Preparation and noise analysis of polymer graphite cathode

• Autorzy: Knápek A. , Horáček M. , Chlumská J. , Kuparowitz T. , Sobola D. , Šikula J.

Identyfikatory

DOI

10.24425/123895

• Języki publikacji: EN

Abstrakty

EN

The paper deals with the preparation and measurement of an experimental polymer graphite cathode that seems to be a promising and cheap source of electrons utilizing cold field-emission in high- and ultra-high vacuum. Polymer graphite seems to be a proper material as it contains a large amount of hybridized carbon with a low degree of surface oxidation and silicon monoxide (SiO). Within the frame of this work, a special experimental method of tip preparation has been designed and tuned. This method is based on ion milling inside a dual-beam electron microscope enabling to obtain ultra-sharp tips of a diameter smaller than 100 nm with a predefined opening angle. The charge transport within experimental samples is evaluated based on results provided by the noise spectroscopy of the total emission current in the time and frequency domains.

Słowa kluczowe

EN

field emission; polymer graphite; noise analysis

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2018
• Tom: Vol. 25, nr 3
• Strony: 451--458
• Opis fizyczny: Bibliogr. 14 poz., rys., tab., wykr.

Twórcy

autor

Knápek A.

• Institute of Scientific Instruments of the Czech Academy of Sciences, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic

autor

Horáček M.

• Institute of Scientific Instruments of the Czech Academy of Sciences, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic

autor

Chlumská J.

• Institute of Scientific Instruments of the Czech Academy of Sciences, v. v. i., Královopolská 147, 612 64 Brno, Czech Republic

autor

Kuparowitz T.

• Brno University of Technology, Faculty of Electrical Engineering and Communication, Technická 8, 616 00, Brno, Czech Republic

autor

Sobola D.

• Brno University of Technology, Faculty of Electrical Engineering and Communication, Technická 8, 616 00, Brno, Czech Republic

autor

Šikula J.

• Brno University of Technology, Faculty of Electrical Engineering and Communication, Technická 8, 616 00, Brno, Czech Republic

Bibliografia

• [1] Knápek, A., et al. (2012). Cold field-emission cathode noise analysis. Metrol. Meas. Syst., 19(4), 417-422.
• [2] Harle, R. (1978). Method for controlling the emission current of an electron source and an electron source having a control circuit for controlling the emission current. U.S. Patent No 5, 808, 425.
• [3] Houdellier, F., et al. (2012). New carbon cone nanotip for use in a highly coherent cold field emission electron microscope. Carbon, 50(5), 2037-2044.
• [4] Khairnar, R.S., Dharmadhikari, C.V., Joag, D.S. (1989). Pencil lead tips: A field ion and field electron emission microscopic study. Journal of Applied Physics, 65(12), 4735-4738.
• [5] Knápek, A., et al. (2017). Field emission from the surface of highly ordered pyrolytic graphite. Applied Surface Science , 395, 157-161.
• [6] Navrátil, R., et al. (2016). Polymer lead pencil graphite as electrode material: Voltammetric, XPS and Raman study. Journal of Electroanalytical Chemistry, 783, 152=160.
• [7] Knápek, A., et al. (2017). Programmable set-up for electrochemical preparation of STM tips and ultra-sharp field emission cathodes. Microelectronic Engineering, 173, 42-47.
• [8] Kiwilszo, M., Smulko, J. (2009). Pitting corrosion characterization by electrochemical noise measurements on asymmetric electrodes. Journal of Solid State Electrochemistry, 13(11), 1681-1686.
• [9] Šikula, J., Levinshtein, M. (2004). Advanced experimental methods for noise research in nanoscale electronic devices. Boston: Kluwer Academic Publishers, 271-278.
• [10] Šikula, J., et al. (2007). RTS and 1/f Noise in Submicron MOSFETs. AIP Conference Proceedings, 71-76.
• [11] Šikula, J., et al. (2007). Quantum 1/f Noise in Bio-Chemical Resonant ZnO Sensors. AIP Conference Proceedings, 339-342.
• [12] Šikula, J., et al. (2003). Noise and non-linearity as reliability indicators of electronic devices. Iinformacije Midem-Ljubljana, 33(4), 213-221.
• [13] Mohammadi, S., Pavilidis, D. (2000). A Nonfundamental Theory of Low-Frequency Noise in Semiconductor Devices. IEEE Transactions on Electron Devices, 47(11), 2009-2017.
• [14] Sergeev, E., et al. (2013). Noise diagnostic method of experimental cold field-emission cathodes. Noise and Fluctuations (ICNF), 2013 22nd International Conference IEEE, 1-4.

Uwagi

EN

1. This work was supported by EC and MEYS CR (project no. CZ.1.05/2.1.00/01.0017), and by the Technology Agency of the Czech Republic project no. TE01020118. This research was also subsidized by the Ministry of Education, Youth and Sports of the Czech Republic under the project CEITEC 2020 (LQ1601) and by the National Sustainability Program under the grant LO1401.

PL

2. Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2018).