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Tytuł artykułu

Investigation of dielectric properties of heterostructures based on ZnO structures

Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The voltage and frequency dependence of dielectric constant є′, dielectric loss є″, electrical modulus M″, M′, loss tangent tanδ and AC electrical conductivity σAC of p-Si/ZnO/PMMA/Al, p-Si/ZnO/Al and p-Si/PMMA/Al structures have been investigated by means of experimental G-V and C-V measurements at 30 kHz, 100kHz, 500 kHz and 1 MHz in this work. While the values of є′, є″, tanδ and σAC decreased, the values of M′ and M″ increased for these structures when frequency was increased and those of p-Si/ZnO/Al and p-Si/PMMA/Al were comparable with those of p-Si/ZnO/PMMA/Al. The obtained results showed that the values of p-Si/ZnO/PMMA/Al structure were lower than the values of p-Si/ZnO/Al and p-Si/PMMA/Al.
Wydawca
Rocznik
Strony
885--892
Opis fizyczny
Bibliogr. 31 poz., rys.
Twórcy
autor
  • Balıkesir University, Faculty of Engineering Department of Electric and Electronic Engineering, 10145, Balıkesir, Turkey
autor
  • Gazi University, Faculty of Science, Department of Physics, 06500 Ankara, Turkey
autor
  • Gazi University, Graduate School of Natural and Applied Science, Department of Advanced Technology, 06500 Ankara, Turkey
  • Izmir Democracy University, Faculty of Engineering, Department of Biomedical Engineering, 35140 Izmir, Turkey
autor
  • Gazi University, Graduate School of Natural and Applied Science, Department of Advanced Technology, 06500 Ankara, Turkey
Bibliografia
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Uwagi
PL
Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2018).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-52cadb8f-313e-4b05-b5ac-f279dc2f9c25
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