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Finite Element Modelling of Atomic Force Microscope Cantilever beams with Uncertainty in Material and Dimensional Parameters

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Wybrane pełne teksty z tego czasopisma
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The stiffness and the natural frequencies of a rectangular and a V-shaped micro-cantilever beams used in Atomic Force Microscope (AFM) were analysed using the Finite Element (FE) method. A determinate analysis in the material and dimensional parameters was first carried out to compare with published analytical and experimental results. Uncertainties in the beams’ parameters such as the material properties and dimensions due to the fabrication process were then modelled using a statistic FE analysis. It is found that for the rectangular micro-beam, a ±5% change in the value of the parameters could result in 3 to 8-folds (up to more than 45%) errors in the stiffness or the 1st natural frequency of the cantilever. Such big uncertainties need to be considered in the design and calibration of AFM to ensure the measurement accuracy at the micron and nano scales. In addition, a sensitivity analysis was carried out for the influence of the studied parameters. The finding provides useful guidelines on the design of micro-cantilevers used in the AFM technology.
Rocznik
Strony
403–--421
Opis fizyczny
Bibliogr. 27 poz., rys., tab., wykr.
Twórcy
autor
  • School of Engineering and Design, Brunel University UK
autor
  • School of Mechanical Engineering, Southwest Jiaotong University P. R. China
autor
  • National Engineering School of Metz ENIM Laboratory of Mechanics, Biomechanics, Polymers and Structures – LaBPS, EA 4632 1 route d’Ars Laquenexy, CS 65820 57078 METZ Cedex 3, France
autor
  • School of Engineering and Design, Brunel University UK
Bibliografia
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  • 7. Cleveland J.P., Manne S., Bocek D., Hansma P.K., A nondestructive method for determining the stiffness of cantilevers for scanning force microscopy, Review of Science Instruments, 64, 2, 403–405, 1993.
  • 8. Gibson C.T., Private communication, Department of Physics and Astronomy, University of Leeds.
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  • 11. Albrecht T.R., Akamine S., Carver T.E., Quate C.F., Microfabrication of cantilever styli for the atomic force microscope, Journal of Vacuum Science & Technology A, 8, 4, 3386–3396, 1990.
  • 12. Butt H.J. et al., Scan speed limit in atomic force microscopy, Journal of Microscopy, 169, 1, 75–84, 1993.
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  • 14. Sader J.E., Parallel beam approximation for V-shaped atomic force microscope cantilevers, Review of Science Instruments, 66, 9, 4583–4587, 1995.
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  • 16. Olympus Optical Corporation, Tokyo, Japan.
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  • 18. Chen G.Y., Warmack R.J., Thundat T., Allison D.P., Huang A., Resonance response of scanning force microscope cantilevers, Review of Scientific Instruments, 65, 8, 2532–2537, 1994.
  • 19. Ashby M.F., Materials selection in mechanical design, Cambridge University Press, 2005, ISBN 0-7506-4357-9.
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  • 22. Mottershead J.E., Link M., Friswell M.I., The sensitivity method in finite element model updating: A tutorial, Mechanical Systems and Signal Processing, 25, 10, 2275–2296, 2011.
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  • 24. Pajot J.M., Maute K., Analytical sensitivity analysis of geometrically nonlinear structures based on the co-rotational finite element method, Finite Elements in Analysis and Design, 42, 6, 900–913, 2006.
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  • 27. Liu W., Design of Experiments, Tsinghua University Press, 2011.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-59d67e01-c942-42a9-8620-e154085bc369
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