Method for improving sinusoidal quality of error diffusion binary encoded fringe used in phase measurement profilometry

• Autorzy: Tian Z. , Chen W. , Su X.

Identyfikatory

DOI

10.5277/oa160213

• Języki publikacji: EN

Abstrakty

EN

Insufficient resolution of digital-light-processing projector will degrade the sinusoidal quality of the binary encoded fringe pattern because of less sampling points in a fringe period, which will degrade the measurement accuracy if it is used in phase measurement profilometry. Two resolutions are proposed in the paper. One is that a cylindrical lens is introduced in the projecting light path of the measurement system to improve sinusoidal quality of the binary encoded fringe by elliptical low-pass filtering of the system. The other one is that superposition of multi-frame binary encoded gratings with different microstructure is to reduce the binary image noise for improving the measurement accuracy. Simulations and experiments verify the validity of the above two methods.

Słowa kluczowe

EN

phase measurement profilometry; digital-light-processing projector; DLP projector; error diffusion algorithm; binary encoded grating

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2016
• Tom: Vol. 46, nr 2
• Strony: 291--303
• Opis fizyczny: Bibliogr. 23 poz., rys., tab.

Twórcy

autor

Tian Z.

• Opto-Electronic Department, School of Electronic and Information Engineering, Sichuan University, Chengdu, Sichuan 610064, China

autor

Chen W.

• Opto-Electronic Department, School of Electronic and Information Engineering, Sichuan University, Chengdu, Sichuan 610064, China

autor

Su X.

• Opto-Electronic Department, School of Electronic and Information Engineering, Sichuan University, Chengdu, Sichuan 610064, China

Bibliografia

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Uwagi

PL

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę.