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Qualitative and numerical analysis of chemical composition of selected iron alloys technique wave dispersive spectrometry (WDS) by calibration curves

Wybrane pełne teksty z tego czasopisma
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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Purpose: Purpose of the dissertation was accomplish qualitative and quantitative analysis of chemical composition of selected iron alloys using wavelength-dispersive spectroscopy (WDS) by calibration curve method. In this dissertation information about X-ray microanalysis physical basis and about X-ray detection in scanning electron microscope were presented. Design/methodology/approach: Research was execute on scanning electron microscope, on the X-ray diffraction instrument, on energy and wavelength-dispersive spectrometer. Carbon content and confidence interval at unknown steel sample were determined. Findings: Method of calibration curves allowed the designation of the carbon content of the steel samples of unknown chemical composition, depending on a reflection intensities derived from coal. Performed tests have confirmed the possibility of using this method, even in case of depositing the carbon layer. Originality/value: The paper presents qualitative and numerical analysis of chemical composition of selected iron alloys technique wave dispersive spectrometry (WDS) by calibration curves. Carbon content and confidence interval at unknown steel sample were determined.
Rocznik
Strony
20--30
Opis fizyczny
Bibliogr. 18 poz., rys., tab.
Twórcy
autor
  • Institute of Engineering Materials and Biomaterials, Silesian University of Technology, ul. Konarskiego 18a, 44-100 Gliwice, Poland
  • Institute of Engineering Materials and Biomaterials, Silesian University of Technology, ul. Konarskiego 18a, 44-100 Gliwice, Poland
autor
  • Institute of Engineering Materials and Biomaterials, Silesian University of Technology, ul. Konarskiego 18a, 44-100 Gliwice, Poland
Bibliografia
  • [1] A. Szummer (Ed.), K. Sikorski, Ł. Kaczynski, J. Paduch, K. Caretaker, Foundations of Quantitative X-Ray Microanalysis, WNT, Warsaw, 1994 (in Polish).
  • [2] Z. Bojarski, X-ray microanalyzer, Chemical analysis method in microareas, Silesia, Katowice, 1971 (in Polish).
  • [3] M. Żelechower, Introduction to X-ray microanalysis, Silesian University of Technology Publishing House, Gliwice, 2007 (in Polish).
  • [4] M. Krzysztof, Signal detection and imaging technique in a scanning electron microscope in the low vacuum range, PhD thesis, Wroclaw, 2010 (in Polish).
  • [5] B.L. Thiel, Imaging and Microanalisis in Environmental Scanning Electron Microscopy, Microchimica Acta 155 (2006) 39-44.
  • [6] A. Barbacki, Electron Microscopy, Poznan University of Technology Publishing House, Poznan, 2007 (in Polish).
  • [7] M. Terauchi, M. Koike, K. Fukushima, A. Kimura, Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes - an introduction of valence electron spectroscopy for transmission electron microscopy, Journal of Electron Microscopy 59/4 (2010) 251-261.
  • [8] D.A. Wollman, K.D. Irwin, G.C. Hilton, L.L. Dulcie, D.E. Newbury, J.M. Martins, High-resolution, energy-dispersive microcalorimeter spectrometer for X-ray microanalysis, Journal of Microscopy 188/3 (1997) 196-223.
  • [9] A. Ul-Hamid, H.M. Tawancy, A.I. Mohammed, S.S. Al-Jaroudi, N. M. Abbas, Quantitative WDS analysis using electron probe microanalyzer, Materials Characterization 56 (2006) 192-199.
  • [10] A.J. Laigo, F. Christien, R. Le Gall, F. Tancret, J. Furtado, SEM, EDS, EPMA-WDS and EBSD characterization of carbides in HP type heat resistant alloys, Materials Characterization 59 (2008) 1580-1586.
  • [11] P. Nowakowski, F. Christien, M. Allart, Y. Borjon-Piron, R. Le Gall, Measuring grain boundary segregation using Wavelength Dispersive X-ray Spectroscopy: Further developments, Surface Science 605 (2011) 848-858 (in Polish).
  • [12] K.D. Vernon-Parry, Scanning electron microscopy: an Introduction, III-Vs Review 13/4 (2000) 40-44.
  • [13] N.W.M. Ritchie, D.E. Newbury, J.M. Davis, EDS Measurements of X-ray Intensity at WDS Precision and Accuracy Using a Silicon Drift Detector, Microscopy and Microanalysis 18 (2012) 892-904.
  • [14] R.A. Autrata, Double detector system for BSE and SE imaging, Scanning 6 (1984) 174-182.
  • [15] R. Autrata, Backscattered electron imaging using single crystal scintillator detectors, Scanning Microscopy 3 (1989) 739-763.
  • [16] L.A. Dobrzanski, E. Hajduczek, Light and electron microscopy, WNT, Warsaw, 1987 (in Polish).
  • [17] D. Kaczmarek, Reconstruction of a surface image of the sample in the scanning electron microscope using backscattered electrons, Wroclaw University of Technology, Wroclaw, 1999 (in Polish).
  • [18] M. Głowacka (Ed.), The science of metals, Publishing House Gdansk University of Technical, Gdansk, 1996 (in Polish).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-65e5a0db-ad0c-4f74-b6d6-bd7d28caae00
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