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Brain abnormality detection using template matching

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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Magnetic resonance imaging (MRI) is a widely used imaging modality to evaluate brain disorders. MRI generates huge volumes of data, which consist of a sequence of scans taken at different instances of time. As the presence of brain disorders has to be evaluated on all magnetic resonance (MR) sequences, manual brain disorder detection becomes a tedious process and is prone to inter- and intra-rater errors. A technique for detecting abnormalities in brain MRI using template matching is proposed. Bias filed correction is performed on volumetric scans using N4ITK filter, followed by volumetric registration. Normalized cross-correlation template matching is used for image registration taking into account, the rotation and scaling operations. A template of abnormality is selected which is then matched in the volumetric scans, if found, the corresponding image is retrieved. Post-processing of the retrieved images is performed by the thresholding operation; the coordinates and area of the abnormality are reported. The experiments are carried out on the glioma dataset obtained from Brain Tumor Segmentation Challenge 2013 database (BRATS 2013). Glioma dataset consisted of MR scans of 30 real glioma patients and 50 simulated glioma patients. NVIDIA Compute Unified Device Architecture framework is employed in this paper, and it is found that the detection speed using graphics processing unit is almost four times faster than using only central processing unit. The average Dice and Jaccard coefficients for a wide range of trials are found to be 0.91 and 0.83, respectively.
Rocznik
Strony
art. no. 20180029
Opis fizyczny
Bibliogr. 57 poz., rys., tab.
Twórcy
  • Department of Electrical and Electronics Engineering, BITS Pilani, K.K. Birla Goa Campus, Goa, India
autor
  • Department of Electrical and Electronics Engineering, BITS Pilani, K.K. Birla Goa Campus, Goa, India
autor
  • Department of Electrical and Electronics Engineering, BITS Pilani, K.K. Birla Goa Campus, Goa, India
autor
  • Department of Electrical and Electronics Engineering, BITS Pilani, K.K. Birla Goa Campus, Goa, India
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Uwagi
Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2019).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-5ca1baf0-ae7b-4c86-a428-de28817a86eb
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