Identyfikatory
Warianty tytułu
Języki publikacji
Abstrakty
The aim of this paper is to introduce a strategy to find a minimal set of test nodes for diagnostics of complex analog systems with single parametric faults using the support vector machine (SVM) classifier as a fault locator. The results of diagnostics of a video amplifier and a low-pass filter using tabu search along with genetic algorithms (GAs) as node selectors in conjunction with the SVM fault classifier are presented. General principles of the diagnostic procedure are first introduced, and then the proposed approach is discussed in detail. Diagnostic results confirm the usefulness of the method and its computational requirements. Conclusions on its wider applicability are provided as well.
Rocznik
Tom
Strony
655--668
Opis fizyczny
Bibliogr. 46 poz., rys., tab., wykr.
Twórcy
autor
- Faculty of Applied Informatics and Mathematics, Warsaw University of Life Sciences—SGGW, ul. Nowoursynowska 159, 02-776 Warsaw, Poland
autor
- Institute of Radioelectronics, Warsaw University of Technology, ul. Nowowiejska 15/19, 00-665 Warsaw, Poland
Bibliografia
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Uwagi
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-34cccdd6-6017-4966-b6db-97dd5d9db23a