Synchrotron microanalytical methods in the study of trace and minor elements in apatite

• Autorzy: Rakovan J. , Luo Y. , Borkiewicz O.

Identyfikatory

DOI

10.2478/v10002-008-0001-9

• Języki publikacji: EN

Abstrakty

EN

Synchrotron X-ray facilities have the capability for numerous microanalytical methods with spatial resolutions in the micron to submicron range and sensitivities as low as ppm to ppb. These capabilities are the result of a high X-ray brilliance (many orders of magnitude greater than standard tube and rotating anode sources); a continuous, or white, spectrum through the hard X-ray region; high degrees of X-ray columniation and polarization; and new developments in X-ray focusing methods. The high photon flux and pulsed nature of the source also allow for rapid data collection and high temporal resolution in certain experiments. Of particular interest to geoscientists are X-ray fluorescence microprobes which allow for numerous analytical techniques including X-ray fluorescence (XRF) analysis of trace element concentrations and distributions; X-ray absorption spectroscopy (XAS) for chemical speciation, structural and oxidation state information; X-ray diffraction (XRD) for phase identification; and fluorescence microtomography (CMT) for mapping the internal structure of porous or composite materials as well as elemental distributions (Newville et al. 1999; Sutton et al. 2002; Sutton et al. 2004). We have employed several synchrotron based microanalytical methods including XRF, microEXAFS (Extended X-ray Absorption Fine Structure), microXANES (X-ray Absorption Near Edge Structure) and CMT for the study of minor and trace elements in apatite (and other minerals). We have also been conducting time resolved X-ray diffraction to study nucleation of and phase transformations among precursor phases in the formation of apatite from solution at earth surface conditions. Summaries of these studies are given to exemplify the capabilities of synchrotron microanalytical techniques.

Słowa kluczowe

EN

synchrotron; microanalysis; XRF; EXAFS; XANES; apatite

• Wydawca: Mineralogical Society of Poland
• Czasopismo: Mineralogia
• Rocznik: 2008
• Tom: Vol. 39, iss. 1/2
• Strony: 31--40
• Opis fizyczny: Bibliogr. 16 poz., rys., wykr.

Twórcy

autor

Rakovan J.

• Department of Geology, Miami University, Oxford, Ohio, USA 45056

autor

Luo Y.

• Department of Geology, Miami University, Oxford, Ohio, USA 45056

autor

Borkiewicz O.

• Department of Geology, Miami University, Oxford, Ohio, USA 45056

Bibliografia

• BORKIEWICZ O., CAHILL C., RAKOVAN J., In preparation: In situ, time-resolved synchrotron X-ray diffraction of calcium phosphates during nucleation and growth from aqueous solution.
• BOSZE S., RAKOVAN J., 2002: Surface structure controlled sectoral zoning of the Rare Earth Elements in fluorite from Long Lake, N.Y. and Bingham, N.M. Geochimica et Cosmochimica Acta 66, 997–1009.
• ENG P.J., NEWVILLE M., RIVERS M.L., SUTTON S.R., 1998: Dynamically figured Kirkpatrick Baez X-ray micro-focusing optics. In I. McNult, Ed., X-Ray Microfocusing: Applications and Technique, SPIE Proceeding 3449, 145–156.
• FENTER P., RIVERS M., STURCHIO N., SUTTON S. (Eds.), 2002: Applications of Synchrotron Radiation in Low-Temperature Geochemistry and Environmental Science Reviews in Mineralogy and Geochemistry V. 49. Mineralogical Society of America. Washington, DC. 579p.
• LUO Y., RAKOVAN J., HUGHES J., PAN Y., In review: A. Site preference of U and Th in Cl, F, Sr apatites. American Mineralogist.
• LUO Y., RAKOVAN J., ELZINGA E., PAN Y., LUPULESCU M.V., HUGHES J., In preparation: Crystal chemistry of Th in natural and synthetic fluorapatite. American Mineralogist.
• MENG Y., NEWVILLE M., SUTTON S., RAKOVAN J, MAO H.K., 2003: Fe and Ni impurities in synthetic diamond. American Mineralogist 88, 1555–1559.
• NEWVILLE M., SUTTON S.R., RIVERS M.L., ENG P.J.J., 1999: Micro-beam X-ray absorption and fluorescence spctroscopies at GSECARS: APS beamline 13ID. Journal of Synchrotron Radiation 6, 353–355.
• RAKOVAN J., 2002: Growth and Surface Structure of Apatite. In: Phosphates: Geochemical, Geobiological and Materials Importance, Kohn, M., Rakovan, J., Hughes, J.M. (eds). Reviews in Mineralogy and Geochemistry V. 48. Mineralogical Society of America. Washington, DC. p. 51–86.
• RAKOVAN J., REEDER R.J., 1994: Differential incorporation of trace elements and dissymmetrization in apatite: The role of surface structure during growth. American Mineralogist 79, 892–903.
• RAKOVAN J., REEDER R.J., 1996: Intracrystalline Rare Earth Element distributions in apatite: Surface structural influences on zoning during Growth. Geochimica et Cosmochimica Acta 60, 4435–4445.
• RAKOVAN J., NEWVILLE M., SUTTON S., 2001: Wavelength dispersive XANES of heterovalent Eu in Llallagua apatite. American Mineralogist 86, 697–700.
• RAKOVAN J., REEDER R.J., ELZINGA E.J., CHERNIAK D., TAIT C.D., MORRIS D.E., 2002: Characterization of U(VI) in the apatite structure by X-ray absorption spectroscopy. Environmental Science and Technology 36, 3114–3117
• REEDER R.J., RAKOVAN J., 1999: Surface structural controls on trace element incorporation during crystal growth. In: Growth, Dissolution and Pattern-formation in Geosystems, B. Jamtveitand P. Meakin (eds.) p. 143–162. Kluwer Academic Publishers.
• SUTTON P.R., BERTSCH P.M., NEWVILLE M., RIVERS M., LANZIROTTI A., ENG P., 2002: Microflourescience and microtomography analyses of heterogeneous earth and environmental materials. In: P.A. Fenter, M.L. Rivers, Sturchio, N.C., and Sutton, S.R. Eds., Applications of Synchrotron Radiation in Low-Temperature Geochemistry and Evironmental Sciences, 49, 429–483. Reviews in Mineralogy and Geochemistry, Washington, D.C.
• SUTTON S.R., NEWVILLE M., ENG P., RIVERS M., LANZIROTTI A., 2004: Mirror-based X-ray fluorescence microprobes at the Advanced Photon Source and the National Synchrotron Light Source. Advances in X-ray Analysis 47, 76–83.