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A simple model of the scanning near-field optical microscopy probe tip for electric field enhancement

Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
In this paper, we present a simple near-field probe model that is composed of an elongated ellipsoid and a finite metal truncated cone. The elongated ellipsoid has been shown to act as a protrusion or separate particle near a truncated cone apex with strong near-field enhancement under laser excitation. By controllably varying the length of the ellipsoid protrusion from the truncated cone, the truncated cone-ellipsoid probes can be adapted to the suitability of near-field probes. The effects of substrate material and excitation wavelength on the near field enhancement for different tip apexes are also discussed. In addition, we compared the properties of the truncated cone-ellipsoid probe with the widely used hemisphere conical tip by launching surface plasmon polaritons on plasmonic waveguides to prove the suitability of the truncated cone-ellipsoid probes as high performance near-field probes. The present simple model would provide a theoretical basis for the actual construction of probes.
Czasopismo
Rocznik
Strony
119--130
Opis fizyczny
Bibliogr. 40 poz., rys.
Twórcy
autor
  • Department of Applied Physics, Beihang University, Beijing 100191, China
autor
  • Department of Applied Physics, Beihang University, Beijing 100191, China
autor
  • Department of Applied Physics, Beihang University, Beijing 100191, China
autor
  • Department of Applied Physics, Beihang University, Beijing 100191, China
autor
  • Department of Applied Physics, Beihang University, Beijing 100191, China
Bibliografia
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  • [6] BEHR N., RASCHKE M.B., Optical antenna properties of scanning probe tips: plasmonic light scattering, tip–sample coupling, and near-field enhancement, The Journal of Physical Chemistry C 112(10), 2008, pp. 3766–3773.
  • [7] LIU J.C., LIU D.M., SHAO T.M., FDTD simulation on laser-induced enhancement of electric field in the near-field apertureless probe system, Laser Physics Letters 9(7), 2012, pp. 511–518.
  • [8] YOUNGKYU LEE, XIAOJING ZHANG, Designs of apertureless probe with nano-slits for near-field light localization and concentration, Optics Communications 285(16), 2012, pp. 3373–3377.
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  • [16] JANUNTS N.A., BAGHDASARYAN K.S., NERKARARYAN KH.V., HECHT B., Excitation and superfocusing of surface plasmon polaritons on a silver-coated optical fiber tip, Optics Communications 253(1–3), 2005, pp. 118–124.
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  • [34] SOBAT Z., SADEGH HASSANI S., An overview of scanning near-field optical microscopy in characterization of nano-materials, International Journal of Nano Dimension 5(3), 2014, pp. 203–212.
  • [35] BAO W., STAFFARONI M., BOKOR J., SALMERON M.B., YABLONOVITCH E., CABRINI S., WEBER-BARGIONI A., SCHUCK P.J., Plasmonic near-field probes: a comparison of the campanile geometry with other sharp tips, Optics Express 21(7), 2013, pp. 8166–8176.
  • [36] BOUHELIER A., RENGER J., BEVERSLUIS M.R., NOVOTNY L., Plasmon-coupled tip-enhanced near-field optical microscopy, Journal of Microscopy 210(3), 2003, pp. 220–224.
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  • [38] ANTOSIEWICZ T.J., WRÓBEL P., SZOPLIK T., Nanofocusing of radially polarized light with dielectric-metal-dielectric probe, Optics Express 17(11), 2009, pp. 9191–9196.
  • [39] KAZEMI-ZANJANI N., VEDRAINE S., LAGUGNÉ-LABARTHET F., Localized enhancement of electric field in tip-enhanced Raman spectroscopy using radially and linearly polarized light, Optics Express 21(21), 2013, pp. 25271–25276.
  • [40] HWANG B.S., KWON M.H., JEONGYONG KIM, Use of a near-field optical probe to locally launch surface plasmon polaritons on plasmonic waveguides: a study by the finite difference time domain method, Microscopy Research and Technique 64(5–6), 2004, pp. 453–458.
Uwagi
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-606b09b0-d200-43f3-804b-76cdae470eb7
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