The heat transferring in the pulse irradiated crystals with non-linear heat parameters

• Autorzy: Monastyrskii L. , Broda A.
• Języki publikacji: EN

Abstrakty

EN

The processes of heat transfer in the pulse irradiated crystal with non-linear heat parameters was studied. The implicit numerical method applied. It has been showen, that the non-linearity of heat parameters essentially changes conditions of heating and cooling to a crystal. Time evolution of heat field in depth of crystals in different condition of pulse irradiation was investigated.

Słowa kluczowe

EN

irradiated crystals; heat transfer; numerical method

PL

kryształy; wymiana ciepła; metoda numeryczna

• Wydawca: Wydawnictwo Wyższej Szkoły Pedagogicznej w Częstochowie
• Czasopismo: Prace Naukowe. Chemia / Wyższa Szkoła Pedagogiczna w Częstochowie
• Rocznik: 2001
• Tom: Vol. 5
• Strony: 161--169
• Opis fizyczny: Bibliogr. 5 poz., rys.

Twórcy

autor

Monastyrskii L.

• Ivan Franko L'viv National University, physical department, 50 Dragomanov St., L'viv, Ukraine

autor

Broda A.

• Ivan Franko L'viv National University, physical department, 50 Dragomanov St., L'viv, Ukraine

Bibliografia

• [1] L. Monastyrskii, I. Olenych, P. Parandii, Numerical modeling of the pulse heat-transfer and impurities diffusion under mechanical stresses in semiconductor crystals II Journal of Crystal Growth, 0 (2001) p.1-4.
• [2] Monastyrskii L. Mass- and heat transferring in inhomogeneous semiconductor structures on a cadmium-mercury-telluride and silicon based: Preprint.-K.: ICДO, 1993. -60p. (in Ukrainian).
• [3] L. Arutiunyan, V. Bogomolov, I.Yezhovsky, I. Mukha, X. Miserek Exotic behavior of heat conduction nanocompose. Crystalline NaCI in fallen //FTT, T.40, No 2,1998-p.379-380 (in Russian).
• [4] V. Bogomolov, I. Yezhovsky, I. Mukha, X. Miserek Heat conduction of three-dimensional regular frames of a crystalline selenium, gated in for a pore of a synthetic opal // FTT, T.40,, No 3, 1998-p.573-576 (inRussian).
• [5] R. Vengrenovych, Yu. Hudyma Kinetic Optical Heat Break-down of the Thin Semiconductor Film // FTT, T.43, No 7, 2001-p.1171-1175 (in Russian).