Enhancing capabilities of Atomic Force Microscopy by tip motion harmonics analysis

• Autorzy: Babicz S. , Smulko J. , Zieliński A.
• Języki publikacji: EN

Abstrakty

EN

Motion of a tip used in an atomic force microscope can be described by the Lennard-Jones potential, approximated by the van der Waals force in a long-range interaction. Here we present a general framework of approximation of the tip motion by adding three terms of Taylor series what results in non-zero harmonics in an output signal. We have worked out a measurement system which allows recording of an excitation tip signal and its non-linear response. The first studies of spectrum showed that presence of the second and the third harmonics in cantilever vibrations may be observed and used as a new method of the investigated samples characterization.

Słowa kluczowe

EN

atomic force microscopy (AFM); harmonics; van der Waals forces

• Wydawca: Polska Akademia Nauk, Wydział IV Nauk Technicznych
• Czasopismo: Bulletin of the Polish Academy of Sciences. Technical Sciences
• Rocznik: 2013
• Tom: Vol. 61, nr 2
• Strony: 535--539
• Opis fizyczny: Bibliogr. 25 poz., rys., wykr.

Twórcy

autor

Babicz S.

• Faculty of Electronics, Telecommunications and Informatics, Department of Metrology and Optoelectronics, Gdansk University of Technology, 11/12 G. Narutowicza St., 80-233 Gdansk, Poland

autor

Smulko J.

• Faculty of Electronics, Telecommunications and Informatics, Department of Metrology and Optoelectronics, Gdansk University of Technology, 11/12 G. Narutowicza St., 80-233 Gdansk, Poland

autor

Zieliński A.

• Chemical Faculty, Department of Electrochemistry, Corrosion and Materials Engineering, Gdansk University of Technology, 11/12 G. Narutowicza St., 80-233 Gdansk, Poland

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