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Języki publikacji
Abstrakty
Diamond-like carbon (DLC) films were electrochemically deposited onto indium tin oxide (ITO) substrates using acetic acid and deionized water as electrolyte at low deposition voltages (2.4 V and 60 V). The transmittance of the films was investigated by UV spectrometry. Transmittance measurements versus wavelength revealed that the films transmit 86 % to 89 % light in visible region and band gap of the films varies between 3.87 eV and 3.89 eV. Atomic force microscopy (AFM) and scanning electron microscopy (SEM) were used for structural characterization to evaluate surface morphology of the DLC films. The grain size and the surface roughness increased for the films prepared at higher deposition potential, while their measured average height decreased. The mechanical properties (hardness H and elastic modulus Er) were determined from load-displacement curves which were obtained by using nanoindentation method. Hardness and elastic modulus of the films increased as the deposition voltage of the films increased from 2.4 V to 60 V.
Wydawca
Czasopismo
Rocznik
Tom
Strony
166--172
Opis fizyczny
Bibliogr. 23 poz., rys.
Twórcy
autor
- Munzur University, Department of Metallurgical and Materials Engineering, Tunceli, Turkey
- Sakarya University, Department of Metallurgical and Materials Engineering, Sakarya, Turkey
- Sakarya University of Applied Sciences, Depart. of Metallurgical and Materials Engineering, Sakarya, Turkey
autor
- Bülent Ecevit University, Department of Electrical and Electronics Engineering, Zonguldak, Turkey
autor
- Rectorate of Bartın University, Bartın, Turkey
- Ankara University, Department of Physics, Ankara, Turkey
autor
- Sakarya University, Department of Metallurgical and Materials Engineering, Sakarya, Turkey
- Sakarya University of Applied Sciences, Depart. of Metallurgical and Materials Engineering, Sakarya, Turkey
autor
- Firat University, Department of Physics, Elazıg, Turkey
Bibliografia
- [1] Basman N., Aslan N., Uzun O., Cankaya G., Kolemen U., Microelec. Eng., 140 (2015), 18.
- [2] Gupta S., Chowdhury M.P., Pal A.K., Dia. Rel. Mater., 13 (2004), 1680.
- [3] Yan X.B., Xu T., Chen G., Liu H.W., Yang S.R., Carbon, 42 (2004), 3103.
- [4] Nery R.P.O.S., Bonelli R.S., Camargo JR S.S., J. of Mater. Sci., 45 (2010), 5472.
- [5] Zhou B., Rogachev A.V., Liu Z.H., Jiang X., Shen R., Rudenkov A.S., Surf. Coat. Technol., 208 (2012), 101.
- [6] Chaus A.S., Fedosenko T.N., Rogachev A.V., Čaplovi ČL., Dia. Rel. Mater., 42 (2014), 64.
- [7] Libardi J., Grigorov K., Massi M., Otani C., Ravagnani S.P., Maciel H.S., Guerino M., Ocampo J.M.J., Thin Solid Films, 459 (2004), 282.
- [8] Sanchez N.A., Rincon C., Zambrano G., Galindo H., Prieto P., Thin Solid Films, 373 (2000), 247.
- [9] Seker Z., Ozdamar H., Esen M., Esen R., Kavak H., Appl. Surf. Sci., 314 (2014), 46.
- [10] Mosayebi M.J., Hosseini S.R., Surf. Eng., 31(2015), 96.
- [11] Guo P., Sun L., Li X., Xu S., Ke P., Wang A., Thin Solid Films, 584 (2015), 289.
- [12] Cao C., Zhu H., Wang H., Thin Solid Films, 368 (2000), 203.
- [13] Roy R.K., Deb B., Bhattacharjee B., Pal A.K., Thin Solid Films, 422 (2002), 92.
- [14] Robertson, J., Mater.Sci. and Eng. R,37 (2002), 129.
- [15] Sreejith K., Nuwad J., PILLAI C.G.S., Appl. Surf. Sci., 252 (2005), 296.
- [16] Wan S., Wang L., Xue Q., Electroch. Comm., 12 (2010), 61.
- [17] Oliver W.C., Pharr G.M., J. Mater. Res., 7 (1992), 1564.
- [18] Manifacier J.C., Gasiot J., Fillard J.P., J. Phys. E, 9 (1976), 1002.
- [19] Swanopel R., J. Phys. E, 16 (1983), 1214.
- [20] Pankove J.I., Optical process in semiconductors, Dover Publications, New York, 2010.
- [21] Uzun O., Başman N., Alkan C., Kölemen U., Yilmaz F., Poly. Bull., 66 (2011), 649.
- [22] Bartali R., Micheli V., Gottardi G., Vaccari A., Laidani N., Surf. Coat. Technol., 204 (2010), 2073.
- [23] Gong J., Wu J., Guan Z., J. Eur. Ceram. Soc., 19 (1999), 2625.
Uwagi
PL
Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2019).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-34fe0855-b4a5-4a49-8485-de874dbdb92a