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Theoretical study of the effect of probe shape on adhesion force between probe and substrate in atomic force microscope experiment

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Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The quantitative description of adhesion force dependence on the probe shapes are of importance in many scientific and industrial fields. In order to elucidate how the adhesion force varied with the probe shape in atomic force microscope manipulation experiment, we performed a theoretical study of the influences of the probe shape (the sphere and parabolic probe) on the adhesion force at different humidity. We found that the combined action of the triple point and the Kelvin radius guiding the trend of the adhesion force, and these two fundamental parameters are closely related to the probe shape. Whilst, the theoretical results demonstrate that the adhesion force is in good agreement with the experiment data if the van der Waals force is taken into account.
Rocznik
Strony
235--241
Opis fizyczny
Bibliogr. 27 poz., rys.
Twórcy
autor
  • College of Physics Science and Technology, Guangxi Normal University, Guilin, China
autor
  • College of Physics Science and Technology, Guangxi Normal University, Guilin, China
autor
  • College of Physics Science and Technology, Guangxi Normal University, Guilin, China
Bibliografia
  • 1. Arai F., Andou D., Fukuda T., 1996, Adhesion forces reduction for micro manipulation based on micro physics, Procedings of IEEE 9th Annual International Workshop on Micro Electro Mechanical Systems, 354-359
  • 2. Aveyard R., Clint J.H., Paunov V.N., Nees D., 1999, Capillary condensation of vapours between two solid surfaces:effects of line tension and surface forces, Physical Chemistry Chemical Physics, 1, 155-163
  • 3. Binnig G., Quate C.F., 1994, Atomic force microscope, Physical Review Letters, 56, 930-933
  • 4. Butt H.J., Kappl M., 2009, Normal capillary forces, Advances in Colloid and Interface Science, 146, 48-60
  • 5. Chen S.C., Lin J.F., 2008, Detailed modeling of the adhesion force between an AFM tip and a smooth flat surface under different humidity levels, Journal of Micromechanics and Microengineering, 18, 115006-115013
  • 6. Chen S.H., Soh A.K., 2008, The capillary force in micro and nano indentation with different indenter shapes, International journal of Solids and Structures, 45, 3122-3137
  • 7. Christenson H.K., 1988, Adhesion between surfaces in undersaturated vapors- a reexamination of the influence of meniscus curvature and surface forces, Journal of Colloid Interface Science, 121, 1, 170-178
  • 8. Eastman T., Zhu D.M., 1996, Adhesion forces between surface modified AFM tips and a mica surface, Langmuir, 12, 111, 2859-2862
  • 9. Fisher R.A., 1926, On the capillary forces in an ideal soil; correction of formulae given by W.B. Haines, Journal of Agricultural Science, 16, 492-505
  • 10. Jang J., Ratner M.A., Schatz G.C., 2006, Atomic-scale roughness effect on capillary force in atomic force microscopy, Journal of Physics Chemstry B, 110, 659-662
  • 11. Jones R., Pollock H.M., Cleaver J.A.S., Hodges C.S., 2002, Adhesion forces between glass and silicon surfaces in air studied by AFM: Effects of relative humidity, particle size, roughness, and surface treatment, Langmuir, 18, 21, 8045-8055
  • 12. Junno T., Deppert K., Montelius L., Samuelson L., 1995, Controlled manipulation of nanoparticles with an atomic force microscope, Applied Physics Letters, 66, 26, 3627-3629
  • 13. Lazzer A.D., Dreyer M., Rath H.J., 1999, Particle-surface capillary forces, Langmuir, 15, 4551-4559
  • 14. Lennart B., 1997, Hamaker constants of inorganic materials, Advances in Colloid and Interface Science, 18, 125-169
  • 15. Li Q., Rudolph V., Peukert W., 2006, London-van der Waals adhesiveness of rough particles, Powder Technology, 161, 248-255
  • 16. Paajanen M., Katainen J., Pakarinen O.H., Foster A.S., 2006, Experiment humidity dependency of small particle adhesion on silica and titania, Journal of Colloid and Interface Science, 304, 518-523
  • 17. Piner R.D., Zhu J., Xu F., Hong S.H., Mirkin C.A., 1999, “Dip-Pen” nanolithography, Science, 283, 661-663
  • 18. Quyang Q., Ishida K., Okada K., 2001, Investigation of micro adhesion by atomic force microscopy, Applied Surface Science, 169, 644-648
  • 19. Sedin D.L., Rowlen K.L., 2000, Adhesion forces measured by atomic force microscopy in humid air, Analytical Chemistry, 72910, 2183-2189
  • 20. Tabrizi M.F., Kappl M., Butt H.J., 2008, Influence of humidity on adhesion: an atomic force microscope study, Journal of Adhesion Science and Technology, 22, 181-203
  • 21. Tabrizi M.F., Kappl M., Cheng Y., Gutmann J., Butt H.J., 2006, On the adhesion between fine particles and nancontacts: An atomic force microscope study, Langmuir, 22, 2171-2184
  • 22. Thomas R.C., Houston J.E., Crooks R.M., Kim T.S., Michalske T.A., 1995, Probing adhesion forces at the molecular scale, Journal of the American Chemical Society, 117, 13, 3830-3834
  • 23. Thundat T., Zheng X.Y., Chen G.Y., Sharp S.L., Warmack R.J., Schowalter L.J., 1993a, Characterization of atomic force microscope tips by adhesion force measurements, Applied Physics Letters, 63, 15, 2150-2152
  • 24. Thundat T., Zheng X.Y., Chen G.Y., Warmack R.J., 1993b, Role of relative humidity in atomic force microscopy imaging, Surface Science Letters, 294, 939-943
  • 25. Werf V.D., Putman K.O., Constant A.J., De G., Bart G., Greve J., 1994, Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy, Applied Physics Letters, 65, 9, 1195-1197
  • 26. Xiao X., Qian L., 1999, Investigation of humidity-dependent capillary force, Langmuir, 16, 21, 8153-8158
  • 27. Yang L., Tu Y.S., Fang H.P., 2010, Modeling the rupture of a capillary liquid bridge between a sphere and plane, Journal of Soft Matter, 6, 6178-6182
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-54cbf2ea-1d85-4bf5-81a8-9c266c67406a
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