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Abstrakty
Analyzed the two main methods of AFM, the effect of which is essential in the research of individual microscopic adsorbed on the surface of a solid substrate: the broadening of the profile and the effect of understating the AFM height images of objects.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Strony
22--28
Opis fizyczny
Bibliogr. 6 poz.
Twórcy
autor
- Lviv Polytechnic National University. Department of Computer-Aided Design Systems
autor
- Lviv Polytechnic National University. Department of Computer-Aided Design Systems
autor
- Lviv Polytechnic National University. Department of Computer-Aided Design Systems
autor
- Lviv Polytechnic National University. Department of Computer-Aided Design Systems
Bibliografia
- 1. G. Binnig and H. Rohrer, 1982, Scanning tunneling microscopy, Helv. Phys. Acta., - 1982, - v. 55, - pp. 726.
- 2. G. Binnig, H. Rohrer, C. Gerber, and E. Weibel, 1982, Tunneling through a controllable vacuum gap, Appl. Phys. Lett., -1982, - v. 40, - pp. 178-180.
- 3. J. M. R. Weaver, D. W. Abraham, 2004, “High resolution atomic force microscopy potentiometry”, J. Vac. Sci., Technol. B 9, 2004.
- 4. B. Bhushan, 2007, “Springer Handbook of Nanotechnology”, apr. 2007.
- 5. T. R. Albrecht, S. Akamine, T. E. Carver, C. F. Quate, 2006, “Microfabrication of cantilever styli for the force microscope”, J. Vac. Sci. Technol., 2006.
- 6. R. Linnemann, T. Gotszalk, I. W. Rangelow, P. Dumania, E. Oesterschulze, 2000, “Atomic force microscopy and lateral force microscopy using piezoresistive cantilevers”, 2000.
Uwagi
EN
Text of the paper was presented on the 21-th Polish-Ukrainian Conference on “CAD in Machinery Design – Implementation and Educational Issues”, October 11–12, 2013 Łańcut, Poland.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-266ce66a-32fa-4f3a-8cac-ae382b4a48a4