Topological derivative method for electrical impedance tomography problems

• Autorzy: Ferreira A. D. , Novotny A. A. , Sokołowski J.

Identyfikatory

DOI

10.5604/20830157.1201308

Warianty tytułu

PL

Zastosowanie metody pochodnej topologicznej w elektrycznej tomografii impedancyjnej

• Języki publikacji: EN

Abstrakty

EN

In the field of shape and topology optimization the new concept is the topological derivative of a given shape functional. The asymptotic analysis is applied in order to determine the topological derivative of shape functionals for elliptic problems. The topological derivative (TD) is a tool to measure the influence on the specific shape functional of insertion of small defect into a geometrical domain for the elliptic boundary value problem (BVP) under considerations. The domain with the small defect stands for perturbed domain by topological variations. This means that given the topological derivative, we have in hand the first order approximation with respect to the small parameter which governs the volume of the defect for the shape functional evaluated in the perturbed domain. TD is a function defined in the original (unperturbed) domain which can be evaluated from the knowledge of solutions to BVP in such a domain. This means that we can evaluate TD by solving only the BVP in the intact domain. One can consider the first and the second order topological derivatives as well, which furnish the approximation of the shape functional with better precision compared to the first order TD expansion in perturbed domain. In this work the topological derivative is applied in the context of Electrical Impedance Tomography (EIT). In particular, we are interested in reconstructing a number of anomalies embedded within a medium subject to a set of current fluxes, from measurements of the corresponding electrical potentials on its boundary. The basic idea consists in minimize a functional measuring the misfit between the boundary measurements and the electrical potentials obtained from the model with respect to a set of ball-shaped anomalies. The first and second order topological derivatives are used, leading to a non-iterative second order reconstruction algorithm. Finally, a numerical experiment is presented, showing that the resulting reconstruction algorithm is very robust with respect to noisy data.

PL

W dziedzinie optymalizacji kształtu i topologii zaproponowano nową koncepcję pochodnej topologicznej danego funkcjonału kształtu. Zastosowano asymptotyczną analizę w celu określenia pochodnej topologicznej funkcjonału kształtu dla zagadnień eliptycznych. Pochodna Topologiczna – PT (ang. the topological derivative – TD) jest miarą wpływu wtrącenia w postaci małego defektu na funkcjonał kształtu w badanym obszarze dla eliptycznego zagadnienia brzegowego. Obszar z małym defektem traktowany jest jako obszar zaburzony przez zmiany topologii. Oznacza to, że dana pochodna topologiczna stanowi aproksymację pierwszego rzędu ze względu na mały parametr, który określa objętość defektu dla obliczanego funkcjonału kształtu w zaburzonym obszarze. PT jest funkcją zdefiniowaną w obszarze niezaburzonym, który może być wyznaczony na podstawie znajomości rozwiązania zagadnienia brzegowego w tym (niezaburzonym) obszarze. Oznacza to że PT może być wyznaczona poprzez rozwiązanie zagadnienia brzegowego w obszarze niezaburzonym. Można rozważyć pierwszego jak również drugiego rzędu pochodną topologiczną, zapewniającą aproksymację funkcjonału kształtu ze znacznie lepszą precyzją w porównaniu do PT pierwszego rzędu rozwinięcia w obszarze zaburzonym. W niniejszej pracy PT jest zastosowana w kontek- ście Elektrycznej Tomografii Impedancyjnej (ETI). W szczególności jesteśmy zainteresowani w rekonstrukcji pewnej liczby anomalii wewnątrz obszaru, na podstawie pomiarów potencjału na brzegu rozpatrywanego obszaru. Podstawowa idea zawarta jest w minimalizacji funkcjonału, będącego miarą niedopasowania między pomiarami potencjału na brzegu obszaru a potencjałem elektrycznym uzyskanym na podstawie modelu matematycznego uwzględniającego zbiór anomalii o kształcie kuli. Zastosowanie pierwszego i drugiego rzędu pochodnej topologicznej prowadzi do nieiteracyjnego algorytmu rekonstrukcyjnego drugiego rzędu. W zakończeniu artykułu przedstawiono eksperyment numeryczny, wykazujący, że zaproponowany algorytm obrazowania jest bardzo odporny na zaszumione dane pomiarowe.

Słowa kluczowe

EN

electrical impedance tomography; inverse problems; topological derivatives

PL

tomografia impedancyjna; zagadnienia odwrotne; pochodna topologiczna

• Wydawca: Wydawnictwo Politechniki Lubelskiej
• Czasopismo: Informatyka, Automatyka, Pomiary w Gospodarce i Ochronie Środowiska
• Rocznik: 2016
• Tom: nr 2
• Strony: 4--8
• Opis fizyczny: Bibliogr. 60 poz., rys.

Twórcy

autor

Ferreira A. D.

• Laboratório Nacional de Computação Científica LNCC/MCT, Coordenação de Matemática Aplicada e Computacional

autor

Novotny A. A.

• Laboratório Nacional de Computação Científica LNCC/MCT, Coordenação de Matemática Aplicada e Computacional

autor

Sokołowski J.

• Université de Lorraine, CNRS, INRIA, Institute Élie Cartan Nancy

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Uwagi

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę.