Assessment of the possibilities of using atomic force microscopy (AFM) for characterisation of polymeric nanofiltration membrane surfaces

• Autorzy: Kowalik-Klimczak A. , Gierycz P.

Warianty tytułu

PL

Ocena możliwości wykorzystania mikroskopu sił atomowych w badaniach powierzchni polimerowych membran nanofiltracyjnych

• Języki publikacji: EN

Abstrakty

EN

In this study, the possibility of using an atomic force microscopy to analyse the surface structure of the polymeric nanofiltration membranes was investigated. Analysis of the obtained results allowed one to conclude that the size of the scanned surface directly affects the measurement result of both the average and root-mean-square roughness of tested membranes. Therefore, it is necessary to compare the results obtained for the same size of the scanned surface.

PL

W pracy zbadano możliwość zastosowania mikroskopu sił atomowych do analizy struktury powierzchni polimerowych membran nanofiltracyjnych. Analiza uzyskanych wyników pozwoliła na stwierdzenie, że wielkość skanowanej powierzchni bezpośrednio wpływa na wynik pomiaru zarówno chropowatości średniej arytmetycznej, jak i kwadratowej testowanych membran. Konieczne jest zatem porównywanie wyników uzyskanych dla takich samych wielkości skanowanej powierzchni.

Słowa kluczowe

EN

atomic force microscopy (AFM); nanofiltration; polymeric membranes; surface roughness

PL

mikroskopia sił atomowych; nanofiltracja; membrany polimerowe; chropowatość powierzchni

• Wydawca: Wydawnictwo Naukowe Instytutu Technologii Eksploatacji - Państwowego Instytutu Badawczego
• Czasopismo: Problemy Eksploatacji
• Rocznik: 2014
• Tom: no. 3
• Strony: 17--25
• Opis fizyczny: Bibliogr. 31 poz., rys., tab.

Twórcy

autor

Kowalik-Klimczak A.

• Warsaw University of Technology, Faculty of Chemical and Process Engineering, Warsaw

autor

Gierycz P.

• Warsaw University of Technology, Faculty of Chemical and Process Engineering, Warsaw

Bibliografia

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