Dynamic comparator design in 28 nm CMOS

• Autorzy: Kaczmarczyk Piotr , Kmon Piotr
• Języki publikacji: EN

Abstrakty

EN

The paper presents a dynamic comparator design in 28 nm CMOS process. The proposed comparator is a main block of an asynchronous analog-to-digital converter used in a multichannel integrated circuit dedicated for X-ray imaging systems. We provide comparator’s main parameters analysis, i.e. voltage offsets, power consumption, response delay, and input-referred noise in terms of its dimensioning and biasing. The final circuit occupies 5×5 μm² of area, consumes 17.1 fJ for single comparison with 250 ps of propagation delay, and allows to work with 4 GHz clock signal.

Słowa kluczowe

EN

dynamic comparator; SAR; ADC; analog-to-digital converter; X-ray imaging; CMOS; sensor; energy measurement

PL

komparator dynamiczny; SAR; ADC; przetwornik analogowo-cyfrowy; obrazowanie rentgenowskie; CMOS; czujnik; pomiar energii

• Wydawca: Lodz University of Technology. Department of Microelectronics and Computer Science
• Czasopismo: International Journal of Microelectronics and Computer Science
• Rocznik: 2018
• Tom: Vol. 9, nr 4
• Strony: 149--154
• Opis fizyczny: Bibliogr. 12 poz., rys., wykr.

Twórcy

autor

Kaczmarczyk Piotr

• Department of Measurement and Electronics, AGH University of Science and Technology, Krakow, Poland

autor

Kmon Piotr

• Department of Measurement and Electronics, AGH University of Science and Technology, Krakow, Poland

Bibliografia

• [1] K. Taguchi and J. S. Iwanczyk, “Vision 20/20: Single photon counting x-ray detectors in medical imaging.” Med. Phys., vol. 40, p. 100901, Oct. 2013.
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• [3] H. Kim, S. Han, J. Yang, S. Kim, Y. Kim, S. Kim, D. Yoon, J. Lee, J. Park, Y. Sung, S. Lee, S. Ryu, and G. Cho, “An asynchronous sampling-based 128×128 direct photon-counting x-ray image detector with multi-energy discrimination and high spatial resolution, ” IEEE J. Solid-State Circuits, vol. 48, no. 2, pp. 541-558, Feb. 2013.
• [4] R. Kłeczek, P. Gryboś, R. Szczygieł, and P. Maj, “Single photon-counting pixel readout chip operating up to 1.2 Gcps/mm² for digital X-ray imaging systems, ” IEEE J. Solid-State Circuits, vol. 53, no. 9, pp. 2651-2662, Sep. 2018.
• [5] R. Ballabriga, J. Alozy, G. Blaj, M. Campbell, M. Fiederle, E. Frojdh, E. H. M. Heijne, X. Llopart, M. Pichotka, S. Procz, L. Tlustos, and W. Wong, “The Medipix3RX: a high resolution, zero dead-time pixel detector readout chip allowing spectroscopic imaging, ” J. Instrum., vol. 8, no. 02, pp. 02 016-1-02 016-15, feb 2013.
• [6] R. Dinapoli, A. Bergamaschi, D. Greiffenberg, B. Henrich, R. Horisberger, I. Johnson, A. Mozzanica, V. Radicci, B. Schmitt, X. Shi, and G. Tinti, “EIGER characterization results, ” Nucl. Instrum. Meth., vol. A 731, pp. 68-73, 2013.
• [7] A. Rivetti, CMOS: Front-End Electronics for Radiation Sensors. CRC Press, 2015.
• [8] M. van Elzakker, E. van Tuijl, P. Geraedts, D. Schinkel, E. A. M. Klumperink, and B. Nauta, “A 10-bit charge-redistribution ADC consuming 1.9μW at 1 MS/s, ” IEEE J. Solid-State Circuits, vol. 45, no. 5, pp. 1007-1015, May 2010.
• [9] P. J. A. Harpe, C. Zhou, Y. Bi, N. P. van der Meijs, X. Wang, K. Philips, G. Dolmans, and H. de Groot, “A 26μW 8 bit 10 MS/s asynchronous SAR ADC for low energy radios, ” IEEE J. Solid-State Circuits, vol. 46, no. 7, pp. 1585-1595, Jul. 2011.
• [10] B. Razavi, “The StrongARM Latch [A Circuit for All Seasons], ” IEEE Solid-State Circuits Mag., vol. 7, no. 2, pp. 12-17, 2015.
• [11] H. S. Bindra, C. E. Lokin, A. Annema, and B. Nauta, “A 30fJ/comparison dynamic bias comparator,” in Proc. ESSCIRC, Sep. 2017, pp. 71-74.
• [12] W. Evans, E. Naviasky, H. Tang, B. Allison, and J. Matsuzaki. (2006) Comparator metastability analysis. [Online]. Available: http: /www.designers-guide.org/analysis/metastability.pdf

Uwagi

Opracowanie rekordu ze środków MNiSW, umowa Nr 461252 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2020).