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Tytuł artykułu

Model of bus electrical system failure process

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Treść / Zawartość
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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The lifetime distribution is important in reliability studies. There are many situations in lifetime testing, where an item (technical object) fails instantaneously and hence the observed lifetime is reported as a small real positive number. Motivated by reliability applications, we derive the branching Poisson process and its property. We prove that the branching Poisson process is adequate model for the failure process of the bus electrical system. The method is illustrated by two numerical examples. In the second example, we derive the times between the failures of a bus electrical system.
Rocznik
Strony
23--31
Opis fizyczny
Bibliogr. 21 poz., rys., wykr.
Twórcy
autor
  • University of Technology and Life Science in Bydgoszcz Faculty of Management Science Fordonska 430 st, 85-789 Bydgoszcz, Poland
Bibliografia
  • [1] Aarset, M.V., How to identity to bathtub hazard rate, IEEE Transactions on Reliability, vol. 36, pp.106-108, 1987.
  • [2] Aitchison, I., On the distribution of a positive random variable having a discrete probability mass at origin, Journal of the American Statistical Associations, vol. 50, pp. 901-908, 1955.
  • [3] Barlow, R.E. and Campo, R., Total time on test processes and application to failure data analysis, Reliability and Fault Tree Analysis eds. Barlow R.E., Fussel J. and Singpurwalla N.D., SIAM Philadelphia pp. 451-491, 1975.
  • [4] Bartlett, M. S., The spectral analysis of point processes, Journal Royal Statistical Society, Series B 25, pp. 264-296, 1963.
  • [5] Cox, D.R. and Lewis, P.A.W., The Statistical Analysis of Series of Events, Methuen, NewYork, John Wiley, 1966.
  • [6] Deshapande, J. V. and Kochar, S.C., Aspects in positive ageing, Journal of Applied Probability, 23, pp. 748-758, 1986.
  • [7] Ghai, G.L. and Mi, J., Mean residual life and its association with failure rate, IEEE Transactions on Reliability, vol. 48, No. 3, pp. 262-266, 1999.
  • [8] Guess, F. and Proschan, F., Mean Residual Life: Theory and Applications, Handbook of Statistics, Editors: Krishnaiah, P.R. and Rao, C.R., Elsevier Science Publishers, Amsterdam, vol. 7, pp. 215-224, 1988.
  • [9] Gupta, R.C., On the monotonic properties of residual variance and their applications in reliability, Journal of Statistical Planning and Inference, vol.16, pp. 329-335, 1987.
  • [10] Hall, W.J. and Wellner, J.A., Mean residual life, Statistics and Related Topics, Eds. Csorgo J.N., Rao J.N.K. and Saleh A.K. Md, E., North Holland, Amsterdam, pp.169-184, 1981.
  • [11] Jayade, V. P. and Parasad, M. S., Estimations of parameters of mixed failure time distribution, Communications Statistics, Theory and Method, vol.19, pp. 4667-4677, 1996.
  • [12] Kale, B. K. and Muralidharan, K., Optimal estimating equations in mixture distributions accommodating instantaneous or early failures, Journal Indian Statistical Associations, vol. 38, pp.317-329, 2000.
  • [13] Kleyle, R.M. and Dahiyam R.L., Estimation of parameters of mixed failure time distribution from censored data, Communications Statistics, Theory and Method, vol.4, pp. 873-882, 1975.
  • [14] Knopik, L., Mixture of distributions as a lifetime distribution of a technical object, Scientific Problems of Machines Operation and Maintenance, vol.45, 2(165), pp. 53-60, 2010.
  • [15] Knopik, L., Model for instantaneous failures, Scientific Problems of Machines Operation and Maintenance vol. 46, 2(166), pp. 37-48, 2011.
  • [16] Knopik, L., Statistical analysis of failures, Journal of Polish CIMAC, diagnosis, reliability and safety, vol. 7, No. 2, pp. 91-96, 2012.
  • [17] Lewis, P.A.W., A branching Poisson process model for the analysis of computer failure patterns, Journal Royal Statistical Society, B 26, pp. 398-456, 1963.
  • [18] Muralidharan, K., Test for mixing proportion in mixture of a degenerate and exponential distributions, Journal Indian Statistical Associations, vol. 37, pp.105-119, 1999.
  • [19] Muralidharan, K., The UMVUE and Bayes estimate of reliability of mixed failure time distribution, Communications Statistics, Simulation Computer, vol. 29, No. 2, pp. 603-158, 2000.
  • [20] Muralidharan, K. and Kale B.K., Modified gamma distribution with singularity at zero, Communications Statistics, Simulation Computer, vol. 31, No1, pp.143-158, 2002.
  • [21] Muralidharan, K. and Lathika, P., Analysis of instantaneous and early failures in Weibull distribution, Metrika vol. 64, pp.305-316, 2006.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-5c69d050-acb7-4691-9e43-5f49711aed0e
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