A method for probing the refractive index change in photorefractive crystals

• Autorzy: Fu M. , Gao C. , Wang X. , Cui Y. , Dai S

Identyfikatory

DOI

10.5277/oa130409

• Języki publikacji: EN

Abstrakty

EN

A method for probing refractive index changes in photorefractive crystals using an interferometric technique and digital image processing was proposed. Based on equal thickness interference in LiNbO3 crystal and Fourier transform profilometry, we obtained phase value changes in interferograms induced by a photorefractive effect, and further calculated refractive index changes. The maximal values for extraordinary light (e-light) and ordinary light (o-light) are 6.6×10–4 and 1.2×10–4, respectively.

Słowa kluczowe

EN

Fourier transform profilometry; refractive index change; photorefractive effect

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2013
• Tom: Vol. 43, nr 4
• Strony: 731--737
• Opis fizyczny: Bibliogr. 10 poz., rys., wykr.

Twórcy

autor

Fu M.

• School of Physics, Shandong University, Jinan 250100, China

autor

Gao C.

• School of Physics, Shandong University, Jinan 250100, China

autor

Wang X.

• Department of Physics and Electronics, Binzhou College, Binzhou 256600, China

autor

Cui Y.

• School of Physics, Shandong University, Jinan 250100, China

autor

Dai S

• School of Physics, Shandong University, Jinan 250100, China

Bibliografia

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