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Near electromagnetic field measurement of microprocessor

Wybrane pełne teksty z tego czasopisma
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Warianty tytułu
PL
Pomiary pola elektromagnetycznego mikroprocesora w bliskiej odległości
Języki publikacji
EN
Abstrakty
EN
The article describe systematically the electromagnetic (EM) side channels sources and electromagnetic field of the microprocessor and is focused on the best way how to measure the near electromagnetic field of microprocessor. It was suggested and realized several electromagnetic probes and it was performed the measurement regarded to the theoretical background on the testbed with cryptographic module (microprocessor) performed the Advanced Encryption Standard (AES). On the measured waveforms of the electromagnetic emission was studied the influence of probe construction namely two parameters wire diameter and number of turns. In following measurement was studied how induced voltage depending on the distance of measuring coil to microprocessor and the last measurement dealt with position of probe and microchip.
PL
W artykule przedstawiono zagadnienie emisji pola elektromagnetycznego przez mikroprocesor i zawartych w nim informacji o stanie układu. Korzystając z platformy mikroprocesorowej, zaimplementowano AES i dokonano pomiarów sondami cewkowymi, badając zależność indukowanego napięcia od parametrów sondy (grubość drutu, ilość zwojów).
Rocznik
Strony
203--207
Opis fizyczny
Bibliogr. 13 poz., il., schem., tab., wykr.
Twórcy
  • Department of Telecommunications, Faculty of Electrical Engineering and Comunication, Brno University of Technology, Purkynova 118, 612 00 Brno, Czech Republic
autor
  • Department of Telecommunications, Faculty of Electrical Engineering and Comunication, Brno University of Technology, Purkynova 118, 612 00 Brno, Czech Republic
autor
  • Department of Telecommunications, Faculty of Electrical Engineering and Comunication, Brno University of Technology, Purkynova 118, 612 00 Brno, Czech Republic
autor
  • Department of Garden and Open Space Design, Faculty of Landscape Architecture, Corvinus University of Budapest
Bibliografia
  • [1] Agrawal D., Archambeault B., Rao J., Rohatgi P.: The EM Side Channel(s), 2003, pp. 29–45.
  • [2] Alioto M., Giancane L., Scotti G., Trifiletti A.: Leakage power analysis attacks: A novel class of attacks to nanometer cryptographic circuits, Circuits and Systems I: Regular Papers, IEEE Transactions on, vol. 57, no. 2, pp. 355 –367, feb. 2010.
  • [3] Koç Ç. K., Rothatgi P., Schindler W., Walter C. D.: Cryptographic Engineering, 2009.
  • [4] Eck W. V., Laborato N.: Electromagnetic radiation from video display units: An eavesdropping risk? Computers & Security, vol. 4, pp. 269–286, 1985.
  • [5] Gandolfi K., Mourtel C., Olivier F.: Electromagnetic analysis: Concrete results, in CHES ’01: Proceedings of the Third International Workshop on Cryptographic Hardware and Embedded Systems. London, UK: Springer-Verlag, 2001, pp. 251–261.
  • [6] Gandolfi K., Naccache D., Paar C., Mourtel C., Olivier F.: Electromagnetic analysis: Concrete results, 2001.
  • [7] Kuhn M. G., Anderson R. J.: Soft tempest: Hidden data transmission using electromagnetic emanations, in Proc. 2ndWorkshop on Information Hiding. Springer-Verlag, 1998, pp. 124–142.
  • [8] Martinasek Z., Macha T., Raso O., Martinasek J., Silhavy P.: Optimization of differential power analysis, PRZEGLAD ELEKTROTECHNICZNY, vol. 87, no. 12, pp. 140 – 144, 2011. [Online]. Available: http://pe.org.pl/articles/2011/12a/28.pdf
  • [9] Martinasek Z., Macha T., Stancikk P.: Power side channel information measurement, in Research in telecommunication technologies RTT2010, September 2010.
  • [10] Martinasek Z., Petrik T., Stancik P.: Conditions affecting the measurement of power analysis, in Research in telecommunication technologies RTT2011, September 2011.
  • [11] Peeters E., Standaert F. X., Quisquater J. J.: Power and electromagnetic analysis: Improved model, consequences and comparisons, Integration, the VLSI Journal, vol. 40, no. 1, pp. 52 – 60, 2007, embedded Cryptographic Hardware.
  • [12] Quisquater J. J., Samyde D.: Electromagnetic analysis (ema): Measures and counter-measures for smart cards, in Smart Card Programming and Security, ser. Lecture Notes in Computer Science, I. Attali and T. Jensen, Eds. Springer Berlin / Heidelberg, 2001, vol. 2140, pp. 200–210.
  • [13] Struif B.: Use of biometrics for user verification in electronic signature smartcards, in Smart Card Programming and Security, I. Attali and T. Jensen, Eds., no. 2140, Berlin, 2001. [Online]. Available: 2140/21400220.htm
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-5097fdbd-4a08-4610-a2d7-422ff6d0ddbb
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