lou N.: The development of methods for characterization of roughness in three dimensions. ECSC-EEC-EAEC, Brussels-Luxembourg and Authors, 1993.
• [11] Thomas T. R.: Rough Surfaces. Imperial College Press., Second Edition,1999.
• [12] Schmit J.: High speed measurements using optical profiler. Veeco Instruments Inc., 2650 E. Elvira Road, Tucson, AZ, USA.

Uwagi

PL

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).