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Cross-correlation technique for revealing defects in pulsed eddy current defectoscopy

Treść / Zawartość
Identyfikatory
Warianty tytułu
Konferencja
Computer Applications in Electrical Engineering 2014 (28-29.04.2014; Poznań, Polska)
Języki publikacji
EN
Abstrakty
EN
Important aspects of the cross-correlation in the pulsed eddy current defectoscopy are analyzed and discussed. The application of the technique is described and illustrated with an example of an artificial defect in an electrically conductive steel plate. The results of the measurements are compared with the data obtained for the reference defect.
Rocznik
Tom
Strony
47--53
Opis fizyczny
Bibliogr. 8 poz., rys.
Twórcy
autor
  • University of West Bohemia in Pilsen
autor
  • University of West Bohemia in Pilsen
autor
  • University of West Bohemia in Pilsen
autor
  • Czech Technical University in Prague
Bibliografia
  • [1] Rosado, L.S., Janeiro, F.M., Ramos, P.M., Piedade, M., Defect Characterization with Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial neural Networks. IEEE Trans. Instrum. Measur. 62 (2013), No. 5, pp. 1207-1244.
  • [2] Zorgati, R., Lesselier, D., Duchene, B., Pons, F., Eddy Current Testing of Anomalies in Conductive Materials. II. Quantitative Imaging via Deterministic and Stochastic Inversion Techniques. IEEE Trans. Magn. 28 (1992), No. 6, pp. 1850-1862.
  • [3] Fukutomi, H., Huang, H., Takagi, T., Tani, J., Identification of Crack Depths from Eddy Current Testing Signal. IEEE Trans. Magn. 34 (1998), No. 3, pp. 2893-2896.
  • [4] Janoušek L., Marek T., Gombárska D., Eddy Current Non-Destructive Evaluation of Conductive Materials. Communications (2006), No. 1. pp. 29-33.
  • [5] Tsuboi, H., Seshima, N., Sebestien, I. Pavo, J., Transient Eddy Current Analysis of Pulsed Eddy Current Testing by Finite Element Method. IEEE Trans. Magn. 40 (2004), No. 2, pp. 1330-1333.
  • [6] Pavo, J.: Numerical Calculation Method for Pulsed Eddy Current Testing. IEEE Trans. Magn. 38 (2002), No. 2, pp. 1169-1172.
  • [7] Shejuan, X., Chen, Z., Takagi, T., Uchimoto, T., Efficient Numerical Solver for Simulation of Pulsed Eddy-Current Testing Signals. IEEE Trans. Magn. 47 (2011), No. 11, pp. 4582-4591.
  • [8] Jansa, J., Karban, P., Eddy Current Defectoscopy with Utilisation of Cross-Correlation. Proc. Joint Conference AMTEE-CPEE, Roztoky u Křivoklátu, 4-6 September 2013, p. 4-6.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-4be6981f-74eb-49d7-ac00-94e5a478c89e
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