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Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis

Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
A nanoscale investigation of three-dimensional (3-D) surface micromorphology of archetypical N, N0- bis (n-etyl) x:y, dicyanoperylene- 3, 4:9, 10 bis (dicarboximide) (PDI8-CN2) thin films on H-Si substrates, which are applicable in n-type semiconducting compounds, has been performed by using fractal analysis. In addition, surface texture characteristics of the PDI8-CN2 thin films have been characterized by using atomic force microscopy (AFM) operated in tapping-mode in the air. These analyses revealed that all samples can be described well as fractal structures at nanometer scale and their three dimensional surface texture could be implemented in both graphical models and computer simulations.
Wydawca
Rocznik
Strony
334--340
Opis fizyczny
Bibliogr. 33 poz., tab., rys.
Twórcy
  • Technical University of Cluj-Napoca, The Directorate of Research, Development and Innovation Management (DMCDI), Constantin Daicoviciu St., no. 15, Cluj-Napoca, 400020, Cluj county, Romania
  • University of Warmia and Mazury in Olsztyn, Faculty of Technical Sciences, Oczapowskiego 11, 10-719 Olsztyn, Poland
  • University of Warmia and Mazury in Olsztyn, Faculty of Technical Sciences, Oczapowskiego 11, 10-719 Olsztyn, Poland
  • Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran
autor
  • University of Craiova, Faculty of Mechanics, Department of Applied Mechanics and Civil Engineering, Calea Bucures, ti St., no. 107, 200512 Craiova, Dolj county, Romania
  • Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran
autor
  • Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran
Bibliografia
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  • [10] GERBI A., BUZIO R., GADALETA A., ANGHINOLFI L., CAMINALE M., BELLINGERI E., SIRI A.S., MARRÈ D., Adv. Mater. Interfaces, 1(2014) 1300057.
  • [11] ŢĂLU Ş., Napoca Star Publishing House, Cluj-Napoca, Romania, 2015.
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  • [19] NASERI N., SOLAYMANI S., GHADERI A., BRAMOWICZ M., KULESZA S., ŢĂLU Ş., POURREZA M., GHASEMI S., RSC Adv., 7 (2017), 12923.
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  • [25] KULESZA S., BRAMOWICZ M., CZAJA P., JABŁOŃSKI R., KROPIWNICKI J., CHARKIEWICZ M., Acta Phys. Polonica A, 130 (2016), 1013.
  • [26] ŢĂLU Ş., BRAMOWICZ M., KULESZA S., LAINOVIC T., VILOTIC M., BLAŽIC L., Journal of Microscopy, 264 (2016), 198.
  • [27] VRANCEANU D.M., COTRUT C.M., BRAMOWICZ M., TITORENCU I., KULESZA S., KISS A., BERBECARU A., PRUNA V., BRANZEI M., VLADESCU A., Ceram. Int., 42 (2016), 10085.
  • [28] MÉNDEZ A., REYES Y., TREJO G., ST ˛ EPIE´N K., ŢĂLU Ş., Microsc. Res. Tech., 78 (2015), 1082.
  • [29] ŢĂLU Ş.,STACH S., VALEDBAGI S., ELAHI S.M., BAVADI R., Mater. Sci. Poland, 33(1)(2015), 137.
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  • [32] STACH S., GARCZYK ˙Z ŢĂLU Ş., SOLAYMANI S., GHADERI A., MORADIAN R., NEZAFAT N.B., ELAHI S.M., GHOLAMALI H., J. Phys. Chem. C, 119(31) (2015) 17887.
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Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-3ca7fa7b-4921-416b-a600-3a38d6c175af
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