PL EN


Preferencje help
Widoczny [Schowaj] Abstrakt
Liczba wyników
Tytuł artykułu

A comprehensive physical model for light reflection in textiles for computer graphics applications

Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
This paper is concerned with the optical properties and 3D modelling of textile structures (yarn, woven and knitted product). A method for establishing a set of statistical surface parameters for a fibre from atomic force microscopy measurement is proposed. This technique is adapted for yarn. Nevertheless, AFM measurements are impossible for this structure, so a virtual profiler has been developed. Finally, several reflectance models are compared. The Lafortune model is the most adapted to predict reflectance properties of yarn. The correlation of estimated and measured surface parameters is processed to make the model physically plausible for textile materials. Once this task has been achieved, this modified model is implanted in a ray tracing program for more realistic computer graphic application in the field of textiles.
Rocznik
Strony
190--198
Opis fizyczny
Bibliogr. 5 poz.
Twórcy
autor
  • Laboratoire GEnie et Matériaux TEXtiles (GEMTEX), UPRES EA2161, école Nationale des Arts et Industries Textiles (ENSAIT), 9, rue de l'Hermitage, BP 30329, 59056 ROUBAIX Cedex 01, France Corresponding author. Tel.: +33-3-20-25-64-57 fax.: +33-3-20-27-27-97
autor
  • Laboratoire GEnie et Matériaux TEXtiles (GEMTEX), UPRES EA2161, École Supérieure des Techniques Industrielles et des Textiles, 52, allée Lakanal, BP 209, 59654 VILLENEUVE D'ASCQ Cedex, France
autor
  • Laboratoire GEnie et Matériaux TEXtiles (GEMTEX), UPRES EA2161, École Nationale des Arts et Industries Textiles (ENSAIT), 9 rue de l'Hermitage, BP 30329, 59056 ROUBAIX Cedex 01, France
Bibliografia
  • [1] Breen D., House D. & Getto D.H. A physically based particle model for simulating the draping behavior of woven cloth. Textile Research Journal, 64(11) :663-685, 1994.
  • [2] Phong B.T. Illumination for computer generated pictures. Comm. of the ACM, 18(6) :449-455, 1995.
  • [3] Ward G.J. Measuring and modelling anisotropic reflection. Computer Graphics, 26(2) :265-272, 1992.
  • [4] Schlick C. An inexpressive BRDF model for physically-based rendering. Proc. Eurographics’94, 13(3) :233-246, 1994.
  • [5] Lafortune E.P.F., Foo S.C., Torrance K.E. & Greenberg G.D. Non-linear approximation of reflectance function. Computer Graphics, 31(1) :117-126, 1997.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-393c0f14-fa6a-4815-ad7f-89b1d44f5428
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.