Tytuł artykułu
Wybrane pełne teksty z tego czasopisma
Identyfikatory
Warianty tytułu
Języki publikacji
Abstrakty
The research on the influence of modulation frequency on the properties of films synthesized using a unique pulsed power supply combined with a standard unbalanced circular magnetron was conducted in the process of pulsed magnetron sputtering (PMS). It was shown that by using different levels of modulation, the composition of plasma (measured by optical emission spectroscopy, OES) as well as film growth rate and morphology (observed with scanning electron microscope, SEM), can be changed. The impact of modulation is related to the used materials and gases and can vary significantly. It was concluded that modulation frequency can greatly influence the synthesis of materials and can be used as an additional parameter in PMS. Specific relations between modulation frequency and synthesized material require further investigation.
Wydawca
Czasopismo
Rocznik
Tom
Strony
697--703
Opis fizyczny
Bibliogr. 12 poz., rys., tab.
Twórcy
autor
- National Centre for Nuclear Research, Andrzeja Sołtana 7, 05-400 Otwock, Poland
autor
- National Centre for Nuclear Research, Andrzeja Sołtana 7, 05-400 Otwock, Poland
autor
- Faculty of Materials Science and Engineering, Warsaw University of Technology, Wołoska 141, 02-507 Warsaw, Poland
autor
- Faculty of Materials Science and Engineering, Warsaw University of Technology, Wołoska 141, 02-507 Warsaw, Poland
autor
- Faculty of Materials Science and Engineering, Warsaw University of Technology, Wołoska 141, 02-507 Warsaw, Poland
autor
- Faculty of Materials Science and Engineering, Warsaw University of Technology, Wołoska 141, 02-507 Warsaw, Poland
Bibliografia
- [1] Thornton J., J. Vac. Sci. Technol. A, 11 (1974), 666.
- [2] Christyakov R., Abraham B., Summer Bulletin, Soc. Vac. Coat., (2009), 46.
- [3] Posadowski W.M., Wiatrowski A., Dora J., Radzimski Z.J., Thin Solid Films, 516 (2008), 4478.
- [4] Wiatrowski A., Posadowski W.M., Mater. Sci.-Poland, 34 (2016), 374.
- [5] Nowakowska-Langier K., Chodun R., Minikayev R., Kurpaska Ł., Skowroński Ł., Strzelecki G.W., Okrasa S., Zdunek K., Nucl. Instrum. Meth. B, 409 (2017), 167.
- [6] Krówka K., Wiatrowski A., Posadowski W.M., Thin Solid Films, 520 (2012), 4127.
- [7] Zdunek K., Nowakowska-Langier K., Chodun R., Okrasa S., Rabiński M., Dora J., Domanowski P., Halarowicz J., J. Phys.-Conf. Ser., 564 (1) (2014), 012007.
- [8] http://www.gencoa.com/balance_and_unbalance, accessed on: 2018.07.18.
- [9] Ganesan R., Treverrow B., Murdoch B., Xie D., Ross A.E., Partridge J.G., Falconer I.S., Mcculloch D.G., Mckenzie D.R., Bilek M.M.M., J. Phys. D Appl. Phys., 49 (2016), 245201.
- [10] NIST Atomic Spectra Database Lines, https://www.nist.gov/pml/atomic-spectra-database, accessed on: 2018.07.18.
- [11] Nowakowska-Langier K., Chodun R., Minikayev R., Okrasa S., Strzelecki G.W., Wicher B., Zdunek K., Thin Solid Films, 645 (2018), 32.
- [12] http://www.semicore.com/reference/sputtering-yields-reference, accessed on:2018.07.18.
Uwagi
PL
Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2019).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-6a4a7cb6-f570-4f0a-96a1-f6304dcc13ff