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Application of Aloe vera gel instead of silicon dioxide as organic dielectric material in microelectronics

Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Organic materials are now being used in a wide range of microelectronic applications in parallel with inorganic materials, because of their superior properties, environmental safety, and low cost. This paper describes the characterization of Aloe vera gel (AVG), a new organic dielectric material. The surface morphology, spatial distribution of elements, and structural characteristics of an AVG layer were examined using scanning electron microscopy, energy-dispersive X-ray spectroscopy (EDX), and X-ray diffraction (XRD), respectively. The resistance of the AVG layer, determined using a four-probe station, was 640 Omega. EDX showed that the elements contained in the layer were carbon, oxygen, aluminum, silicon, calcium, potassium, and copper. The XRD results suggested that the sample primarily consisted of bornite (Cu5FeS4), geerite (Cu8S5), sal ammoniac (NH4Cl), and carobbite (KF).
Słowa kluczowe
Wydawca
Rocznik
Strony
635--638
Opis fizyczny
Bibliogr. 14 poz., rys., tab.
Twórcy
autor
  • Institute of Electronics, Atomic Energy Research Establishment, Dhaka, Bangladesh
autor
  • Department of EEE, University of Dhaka (Mymensingh Engineering College), Dhaka, Bangladesh
autor
  • Institute of Electronics, Atomic Energy Research Establishment, Dhaka, Bangladesh
  • Department of EEE, University of Dhaka (Mymensingh Engineering College), Dhaka, Bangladesh
autor
  • Institute of Electronics, Atomic Energy Research Establishment, Dhaka, Bangladesh
autor
  • The University of Lahore, Pakistan
autor
  • Institute of Electronics, Atomic Energy Research Establishment, Dhaka, Bangladesh
Bibliografia
  • [1] OUYANG J., CHU C.W., TSENG R.J., PRAKASH A., YANG Y., P. IEEE, 93 (2005), 1287.
  • [2] BETTINGER C.J., BAO Z., Adv. Mater., 22 (2010), 651.
  • [3] REGACO M.P., DIRANI E.A.T., FONSECA, F.J., ANDRADE DE A.M., 12th Int. Symp. El., 2005, 441.
  • [4] PUIGDOLLERS J., VOZ C., MARTIN I., ORPELLA A., VETTER M., ALCUBILLA R., 2005 Spanish Conference on Electron Devices, 2005, 165.
  • [5] KARZAZI Y., J. Mater. Environ. Sci., 5 (2014), 1.
  • [6] Lenntech website (online), http://www.lenntech. com/periodic/elements/si.htm.
  • [7] CHANG J., WANG C., HUANG C., TSAI T., GUO T., WEN T., Adv. Mater., 23 (2011), 4077.
  • [8] HASHMI R.A., BANO N., KHATOON, AYUB S., Pak. J. Bot., 26 (1994), 467.
  • [9] KSENZHEK O., PETROVA S., KOLODYAZHNY M., Bulg. J. Plant Physiol., 30 (2004), 61.
  • [10] NELSON S.O., P. IEEE, 2005, 360.
  • [11] AMIN R.A., RANA S.M., TALUKDER S.H., IQBAL M.S., ZAMAN M.A.U., HOQ M., J. Appl. Sci., 14 (2014), 3507.
  • [12] ROSENHOLTZ . L., SMITH D.T., J. Miner. Soc. Am., 21 (1936), 115.
  • [13] SUKYTE J., ZALENKIENE S., JANICKIS V., Mater. Sci.+, 16 (2010), 108.
  • [14] KHOR L.Q., CHEONG K.Y., J. Mater. Sci.-Mater. El., 24 (2013), 2646.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-28e7ac3b-bfa8-4fd3-8108-8d263222db39
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