Imaging methods of detecting defects in photovoltaic solar cells and modules: a survey

• Autorzy: Maziuk Maurycy , Jasińska Laura , Domaradzki Jarosław , Chodasewicz Paweł

Identyfikatory

DOI

10.24425/mms.2023.146426

• Języki publikacji: EN

Abstrakty

EN

In pursuit of increased efficiency and longer operating times of photovoltaic systems, one may encounter numerous difficulties in the form of defects that occur in both individual solar cells and whole modules. The causes of the occurrence range from structural defects to damage during assembly or, finally, wear and tear of the material due to operation. This article provides an overview of modern imaging methods used to detect various types of defects found in photovoltaic cells and panels. The first part reviews typical defects. The second part of the paper reviews imaging methods with examples of the authors’ own test results. The article concludes with recommendations and tables that provide a kind of comprehensive guide to the methods described, depending on the type of defects detected, the range of applicability, etc. The authors also shared their speculations on current trends and the possible path for further development and research in the field of solar cell defect analysis using imaging.

Słowa kluczowe

EN

solar cells; defects; photovoltaic cell characterization; defect imaging; electroluminescence; photoluminescence

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2023
• Tom: Vol. 30, nr 3
• Strony: 381--401
• Opis fizyczny: Bibliogr. 65 poz., rys., tab.

Twórcy

autor

Maziuk Maurycy

• Wrocław University of Science and Technology, Faculty of Electronic, Photonics and Microsystems, Department of Electronic and Photonic Metrology, Division of Thin Film Technologies, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland

autor

Jasińska Laura

• Wrocław University of Science and Technology, Faculty of Electronic, Photonics and Microsystems, Department of Electronic and Photonic Metrology, Division of Thin Film Technologies, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland

autor

Domaradzki Jarosław

• Wrocław University of Science and Technology, Faculty of Electronic, Photonics and Microsystems, Department of Electronic and Photonic Metrology, Division of Thin Film Technologies, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland

autor

Chodasewicz Paweł

• Wrocław University of Science and Technology, Faculty of Electronic, Photonics and Microsystems, Department of Electronic and Photonic Metrology, Division of Thin Film Technologies, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland

Bibliografia

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Uwagi

Opracowanie rekordu ze środków MNiSW, umowa nr SONP/SP/546092/2022 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2024).