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Electron optics column for a new MEMS-type transmission electron microscope

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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The concept of a miniature transmission electron microscope (TEM) on chip is presented. This idea assumes manufacturing of a silicon-glass multilayer device that contains a miniature electron gun, an electron optics column integrated with a high vacuum micropump, and a sample microchamber with a detector. In this article the field emission cathode, utilizing carbon nanotubes (CNT), and an electron optics column with Einzel lens, made of silicon, are both presented. The elements are assembled with the use of a 3D printed polymer holder and tested in a vacuum chamber. Effective emission and focusing of the electron beam have been achieved. This is the first of many elements of the miniature MEMS (Micro-Electro-Mechanical System) transmission electron microscope that must be tested before the whole working system can be manufactured.
Rocznik
Strony
133--137
Opis fizyczny
Bibliogr. 17 poz., rys., wykr.
Twórcy
autor
  • Wrocław University of Science and Technology, Faculty of Microsystem Electronics and Photonics, 11/17 Janiszewskiego St., 50-372 Wrocław
autor
  • Wrocław University of Science and Technology, Faculty of Microsystem Electronics and Photonics, 11/17 Janiszewskiego St., 50-372 Wrocław
  • Wrocław University of Science and Technology, Faculty of Microsystem Electronics and Photonics, 11/17 Janiszewskiego St., 50-372 Wrocław
autor
  • Wrocław University of Science and Technology, Faculty of Microsystem Electronics and Photonics, 11/17 Janiszewskiego St., 50-372 Wrocław
autor
  • Wrocław University of Science and Technology, Faculty of Microsystem Electronics and Photonics, 11/17 Janiszewskiego St., 50-372 Wrocław
Bibliografia
  • [1] R.J. Parmee, C.M. Collins, W.I. Milne, and M.T. Cole, “X-ray generation using carbon nanotubes”, Nano Convergence 2:1, 1‒27 (2015).
  • [2] M. Despont, U. Staufer, C. Stebler, H. Gross, and P. Vettiger, “Electron-beam microcolumn fabrication and testing”, Microelectron. Eng., 30, 69‒72 (1996).
  • [3] H. Kim, Ch. Han, and J. Kim, “Full MEMS monolithic microcolumn for wafer-level arrayal”, J. Vac. Sci. Technol. B, 22, 2912‒2916 (2004).
  • [4] R.R.A. Syms and S. Wright, “MEMS mass spectrometers: the next wave of miniaturization”, J. Micromech. Microeng., 26, 023001 (2016).
  • [5] R. Yabushita, K. Hata, H. Sato, and Y. Saito, “Development of compact field emission scanning electron microscope equipped with multiwalled carbon nanotube bundle cathode”, J. Vac. Sci. Technol. B, 25, 640‒642 (2007).
  • [6] A. Zlatkin and N. Garcia, “Low-energy (300 eV) versatile scanning electron microscope with 30 nm resolution”, Microelectron. Eng., 45, 39‒46 (1999).
  • [7] E. Kratschmer, H.S. Kim, M.G.R. Thomson, K.Y. Lee, M.L. Yu, and T.H.P. Chang, “An electronbeam microcolumn with improved resolution, beam current, and stability”, J. Vac. Sci. Technol. B, 13, 2498‒2503 (1995).
  • [8] R. Saini, Z. Jandric, I. Gory, S.A.M. Mentink, and D. Tuggle, “Assembled microelectromechanical system microcolumns for mniature scanning electron microscopes”, J. Vac. Sci. Technol. B, 24, 813‒817 (2006).
  • [9] I. Honjo, Y. Endo, and S. Goto, “Miniature electron beam column with a silicon micro field emitter”, J. Vac. Sci. Technol. B, 15, 2742‒2748 (1997).
  • [10] T. Grzebyk, A. Górecka-Drzazga, and J.A. Dziuban, “Glow-discharge ion-sorption micropump for vacuum MEMS”, Sensor. Actuat. A, 208, 113‒119 (2014).
  • [11] M. Krysztof, T. Grzebyk, A. Gorecka-Drzazga, and J. Dziuban, “A concept of fully integrated MEMS-type electron microscope”, The Technical Digest of 27th IVNC 2014, Engelberg, Switzerland, 6‒10 July 2014, 77‒78 (2014).
  • [12] R. Saini, Z. Jandric, K. Tsui, T. Udeshi, and D. Tuggle, “Manufacturable MEMS microcolumn”, Microelectron. Eng., 78‒79, 62‒72 (2005).
  • [13] Y. Shi, S. Ardanuc, and A. Lal, “Micro-einzel lens for wafer-integrated electron beam actuation”, MEMS 2013, Taipei, Taiwan, January 20‒24, 189‒192 (2013).
  • [14] T-S. Oh, D-W. Kim, S. Ahn, Y.Ch. Kim, H-S. Kim, and S.J. Ahn, “Optimization of electrostatic lens systems for low-energy scanning microcolumn applications”, J. Vac. Sci. Technol. A, 26, 1443‒1449 (2008).
  • [15] R.R.A. Syms, L. Michelutti, and M.M. Ahmad, “Two-dimensional microfabricated electrostatic einzel lens”, Sensor. Actuat. A, 107, 285‒295 (2003).
  • [16] M.G.R. Thomson and T.H.P. Chang, “Lens and deflector design for microcolumns”, J. Vac. Sci. Technol. B, 13, 2445‒2449 (1995).
  • [17] H. Weigand, et al., “Microcolumn design for a large scan field and pixel number”, J. Vac. Sci. Technol. B, 27, 2542‒2546 (2009).
Uwagi
PL
Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2018).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-5d11654e-b913-418b-b624-5e084616a141
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