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Extension of the one-dimensional Stoney algorithm to a two-dimensional case

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EN
Abstrakty
EN
This article presents the extension of the one-dimensional Stoney algorithm to a two-dimensional case. The proposed extension consists in modifying the method of curvature estimation. The surface profile of the wafer before deposition of the thin film and after its deposition was locally approximated by the quadric. From this quadric, a quadratic form and the first degree surface were separated. An eigenproblem was solved for the matrix of this quadratic form. From eigenvectors a new coordinate system was created in which a new formula of the quadric was found. In this new coordinate system, the two-dimensional problem of estimating thecurvaturetensorhasbeensolvedbysolvingtwoindependentone-dimensional problems of curvature estimation. Returning to the primary coordinate system, in this primary system, a solution to the two-dimensional problem was obtained. The article proposes five versions of the two-dimensional Stoney algorithm, with diverse complexity and accuracy. The recommendation for the version of the algorithm that could be practically used was also presented.
Rocznik
Tom
Strony
41--66
Opis fizyczny
Bibliogr. 9 poz., tab., wykr.
Twórcy
  • Warsaw School of Computer Science
Bibliografia
  • [1] A. Piotrowska et al., “Raport z działalności Zakładu Technologii Struktur Półprzewodnikowych dla Fotoniki,” Institute of Electron Technology, Warsaw, Poland, Tech. Rep., 2006, Access: July 12, 2019. [Online]. Available: http://www2.ite.waw.pl/docs/pl/raporty/2006 Z03.pdf
  • [2] G. G. Stoney, “The tension of metallic films deposited by electrolysis,” Proceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, vol. 82, no. 553, pp. 172-175, 1909.
  • [3] M. R. Ardigo, M. Ahmed, and A. Besnard, “Stoney formula: Investigation of curvature measurements by optical profilometer,” Advanced Materials Research, vol. 996, no. IX, pp. 361-366, 2014. [Online]. Available: https://hal.archives-ouvertes.fr/hal-01058720
  • [4] L. J. Van Vliet and P. W. Verbeek, “Curvature and bending energy in digitized 2D and 3D images,” in SCIA’93, Proceedings of the 8th Scandinavian Conference on Image Analysis, vol. 2, 1993, pp. 1403-1403, Access: July 12, 2019. [Online]. Available: https://repository.tudelft.nl/islandora/object/uuid: 4520f014-2beb-4ce5-a071-395b6fa9fc42/datastream/OBJ/download
  • [5] J. F. Nye, Physical properties of crystals. Oxford: Clarendon Press, 1957.
  • [6] B. Groshong, G. Bilbro,and W. Snyder, “Fittinga Quadratic Surface toThree Dimensional Data,” Center for Communications and Signal Processing, Electrical and Computer Engineering Department North Carolina State University, Tech. Rep., 1989, Access: July 12, 2019. [Online]. Available: https://repository.lib.ncsu.edu/bitstream/handle/1840.4/ 1311/CCSP 1989 17.pdf
  • [7] I. N. Bronsztejn, K. A. Siemiendiajew, G. Musiol, and H. Mühlig, Modern compendium of mathematics. Warszawa: PWN, 2004.
  • [8] K. Manczak, Metody identyfikacji wielowymiarowych obiektów sterowania. Warszawa: WNT, 1971.
  • [9] Z. Gniazdowski, “New interpretation of principal components analysis,” Zeszyty Naukowe WWSI, vol. 11, no. 16, pp. 43-65, 2017.
Uwagi
Opracowanie rekordu ze środków MNiSW, umowa Nr 461252 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2020).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-4da7d981-0e09-498b-8daa-c7c5713d6c1f
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