Electrical transport and magnetoresistance of double layered CMR manganites R1.2Sr1.8Mn2O7(R = La, Pr, Sm)

• Autorzy: Reddy Y. S.

Identyfikatory

DOI

10.1515/msp-2017-0048

• Języki publikacji: EN

Abstrakty

EN

Polycrystalline bulk samples of double layered (DL) colossal magnetoresistive (CMR) manganites R_1.2Sr_1.8Mn₂O₇ (R = La, Pr, Sm) were prepared by sol-gel method to study the effect of size of lanthanide ion on their magnetotransport properties. The electrical resistivity of the samples was investigated in the temperature range of 70 K to 300 K at different magnetic fields. The samples LSMO and PSMO show insulator-to-metal transition (IMT) behavior, while SSMO sample exhibits insulating behavior in the entire temperature range with a very large value of resistivity. The insulator-to-metal transition temperature (TIM) decreases from 123 K (LSMO) to 90 K (PSMO) and disappears in SSMO sample. To explain the electrical transport above T_IM, the temperature dependent resistivity data (T > T_IM) of all the samples were fitted to the equations of different conduction models. The results indicate that the conduction at T > T_IM is due to Mott variable range hopping (VRH) mechanism in the LSMO and PSMO samples, while Efros-Shkloskii (ES) type of VRH model dominates the conduction process in the SSMO sample. All the three samples show increasing magnetoresistance (MR) even below TIM and the maximum MR is shown by LSMO (39 % at 75 K, 3 T).

Słowa kluczowe

EN

double layered manganites; electrical transport; magnetoresistance; variable range hopping; sol-gel process

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2017
• Tom: Vol. 35, No. 2
• Strony: 440--446
• Opis fizyczny: Bibliogr. 36 poz., rys., tab.

Twórcy

autor

Reddy Y. S.

• Department of Physics, Chaitanya Bharathi Institute of Technology, Hyderabad 500 075, India

Bibliografia

• [1] JIN S., TIEFEL T.H., MCCORMACK M., FASTNACHT R.A., RAMESH R., CHEN L.H., Science, 264 (1994), 413.
• [2] HELMOLT VON R., VECKER J., HOLZAPFEL B., SCHULTZ L., SAMWER K., Phys. Rev. Lett., 71 (1993), 2331.
• [3] URUSHIBARA A., MORITOMO Y., ARIMA T., ASAMITSU A., KIDO G., TOKURA Y., Phys. Rev. B, 51 (1995), 14103.
• [4] AHMED A.M., EL-MOEZ A.A.M., ABDELLATEEF M.A., EL-GHANNY H.A.A., Rare Metals, 35 (2016), 551.
• [5] MYRON S.B., JAIME M., Rev. Mod. Phys., 73 (2001), 583.
• [6] ZENER C., Phys. Rev., 82 (1952), 403.
• [7] MILLIS A.J., LITTLEWOOD P.B., SHRAIMAN B.I., Phys. Rev. Lett., 74 (1995), 5144.
• [8] GOODENOUGH J.B., Annu. Rev. Mater. Sci., 28 (1998), 1.
• [9] MORITOMO Y., ASAMITSU A., KUWAHARA H., TOKURA Y., Nature, 380 (1996), 141.
• [10] RUDDLESDEN S.N., POPPER P., Acta Crystallogr., 11 (1958), 541.
• [11] KIMURA T., TOKURA Y., Annu. Rev. Mater. Sci., 30 (2000), 451.
• [12] CHATTERJEE S., CHOU P.H., CHANG C.F., HONG I.P., YANG H.D., Phys. Rev. B, 61 (2000), 6106.
• [13] MORITOMO Y., OHOYAMA K., OHASHI M., Phys. Rev. B, 59 (1999), 157.
• [14] ZHU H., ZHU D., ZHANG Y., J. Appl. Phys., 92 (2002), 7355.
• [15] OKAMOTO S., ISHIHARA S., MAEKAWA S., Phys. Rev. B, 63 (2001), 104401.
• [16] ZHANG C.L., CHEN X.J., ALMASAN C.C., GARDNER J.S., SARRAO J.L., Phys. Rev. B, 65 (2002), 134439.
• [17] LAFFEZ P., TENDELOO VAN G., SESHADRI R., HERVIEU M., MARTIN C., MAIGNAN A., RAVEAU B., J. Appl. Phys., 80 (1996), 5850.
• [18] REDDY Y.S., REDDY R.M.V., VEERASOMAIH P., REDDY V.C., Mater. Sci.-Poland, 25 (2007), 619.
• [19] REDDY Y.S., KISTAIAH P., REDDY V.C., Int. J. Mod. Phys. B, 23 (2009), 447.
• [20] REDDY Y.S., REDDY V.C., Int. J. Innov. Emer. Res. Engg., 3 (2016), 95.
• [21] REDDY Y.S., KUMAR P.V., RAWAT R., BANERJEE A., KISTAIAH P., REDDY V.C., Phys. Status Solidi B, 244 (2007), 3719.
• [22] SHANNON R.D., Acta Crystallogr., A32 (1976), 751.
• [23] OGALE S.B., TALYANSKY V., CHEN C.H., RAMESH R., GREEN R.L., VENKATESAN T., Phys. Rev. Lett., 77 (1996), 1159.
• [24] SNYDER J.G., HISKES R., DICAROLIS S., BEASLEY M.R., GEBALLE T.H., Phys. Rev. B, 53 (1996), 14434.
• [25] JAIME M., HARDNER H.T., SALAMON M.B., RUBINSTEIN M., DORSEY P., EMIN D., Phys. Rev. Lett., (1997), 951.
• [26] VIRET M., RANNO L., COEY J.M.D., J. Appl. Phys., 81 (1997), 4964.
• [27] YU W., SANTIAGO-AVILES J., J. Appl. Phys. Lett., 89 (2006), 123119.
• [28] RANA D.S., THAKER C.M., MAVANI K.R., KUBERKAR D.G., KUNDALIYA DARSHAN C., MALIK S.K., J. Appl. Phys., 95 (2004), 4934.
• [29] MATSUKAWA M., CHIBA M., KIKUCHI E., SURYANARAYANAN R., APOSTU M., NIMORI S., SUGIMOTO K., KOBAYASHI N., Phys. Rev. B, 72 (2005), 224422.
• [30] ZHU H., XU X., PI L., ZHANG Y., Phys. Rev. B, 62 (2000), 6754.
• [31] NAIR S., BANERJEE A., Phys. Rev. B, 70 (2004), 104428.
• [32] LIU J.W., CHEN G., LI Z.H., AN W.W., ZHANG Z.G., J. Alloy. Compd., 431 (2007), 1.
• [33] ANG R., LU W.J., ZHANG R.L., ZHAO B.C., ZHU X.B., SONG W.H., SUN Y.P., Phys. Rev. B, 72 (2005), 184417.
• [34] CHEN X.J., ZHANG C.L., ALMASAN C.C., GARDNER J.S., SARRAO J.L., Phys. Rev. B, 67 (2003), 094426.
• [35] CHEN X.J., ZHANG C.L., GARDNER J.S., SARRAO J.L., ALMASAN C.C., Phys. Rev. B, 68 (2003), 064405.
• [36] EHSANI M.H., KAMELI P., GHAZI M.E., J. Phys. Chem. Solids, 73 (2012), 744.

Uwagi

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).