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Fabrication and properties of zinc oxide thin film prepared by sol-gel dip coating method

Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
ZnO thin films were deposited on a glass substrate by dip coating technique using a solution of zinc acetate, ethanol and distilled water. Optical constants, such as refractive index n and extinction coefficient k, were determined from transmittance spectrum in the ultraviolet-visible-near infrared (UV-Vis-NIR) regions using envelope methods. The films were found to exhibit high transmittance, low absorbance and low reflectance in the visible regions. Absorption coefficient µ, and the thickness of the film t were calculated from interference of transmittance spectra. The direct optical band gap of the films was in the range of 3.98 to 3.54 eV and the thickness of the films was evaluated in the range of 173 to 323 nm, while the refractive index slightly varied in the range of 1.515 to 1.622 with an increase in withdrawal speed from 100 to 250 mm/s. The crystallographic structure of the films was analyzed with X-ray diffractometer. The films were amorphous in nature.
Słowa kluczowe
Wydawca
Rocznik
Strony
515--520
Opis fizyczny
Bibliogr. 20 poz., rys., tab.
Twórcy
autor
  • Lahore College for Women University, Lahore-54000, Pakistan
autor
  • Lahore College for Women University, Lahore-54000, Pakistan
autor
  • Centre of Excellence in Solid state Physics, University of the Punjab, Lahore-54900, Pakistan
autor
  • Lahore College for Women University, Lahore-54000, Pakistan
autor
  • Centre of Excellence in Solid state Physics, University of the Punjab, Lahore-54900, Pakistan
Bibliografia
  • [1] WAKEHAM J.S., THWAITES J.M., HOLTON W.B., TSAKONAS C., CRANTON M.W., KOUTSOGEORGIS C.D., RANSON R., Thin Solid Films, 518 (2009), 1355.
  • [2] SHIN H.S., SHIN H.J., PARK J.K., ISHIDA T., TABATA O., KIM H.H., Thin Solid Films, 341 (1999), 225.
  • [3] MURALI R.K., J. Phys. Chem. Solids, 68 (2007), 2293.
  • [4] KANEVA N.V., DUSHKIN C.D., Bulg. Chem. Commun., 43 (2011), 259.
  • [5] CHENG X.L., ZHAO H., HUO L.H., GAO S., ZHAO J.G., Sensor. Actuat. B-Chem., 102 (2004), 248.
  • [6] KLEIN C.L., Sol-gel technology for thin films, fibres, performs, electronics, and specialty shapes, Noyes Publications, New Jersey, 1988.
  • [7] LOPEZ M.T., AVNIR D., AEGERTER M., Emerging fields in sol-gel science and technology, Kluwer Academic Publishers, London, 2003.
  • [8] KAYANI N.Z., AFZAL T., RIAZ S., NASEEM S., J. Alloy. Compd., 606 (2014), 177.
  • [9] ANNA K., NINA P., YURI K., MEINHARD M., WERNER Z., AHARON G., Ultrason. Sonochem., 15 (2008), 839.
  • [10] LI H., WANG J., LIU H., YANG C., XU H., LI X., CUI H., Vacuum, 77 (2004), 57.
  • [11] WAHAB R., ANSARI S.G., KIM Y.S., SEO H.K., SHIN H.S., Appl. Surf. Sci., 253 (2007), 7622.
  • [12] ALIAS S.S., ISMAIL A.B., MOHAMAD A.A., J. Alloy. Compd., 499 (2010), 231.
  • [13] KHAN R.Z., KHAN S.M., ZULFEQUAR M., KHAN S.M., Mater. Sci. Appl., 2 (2011), 340.
  • [14] OHYAMA M., KOZUKA H., YOKO T., Thin Solid Films, 306 (1997), 78.
  • [15] MANIFACIER C., GASIOT J., FILLARD J., J. Phys. E, 9 (1976), 1002.
  • [16] URBACH F., Phys. Rev., 92 (1953), 1324.
  • [17] TAN T.S., CHEN J.B., SUN W.X., FAN J.W., J. Appl. Phys., 98 (2005), 013505.
  • [18] BALASUBRAMANIAN V., SURIYANARAYANAN N., KANNAN R., Res. J. Chem. Sci., 2 (2012), 51.
  • [19] SHINDE S.M., AHIRRAO B.P., PATIL J.I., PATIL S.R., Indian J. Pur. Ap. Phy., 50 (2012), 657.
  • [20] OZTA M., Chinese Phys. Lett., 25 (2008), 4090.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-4d377585-37de-44e4-b341-d0ff5fc0a50b
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