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Electro-optical properties of diluted GaAsN on GaAs grown by APMOVPE

Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
In this paper we report on the optical and electrical studies of single GaAs1-xNx epitaxial layers grown on GaAs substrates by means of atmospheric pressure metal organic vapour phase epitaxy (APMOVPE). Three kinds of samples with 1.2 %, 1.6 % and 2.7 % nitrogen content were studied. Optical properties of the layers were investigated with the use of room temperature transmittance and reflectance measurements. Subsequently Schottky Au–GaAs1-xNx contacts were processed and characterized by current-voltage (I-V) and capacitance-voltage (C-V) measurements within 80 – 480 K temperature range. From the I-V and C-V characteristics the ideality factor, series resistance and built-in potential were determined. Obtained diodes can be used for further studies on defects with the use of DLTS method.
Słowa kluczowe
Wydawca
Rocznik
Strony
595--600
Opis fizyczny
Bibliogr. 10 poz., rys., tab., wykr.
Twórcy
autor
  • Institute of Physics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland
  • Institute of Physics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland
  • Institute of Physics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland
autor
  • Institute of Physics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland
autor
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego 11/17, 50-372, Wroclaw, Poland
autor
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego 11/17, 50-372, Wroclaw, Poland
autor
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego 11/17, 50-372, Wroclaw, Poland
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego 11/17, 50-372, Wroclaw, Poland
autor
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego 11/17, 50-372, Wroclaw, Poland
autor
  • Institute of Physics, Polish Academy of Science, Al. Lotnikow 32/46, 02-668 Warsaw, Poland
  • Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Janiszewskiego 11/17, 50-372, Wroclaw, Poland
Bibliografia
  • [1] KONDOW M., UOMI K., NIWA A., KITATANI T., WATAHIKI S., YAZAWA Y., Japan. J. Appl. Phys., 35 (1996), 1273.
  • [2] NAKAHARA K., KONDOW M., KITATANI T., LALSON M. C., UOMI K., IEEE Photonics Technol. Lett., 10 (1998), 487.
  • [3] FRIEDMAN D.J., GEISZ J.F., KURTZ S.R., OLSON J.M., J. Cryst. Growth, 195 (1998), 409.
  • [4] KURTZ S. R., MYERS D., OLSONET J. M., Proceedings of 26th IEEE PVSEC, IEEE, New York, 1997, 875.
  • [5] SCIANA B. et al., Cryst. Res. Technol., 47 (2012), 313.
  • [6] TALIERCIO T. et al., Phys. Rev. B, 69 (2004), 073303.
  • [7] ARIEL V., GARBER V., ROSENFELD D., BAHIR G., Appl. Phys. Lett., 66 (1995), 2101.
  • [8] RHODERIC E. H., WILIAMS R. H., Metal Semiconductor Contact, 2nd ed., Clarenden, Oxford, 1988.
  • [9] SZE S. M., KWOK K. NG, Physics of Semiconductor Devices, 3rd ed., J. Wiley and Sons, Inc., Hoboken, New Jersey, 2007.
  • [10] ZHANG Y., MASCARENHAS A., XIN H.P., TU C.W., Phys. Rev. B, 63 (2001), 161303.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-30f4daef-c923-4f1d-bdfc-41db42bd471b
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