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Estimating the noise-related error in continuous-time integrator-based ADCs

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EN
Abstrakty
EN
From first-order incremental ΣΔ converters to controlled-oscillator-based converters, many ADC architectures are based on the continuous-time integration of the input signal. However, the accuracy of such converters cannot be properly estimated without establishing the impact of noise. In fact, noise is also integrated, resulting in a random error that is added to the measured value. Since drifting phenomena may make simulations and practical measurements unable to ensure longterm reliability of the converters, a theoretical tool is required. This paper presents a solution to compute the standard deviation of the noise-generated error in continuous-time integrator-based ADCs, under the assumption that a previous measure is used to calibrate the system. In addition to produce a realistic case, this assumption allows to handle a theoretical issue that made the problem not properly solvable. The theory is developed, the equations are solved in the cases of pure white noise, pure flicker noise and low-pass filtered white noise, and the implementation issues implied by the provided formulas are addressed.
Twórcy
autor
  • Electronics Laboratory and Power Systems Laboratory, École Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
autor
  • Electronics Laboratory and Power Systems Laboratory, École Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
autor
  • Electronics Laboratory and Power Systems Laboratory, École Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
Bibliografia
  • [1] Paul Jespers. Integrated converters: D to A and A to D architectures, analysis and simulation. Vol. 11. Oxford University Press, 2001. ISBN: 978- 0198564461.
  • [2] Gabriele Manganaro. Advanced data converters. Cambridge University Press, 2012. ISBN: 978-1107005570.
  • [3] Syed K. Islam et al. “Integrated circuit biosensors using living wholecell bioreporters”. IEEE Transactions on Circuits and Systems I: Regular Papers, Vol. 54, No. 1, Jan. 2007, pp. 89-98.
  • [4] Yevgeny Perelman and Ran Ginosar. “A low-light-level Sensor for medical diagnostic applications”. IEEE Journal of Solid-State Circuits, Vol. 36, No. 10, Oct. 2001, pp. 1553-1558. doi: 10.1109/4.953484.
  • [5] Ritu Raj Singh et al. “A CMOS Σ − Δ photodetector array for bioluminescence-based DNA sequencing”. Symposium on VLSI CircuitsDigest of Technical Papers, June 2011, pp. 96-97.
  • [6] Horst Zimmermann. Silicon Optoelectronic Integrated Circuits. Springer Science & Business Media, 2004. ISBN: 3-540-40518-6.
  • [7] Philip R. Westlake. “The Effects of Noise through an Analog Integrator Which Integrates with Respect to an Arbitrary Variable”. IRE Transactions on Aerospace and Navigational Electronics, Vol. ANE-9, No. 3, Sept. 1962, pp. 151-158.
  • [8] Emily J. McDowell et al. “A generalized noise variance analysis model and its application to the characterization of 1/f noise”. Optic Express, Vol. 15, No. 7, Apr. 2007, pp. 3833-3848.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-29734429-c51f-426b-89d2-0a5583e939a5
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