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Tytuł artykułu

Noise spectroscopy of resistive components at elevated temperature

Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Studies of electrical properties, including noise properties, of thick-film resistors prepared from various resistive and conductive materials on LTCC substrates have been described. Experiments have been carried out in the temperature range from 300 K up to 650 K using two methods, i.e. measuring (i) spectra of voltage fluctuations observed on the studied samples and (ii) the current noise index by a standard meter, both at constant temperature and during a temperature sweep with a slow rate. The 1/f noise component caused by resistance fluctuations occurred to be dominant in the entire range of temperature. The dependence of the noise intensity on temperature revealed that a temperature change from 300 K to 650 K causes a rise in magnitude of the noise intensity approximately one order of magnitude. Using the experimental data, the parameters describing noise properties of the used materials have been calculated and compared to the properties of other previously studied thick-film materials.
Rocznik
Strony
15--26
Opis fizyczny
Bibliogr. 35 poz., rys., tab., wykr.
Twórcy
autor
  • Rzeszów University of Technology, Powstanców Warszawy 12, 35-959 Rzeszów, Poland
autor
  • Rzeszów University of Technology, Powstanców Warszawy 12, 35-959 Rzeszów, Poland
autor
  • Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, PL 50-370 Wrocław, Poland
autor
  • Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, PL 50-370 Wrocław, Poland
Bibliografia
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  • [5] Dziedzic, A. (2002). Electrical and structural investigations in reliability characterisation of modern passives and passive integrated components, Microelectronics Reliability, 42, 709-719.
  • [6] Kolek, A. (2006). Experimental methods of low-frequency noise, University of Technology Publications, Rzeszow, Poland.
  • [7] Stadler, A. (2011). Noise properties of thick-film resistors in extended temperature range, Microelectronics Reliability, 51, 1264-1270.
  • [8] Rocak, D., Belavic, D., Hrovat, M., Sikula, J., Koktavy, B., Pavelka, J., Sedlakova, V. (2001). Low-frequency noise of thick-film resistors as quality and reliability indicator. Microelectronics Reliability; 41, 531-542.
  • [9] Jevtić, M.M. (1995) Noise as a diagnostic and prediction tool in reliability physics. Microelectronics Reliability, 35, 455-477.
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  • [22] Kotarski, M., Smulko, J. (2009). Noise measurement set-ups for fluctuations-enhanced gas sensing, Metrology and Measurement Systems 16, 457-464.
  • [23] Nowak, D., Miś, E., Dziedzic, A., Kita, J. (2009). Fabrication and electrical properties of laser-shaped thick-film and LTCC microresistors, Microelectronics Reliability 49, 600-606.
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  • [26] Kolek, A., Ptak, P., Mleczko, K., Wrona, A. (2001). A further improvement of the measuring technique of bulk and contact components of resistance noise, Proc. 16th Int. Conf. Noise in Physical Systems and 1/f Fluctuations, ICNF 2001, Gainesville, Florida, USA, 713-716.
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  • [28] Stadler, A. (2011). Virtual instruments in low-frequency noise spectroscopy experiments, Proc. 35th Int. Conf. of IMAPS-CPMT Poland Chapter, Gdańsk-Sobieszewo, 311-316.
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  • [30] Stadler, A.W., Zawiślak, Z., Dziedzic, A., Stęplewski, W. (2012). Studies of noise in polymer thick-film resistors embedded in printed circuit boards, In Microelectronic Materials and Technologies, vol. 1, 82-97, Koszalin Technical University Monograph Series, Monograph No. 231.
  • [31] Kolek, A., Ptak, P., Dziedzic, A. (2003). Noise characteristics of resistors buried in low-temperature co-fired ceramics, J. Phys. D: Applied Physics, 36, 1009-1017.
  • [32] Vandamme, L.K.J., Casier, H.J. (2004). The 1/f noise versus sheet resistance in poly-Si is similar to poly-SiGe resistors and Au-layers. Proc. of 34th European Solid-State Device Research Conf. Leuven, Belgium, 21-23.
  • [33] Hooge, F. N.(1969), 1/f noise is no surface effect, Phys. Lett., 29A, 139-140.
  • [34] Unger, M., Fleig, J., Ahrens, M., Smetana, W., Radosavljevič, G. (2010). Permittivity and conductivity of various LTCC-tapes at high temperatures, Proc. 33rd Int. Spring Seminar on Electronics Technology, 93-98.
  • [35] Giusi, G., Scandurra, G., Ciofi C. (2013). Estimation errors in 1/fγ noise spectra when employing DFT spectrum analyzers, Fluctuation and Noise Letters, 12(1), 1350007.
Uwagi
EN
The work has been supported from Grant DEC-2011/01/B/ST7/06564 funded by the National Science Centre (Poland) and from Rzeszow University of Technology Project U-235/DS. Studies have been performed with the use of equipment purchased in the project No POPW.01.03.00-18-012/09 from the Structural Funds, The Development of Eastern Poland Operational Programme co-financed by the European Union, the European Regional Development Fund.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-4bbc877f-10f2-4d98-ba73-a96926bfedd3
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